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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EA, ASJ-H |
2017-08-10 14:50 |
Miyagi |
Tohoku Univ., R. I. E. C. |
Comparison of the theoretical model and optical measurement of diaphragm vibration for the laboratory standard microphone Jae Gap Suh (Tohoku Univ.), Wan-Ho Cho (KRISS), Hack Yoon Kim (Cheongju Univ., Korea), Yoiti Suzuki (Tohoku Univ.) EA2017-42 |
As a method to measure the sensitivity of a microphone, a reciprocity calibration method using three microphones was pro... [more] |
EA2017-42 pp.91-96 |
SDM, ED |
2008-07-09 12:05 |
Hokkaido |
Kaderu2・7 |
Properties of GaN MIS Capacitors Using Al2O3 as Gate Dielectric Deposited by Remote Plasma Atomic Layer Deposition Hyeong-Seon Yun, Ka-Lam Kim, No-Won Kwak, Woo-Seok Lee, Sang-Hyun Jeong (Cheongju Univ.), Ju-Ok Seo (Itswell), Kwang-Ho Kim (Cheongju Univ.) ED2008-42 SDM2008-61 |
Al2O3 thin films were deposited on GaN 0001) by Remote Plasma Atomic Layer Deposition (RPALD) technique using Trimethyla... [more] |
ED2008-42 SDM2008-61 pp.15-19 |
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