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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2017-12-15
15:55		 Tokyo Kikai-Shinko-Kaikan Bldg. R2017-60 Plenary meeting of IEC TC 56 “Dependability” was held in Tokyo this year. Firstly, Mr. Mori (METI) welcomed the TC 56 an... [more] R2017-60
pp.25-30
R 2016-07-29
15:20		 Hokkaido Otaru Chamber of Commerce and Industry Trend of reliability test term in JIS Z 8115 draft revision considering the integrity of the IEC 60050-192 Dependability
Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor), Fumiaki Harada (FXAT) R2016-17		  [more] R2016-17
pp.25-30
EMD, R 2016-02-19
15:35		 Shizuoka Azarea,Shizuoka Latest Trends of JIS Z8115 DependabilityTerminology amendment drafts -- Focus on relevant terms of failure and fault --
Fumiaki Harada (FXAT), AKihiko Masuda (R7 Studio), Tateki NIsh (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor) R2015-70 EMD2015-98		  [more] R2015-70 EMD2015-98
pp.31-36
R 2015-12-18
14:55		 Tokyo   Trend on International Standardization of dependability -- Outline of IEC TC56 and agenda on international meeting(especially WG2) --
Fumiaki Harada (FXAT), Yoshiki Kinoshita, Makoto Takeyama (KU) R2015-64		  [more] R2015-64
pp.19-25
R 2015-07-31
16:35		 Aomori   Latest trends of JIS reliability design and analysis terminology -- Comparison with JIS Z 8115 amendment drafts and IEC 60050-192 first edition --
Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor), Fumiaki Harada (FXAT) R2015-21		 Dependability (reliability) terms of IEC 60050-192 standard was enacted in February 2015. It has passed 25 years since t... [more] R2015-21
pp.43-48
R 2012-12-14
11:15		 Tokyo   Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2012-71		  [more] R2012-71
pp.19-26
R 2011-12-16
13:00		 Tokyo   Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2011-37		  [more] R2011-37
pp.1-7
 Results 1 - 7 of 7  /   
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