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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 48件中 1~20件目  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ED, MW 2020-01-31
09:55
Tokyo Kikai-Shinko-Kaikan Bldg. Novel Sample Holder Structure for S11 Calibration via SOM and Related Application to Dielectric Measurement in Liquids via the Cut-off Waveguide Reflection Method
Kouji Shibata (Hachinohe Inst. of Tech.)
 [more]
EMCJ, IEE-SPC
(Joint)
2019-11-15
15:25
Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental Study on S11 Calibration of a Coaxial-loaded Cut-off Circular Waveguide using SOM Termination and Its Application to the Dielectric Measurement in Liquids
Kouji Shibata (Hachinohe Inst. of Tech.) EMCJ2019-72
 [more] EMCJ2019-72
pp.7-12
MW, AP
(Joint)
2019-09-19
15:10
Kanagawa JAXA (Sagamihara) Fundamental Study on Uncertainty of Dielectric Measurement in Liquids Based on the Cut-off Circular Waveguide Reflection Method
Kouji Shibata (Hachinohe Inst. of Tech.) MW2019-55
 [more] MW2019-55
pp.1-6
EST, MW, EMCJ, IEE-EMC [detail] 2018-10-19
09:20
Aomori Hachinohe Chamber of Commerce and Industry(Hachinohe city, Aomori) Discussion on the Improvement of the Measurement Accuracy for Dielectric Measurement in Liquids via the Cut-off Waveguide Reflection Method
Kouji Shibata, Masaki Kobayashi (Hachinohe Inst. of Tech.) EMCJ2018-46 MW2018-82 EST2018-68
 [more] EMCJ2018-46 MW2018-82 EST2018-68
pp.77-82
EST, MW, EMCJ, IEE-EMC [detail] 2018-10-19
09:45
Aomori Hachinohe Chamber of Commerce and Industry(Hachinohe city, Aomori) Evaluation of inexpensive high-frequency impedance measurement equipment and its application to teaching materials for engineering practice
Satoshi Ishinohachi, Kouji Shibata (Hachinohe Inst. of Tech.) EMCJ2018-47 MW2018-83 EST2018-69
 [more] EMCJ2018-47 MW2018-83 EST2018-69
pp.83-88
AP, MW
(Joint)
2018-09-21
15:25
Tokyo Tokyo Tech Effectiveness Confirmation for S11 Calibration Theory of a Coaxial Line Using Three Reference Materials and Application to the Dielectric Measurement in Liquids Based on an Actual Measurement
Kouji Shibata (Hachinohe Inst. of Tech.) MW2018-68
 [more] MW2018-68
pp.49-54
MW, WPT 2018-04-27
15:15
Tokyo Kikai-Shinko-Kaikan Building S11 Calibration Method of a Coaxial Line with Arbitrary Impedance Standards or Three Reference Materials without Using a Short Termination for Dielectric Measurement in Liquids
Kouji Shibata (Hachinohe Inst. of Tech.) WPT2018-6 MW2018-6
 [more] WPT2018-6 MW2018-6
pp.25-30
SDM, EID 2017-12-22
14:45
Kyoto Kyoto University Modification effects of ferroelectric thick-film properties on silicon substrates by proton beam irradiation
Jun Hirade, Masaki Yamaguchi (Shibaura Inst. of Tech.), Yoichiro Masuda (Hachinohe Inst. of Tech.) EID2017-22 SDM2017-83
Ferroelectric thin films deposited on silicon substrates are expected to be applied to nonvolatile memories,
photonic ... [more]
EID2017-22 SDM2017-83
pp.57-62
ED 2017-10-26
13:55
Miyagi   Photoassisted field emission properties of gated silicon field emitter arrays
Hidetaka Shimawaki (Hachinohe Inst. of Tech.), Masayoshi Nagao (AIST), Yoichiro Neo, Hidenori Mimura (Shizuoka Univ.), Mikio Takai (Osaka Univ.) ED2017-37
We present an experimental study of laser-induced electron emission from gated silicon field emitter arrays with submicr... [more] ED2017-37
pp.5-8
AP 2017-10-20
14:50
Aomori Hchinohe-Shoukou-Kaikan Frequency characteristic measurement of liquid's dielectric constants by combining the cut-off circular waveguide reflection method and the comparison of expressions with only reference materials
Kouji Shibata (Hachinohe Inst. of Tech.) AP2017-106
 [more] AP2017-106
pp.61-66
AP, MW
(Joint)
2017-09-22
14:50
Saitama Saitama University A Study on the Effect to the Dielectric Measurement of Liquids Due to Different Mathematical Expressions of a Waveguide via the Cut-off Circular Waveguide Reflection Method
Kouji Shibata (Hachinohe Inst. of Tech.) MW2017-77
 [more] MW2017-77
pp.53-58
EMCJ, IEE-SPC
(Joint)
2017-06-05
13:05
Hokkaido Sapporo Convention Center Basic Theoretical Examination of Measuring Accuracy in the Use of Comparative Formulas with Only Multiple Reference Materials for Liquid Dielectric Measurements via the Open-ended Cut-off Circular Waveguide Reflection Method
Kouji Shibata (Hachinohe Inst. of Tech.) EMCJ2017-21
 [more] EMCJ2017-21
pp.1-6
EST 2017-05-19
11:25
Tokyo Tohoku University Tokyo Branch Basic Theoretical Examination of Measurement Accuracy in the Use of Comparative Formulas with Multiple Reference Materials for Liquid Dielectric Measurement via the Open-ended Cut-off Circular Waveguide Reflection Method
Kouji Shibata, Masaki Kobayashi (Hachinohe Inst. of Tech.) EST2017-3
 [more] EST2017-3
pp.9-14
EMCJ 2017-03-10
15:30
Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental Study on Generalization of the Dielectric Measurement Procedure in liquids via the Cut-off Circular Waveguide Reflection Method by Using a Comparison Formula with a Reference Material and a Commercially Available Electromagnetic Field Simulator
Kouji Shibata, Masaki Kobayashi (Hachinohe Inst. of Tech.) EMCJ2016-124
 [more] EMCJ2016-124
pp.23-28
EMCJ, IEE-EMC, MW, EST [detail] 2016-10-20
15:20
Miyagi Tohoku Univ. Fundamental Study on Effect of Numerical Calculation Result When Applying the Variational Method for Estimation of Complex Permittivity for Liquids via the Coaxial-probe method
Kouji Shibata, Masaki Kobayashi (Hachinohe Inst. of Tech.) EMCJ2016-70 MW2016-102 EST2016-66
 [more] EMCJ2016-70 MW2016-102 EST2016-66
pp.57-62
MW 2015-12-17
13:00
Tokyo Tokyo Univ. of Science Measurement of Complex Permittivity for Liquids by the Combination of the Open-ended Cut-off Waveguide Reflection Method and the Comparing Expression with Reference Material at UHF Band
Takahiro Kaneko, Kouji Shibata (Hachinohe Inst. of Tech.) MW2015-137
 [more] MW2015-137
pp.25-30
MW 2015-12-18
16:10
Tokyo Tokyo Univ. of Science [Special Talk] Report on European Microwave Week 2015
Tadashi Kawai (Univ. of Hyogo), Eigo Kuwata (Mitsubishi Electric), Chun-Ping Chen (Kanagawa Univ.), Tetsuya Ueda (Kyoto Inst. of Tech.), Kouji Shibata (Hachinohe Inst. of Tech.), Ryosuke Suga (Aoyama Gakuin Univ.), Naoki Shinohara (Kyoto Univ.), Masahiro Horibe (AIST) MW2015-158
 [more] MW2015-158
pp.139-145
ED 2015-10-23
11:25
Aichi   Study on the photoresponse of silicon field emitter arrays
Hidetaka Shimawaki (Hachinohe Inst. of Tech.), Masayoshi Nagao (AIST), Yoichiro Neo, Hidenori Mimura (Shizuoka Univ.), Fujio Wakaya, Mikio Takai (Osaka Univ.) ED2015-66
 [more] ED2015-66
pp.61-64
EMCJ, EMD 2015-07-10
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental Study on Simplification of an Estimate Work by Comparing with Reference Material on Measurement of Complex Permittivity for Liquids via the Open-ended Cut-off Waveguide Reflection Method
Kouji Shibata, Takahiro Kaneko (Hachinohe Inst. of Tech.) EMCJ2015-47 EMD2015-24
 [more] EMCJ2015-47 EMD2015-24
pp.19-24
EMCJ, IEE-EMC, IEE-MAG 2015-06-26
14:30
Overseas KMITL, Thailand A Study on Broadband Measurement of Complex Permittivity for Liquids Using the Open-ended Coaxial Line Reflection Method
Kouji Shibata (Hachinohe Inst. of Tech.) EMCJ2015-28
 [more] EMCJ2015-28
pp.61-66
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