IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2023-12-22
14:25
Tochigi Teikyo University Development of detection scheme for speckle pattern changes in an output light spot from an optical fiber with a PIV method
Takato Chiba, Makoto Hasegawa (Chitose Inst. of Science & Technology) EMD2023-35
When visible laser beams are input into a multi-mode optical fiber (MMF) from its one end and are allowed to travel ther... [more] EMD2023-35
pp.19-24
EMD, R 2020-02-14
14:35
Shizuoka   Observations of break arc behaviors of AgSnO2 contacts in a DC inductive load under application of an external magnetic field
Makoto Hasegawa, Seika Tokumitsu (Chitose Inst. of Science & Technology) R2019-56 EMD2019-56
When AgSnO2 contacts were operated to break an inductive DC load circuit up to 20V-17A with an applied external magnetic... [more] R2019-56 EMD2019-56
pp.13-16
EMD 2019-03-01
10:35
Tokyo   A study in influences of external magnetic field on break arc characteristics of AgSnO2 contacts in a DC inductive load circuit up to 20V-17A up to 20V-17A
Seika Tokumitsu, Makoto Hasegawa (Chitose Inst. of Science & Technology) EMD2018-59
For the purpose of investigating influences of application of an external magnetic field on shortenings of break arc dur... [more] EMD2018-59
pp.1-6
EMD 2019-01-18
15:30
Tokyo Kikai-Shinko-Kaikan Bldg. Influences of contact opening speeds and external magnetic field on shortening of break arc durations of AgSnO2 contacts in a DC inductive load circuit up to 20V-17A
Seika Tokumitsu, Makoto Hasegawa (Chitose Inst. of Science & Technology) EMD2018-52
In a DC inductive (L=5.7mH) load circuit, a AgSnO2 contact pair with applied external magnetic field of about 120mT was ... [more] EMD2018-52
pp.23-28
EMD, CPM, OME 2015-06-19
16:45
Tokyo Kikai-Shinko-Kaikan Bldg. An experimental study on break arc characteristics of AgSnO2 contact pairs at interruptions of DC load currents with different contact opening speeds
Makoto Hasegawa (Chitose Inst. of Science & Technology) EMD2015-19 CPM2015-29 OME2015-32
In DC load circuit conditions with a power supply voltage of DC14V, break operations of a load current in the range from... [more] EMD2015-19 CPM2015-29 OME2015-32
pp.47-50
EMD 2015-01-23
13:55
Kanagawa   An experimental study on influences of contact opening speeds on break arc characteristics of AgSnO2 contact pair at interruptions of inductive DC load currents
Makoto Hasegawa, Nanami Ohkawa, Hiroya Sonobe (Chitose Inst. of Science & Technology) EMD2014-102
In a DC inductive load circuit (L=20mH) with a power supply voltage of DC14V, break operations of a load current in the ... [more] EMD2014-102
pp.7-10
EMD 2012-03-02
16:15
Tokyo Tanagawa Univ. A study on a detection system for load application onto an optical fiber by means of changes of a speckle pattern
Muneki Kawahara, Makoto Hasegawa (Chitose Inst. of Science & Technology) EMD2011-139
In order to investigate possibility of utilizing speckle patterns to be observed in an output light spot from an optical... [more] EMD2011-139
pp.53-56
 Results 1 - 7 of 7  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan