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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 09:25 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
On Avoiding Test Data Corruption by Optimal Scan Chain Grouping Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), Jun Qian (AMD) VLD2017-42 DC2017-48 |
Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting th... [more] |
VLD2017-42 DC2017-48 pp.91-94 |
CPSY, DC, IPSJ-ARC (Joint) [detail] |
2017-07-28 10:00 |
Akita |
Akita Atorion-Building (Akita) |
Distributed Stream Processing Platform for CPU-FPGA Heterogeneous Data Centers Eric Fukuda, Naif Tarafdar (Univ. of Toronto), I-Cheng Chen (AMD), Paul Chow (Univ. of Toronto) CPSY2017-32 |
The FPGAs provided in recent data centers are often tied to processors through PCIe. This adds overhead to data transfer... [more] |
CPSY2017-32 pp.171-176 |
EE |
2005-11-11 16:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The Method to Improve the Resolution of Digital PWM Eiji Takegami (Densei Lamda), Kohji Higuchi, Kazushi Nakano (Univ. Electro-Communications), Satoshi Tomioka (Densei Lamda) |
Recently, digitization of a controller is progressing for demands of intelligent, common hardware, etc.. In order to con... [more] |
EE2005-45 pp.37-41 |
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