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CPSY
,
DC
2006-04-14
10:40
Tokyo
Takeda Hall
Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices
Kentaroh Katoh
,
Yumin Yao
,
Kazuteru Namba
,
Hideo Ito
(
チバダイ
)
This paper proposes a BIST (Built-In Self Test) method for testing the PEs (Processing Elements) of multi-context based ...
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CPSY2006-4
DC2006-4
pp.19-24
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