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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 61 - 74 of 74 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ED 2009-06-25
13:15
Overseas Haeundae Grand Hotel, Busan, Korea Effect of Ion-Beam-Induced Damage on Luminescence Properties in Tb-Implanted AlxGa1-xN
Ji-Ho Park, Hiroshi Okada, Akihiro Wakahara, Yuzo Furukawa (Toyohashi Univ. of Tech.), Yong-Tae Kim (Dankook Univ.), Jonghan Song (KIST), Ho-Jung Chang (Dankook Univ.), Shin-ichiro Sato, Takeshi Ohshima (JAEA, Takasaki) ED2009-82 SDM2009-77
We investigated the effect of ion-beam-induced damage on luminescence properties for rare earth ions -doped III-nitride ... [more] ED2009-82 SDM2009-77
pp.141-144
ED 2009-04-24
13:25
Miyagi Tohoku Univ. Growth of polycrystalline Si on plastic substrate using pulsed-plasma CVD under near atmospheric Pressure
Shogo Murashige, Mitsutaka Matsumoto, Yohei Inayoshi, Maki Suemitsu (Tohoku Univ.), Setsuo Nakajima, Tsuyoshi Uehara (Sekisui Chemicals Co. Ltd), Yasutake Toyoshima (AIST-ETRI) ED2009-15
Polycrystalline Si films have been deposited on polyethylene terephthalate(PET) substrates using pulsed-plasma CVD under... [more] ED2009-15
pp.63-67
NLP, CAS 2008-10-14
14:20
Miyagi   Study on Periodic Delta-Pseudo-Orbital Generated from Chaos Neural Network -- Effect of Initial Condition and Variable Precision --
Takeshi Murakami, Hitoaki Yoshida (Iwate Univ.), Satoshi Kawamura (Ishinomakisenshu Univ.) CAS2008-39 NLP2008-51
 [more] CAS2008-39 NLP2008-51
pp.31-34
SDM, ED 2008-07-09
10:50
Hokkaido Kaderu2・7 [Invited Talk] Growth of InAs quantum dot and device application
Il-Ki Han (KIST)
 [more]
SDM, ED 2008-07-10
11:25
Hokkaido Kaderu2・7 Observation of hexagonal nuclei in the melt-quenched Ge2Sb2Te5 thin films
Min-Soo Youm (KIST)
 [more]
SDM, ED 2008-07-10
11:40
Hokkaido Kaderu2・7 Microstructural and electrical characteristics of Ge1Te1 alloy
Yong-Tae Kim (KIST)
 [more]
SDM, ED 2008-07-10
11:10
Hokkaido Kaderu2・7 Fabrication of methanol concentration sensor by using Pt dot catalyst electrode
Seong-Il Kim (KIST)
 [more]
SDM, ED 2008-07-10
11:25
Hokkaido Kaderu2・7 Fabrication and characterization of silicon nanowire-based biosensor
Young-Soo Sohn (KIST)
 [more]
SANE 2007-10-26
14:40
Overseas KIST(Seoul) Signal-to-Clutter Ratio Enhancement of GPR image using Eigenimage Filtering
Seung-Yeup Hyun (KIST), Sang-Wook Kim (Isung Eng.), Se-Yun Kim (KIST) SANE2007-79
 [more] SANE2007-79
pp.89-92
SANE 2007-10-26
15:10
Overseas KIST(Seoul) The Development of a Pulse Borehole Radar System for Underground Cavity Detection
Sang-Wook Kim (Isung Eng.), Seung-Yeup Hyun (KIST), Jeong-Hak Lee, Sung-Yong Lee (Isung Eng.), Jae-Hyoung Cho (KIST), Kuk-Taek Oh (Isung Eng.), Se-Yun Kim (KIST) SANE2007-80
 [more] SANE2007-80
pp.93-97
SANE 2007-10-26
15:40
Overseas KIST(Seoul) Measured dielectric properties of borehole cores using an open-ended coaxial probe
Ji-hyun Jung, Se-Yun Kim (KIST) SANE2007-81
Cross-borehole radar systems have been used to detect deeply located man-made tunnels in the middle area of Korea. One o... [more] SANE2007-81
pp.99-102
MI 2007-09-20
16:00
Fukuoka Kyushu Univ. Computer-Aided Diagnosis of Osteoporosis using Spatial Frequency Analysis
Yuji Kondo (Nagoya Ekisaikai Hosp.), Yoshiaki Hirofuji (Nagoya Univ.), Kenichi Kobayashi (Fujita Health Univ. Hosp.), Hiroyuki Ukai (Nagoya Institute of Tech.) MI2007-47
Diagnostic standard of osteoporosis of the Japanese Society for Bone and Mineral Research has proposed to diagnose osteo... [more] MI2007-47
pp.59-64
ITE-ME, ITS, IE, ITE-HI, ITE-AIT 2007-02-23
14:20
Hokkaido Hokkaido University Suggestion of the dependency diagnosis support method focused on the expression change
Satoshi Takasu, Akihiko Sugiura (Toyohasi Univ. of Tec), Keiichi Yonemura (K.NCT)
 [more] ITS2006-83 IE2006-268
pp.47-50
ITE-ME, ITS, IE, ITE-HI, ITE-AIT 2007-02-23
14:45
Hokkaido Hokkaido University The influence that a artificial smile affects a Stroop effect and skin temperature
Dai Sato, Akihiko Sugiura (Toyohasi Univ. of Tech.), Keiichi Yonemura (K.N.C.T.)
(To be available after the conference date) [more] ITS2006-84 IE2006-269
pp.51-54
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