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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, ITE-IST 2013-07-04
10:55		 Hokkaido San Refre Hakodate [Invited Talk] 32 Gb/s Data-Interpolator Receiver with 2-tap DFE in 28-nm CMOS
Yoshiyasu Doi, Takayuki Shibasaki, Takumi Danjo, Win Chaivipas, Takushi Hashida (Fujitsu Lab. Ltd.), Hiroki Miyaoka (FSL), Masanori Hoshino (FMSL), Yoichi Koyanagi (Fujitsu Lab. Ltd.), Takuji Yamamoto (FLA), Sanroku Tsukamoto, Hirotaka Tamura (Fujitsu Lab. Ltd.) ICD2013-27		 We present a 32Gb/s data-interpolator receiver for electrical chip-to-chip communications. The receiver front-end is clo... [more] ICD2013-27
pp.19-24
CAS 2013-01-29
10:15		 Oita Beppu International Convention Center All-Digital Calibration of Time-Interleaved Analog-to-Digital Converter with Fast Convergence
Takeshi Nozaki (Fujitsu Microelectronics Solutions LTD.), Masato Yoshioka (Fujitsu Lab), Souyou Setsu (Fujitsu Microelectronics Solutions LTD.), Sadayoshi Umeda (Fujitsu Semiconductor LTD.), Sanroku Tsukamoto (Fujitsu Lab) CAS2012-81		 Time-interleaved (TI) analog-to-digital converters (ADCs) use several ADCs in parallel, and are effective way to substan... [more] CAS2012-81
pp.89-94
ICD 2012-12-18
10:55		 Tokyo Tokyo Tech Front [Invited Talk] Soft-error evaluation and mitigation technologies
Taiki Uemura (Fujitsu Semiconductor Ltd.) ICD2012-116		 Soft-Error is transient error in electron devices. Soft-error is triggered by cosmic-ray induced neutrons and alpha rays... [more] ICD2012-116
pp.103-108
SDM 2011-11-10
14:40		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Device Simulation of STM Carrier Profiling
Koichi Fukuda, Masayasu Nishizawa, Tetsuya Tada (AIST), Leonid Bolotov (Tsukuba Univ.), Kaina Suzuki, Shigeo Sato (Fujitsu Semiconductor), Hiroshi Arimoto, Toshihiko Kanayama (AIST) SDM2011-119		  [more] SDM2011-119
pp.21-26
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