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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD | 2012-12-17 15:55 |
Tokyo | Tokyo Tech Front | [Poster Presentation]
3x Write and 5x Read Speed Increase for RRAM with Disturb Free Bipolar Operation Sheyang Ning (Chuo Univ./Univ. of Tokyo), Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.)  ICD2012-99 |
The RRAM high speed operation is handicapped by the need to verify during set/reset, and the limited read voltage for re... [more] | ICD2012-99 p.43 |
| EMCJ, IEE-EMC | 2012-12-14 13:20 |
Gifu | Gifu Univ. | Study of an ESD Immunity Test Procedures for Charged Frame Model in Personal Care Robots
-- Consideration of the Test Procedures Specified in the Product Standard of Electrically Powered Wheelchairs -- Masayuki Murakami (TIRI), Hiroyasu Ikeda (JNIOSH) EMCJ2012-94 |
The EMC product standard of electrically powered wheelchairs, ISO 7176-21, requires the charged frame ESD immunity test.... [more] | EMCJ2012-94 pp.55-60 |
| EMCJ, IEE-EMC | 2012-12-14 15:15 |
Gifu | Gifu Univ. | Estimation of the 3-port S Parameters with 2-port Measurements and Its Application to the Immunity Testing System Noboru Maeda, Shinji Fukui (SOKEN), Kouji Ichikawa, Yukihiko Sakurai (DENSO), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2012-98 |
An estimation method of the three-port S parameters for the reciprocal circuit is presented. In this method, a known loa... [more] | EMCJ2012-98 pp.81-85 |
| EMCJ | 2012-09-07 15:40 |
Hokkaido | Hkkaido Univ. | A simulation model of bulk current injection (BCI) test Hiroya Tanaka, Atsuhiro Takahashi, Yoshiyuki Hattori (Toyota Central R&D Labs.), Masato Izumichi (DENSO CORPORATION) EMCJ2012-60 |
BCI test is used to evaluate a noise immunity of in-vehicle electronic equipment. To predict an injected current into ... [more] |
EMCJ2012-60 pp.47-50 |
| EMCJ | 2012-04-20 15:35 |
Ishikawa | Kanazawa Univ. | RL Damper Circuit for Electoromagnetic Compatibility and Power Integrity of Integrated Circuits Ryosuke Yamagata, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2012-8 |
Resonances of the parasitic impedance in power distribution network (PDN) increase power current in radio frequency that... [more] | EMCJ2012-8 pp.43-48 |
| EMCJ, ITE-BCT | 2012-03-16 11:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Evaluation of Electric Field Strength Computation in Boundary Region between Near and Far Fields Masaru Nakayama, Takehiko Kobayashi (Tokyo Denki Univ.) EMCJ2011-136 |
An equation for calculating electric field strength has been widely used for electromagnetic applications. This equation... [more] | EMCJ2011-136 pp.37-42 |
| EMCJ | 2012-01-27 13:40 |
Fukuoka | Kyushu Univ. | Immunity Evaluation Method of Metal Cable for High-speed Signal Transmission Yusuke Suzuki, Satoshi Yoneda, Naoto Oka, Hideyuki Oh-hashi (Mitsubishi Electric Corp.), Seiichi Saito (Salesian Polytechnic) EMCJ2011-122 |
As the application field of a high-speed digital signal transmission system using a metal cable has expanded, it is nece... [more] | EMCJ2011-122 pp.65-70 |
| EMCJ | 2011-09-12 16:40 |
Hokkaido | Hokkaido Univ. | Fabrication of test apparatuses to assess the immunity of mobile robots Masayuki Murakami, Hiroyasu Ikeda (JNIOSH) EMCJ2011-79 |
Some companies have developed robots that assist in daily human activities and that are driven by high-power motors. Sta... [more] | EMCJ2011-79 pp.43-48 |
| EMCJ | 2010-04-23 10:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Study on Measurement Method of Twisted Pair Cable with Shielding Sheath Yosuke Watanabe, Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Melco) EMCJ2010-3 |
Recently, the application field of a high-speed differential transmission system has expanded, and shielded twisted pair... [more] | EMCJ2010-3 pp.13-18 |
| EMCJ | 2010-01-21 09:35 |
Okinawa | University of the Ryukyus | Basic Characteristics and Generation Method of Rotating FM-EM Fields for RF Radiated Immunity/Susceptibility Test Kimitoshi Murano (Tokai Univ.), Majid Tayarani (Iran Univ. of Science and Tech.), Fengchao Xiao, Yoshio Kami (The Univ. of Electro-Comm.) EMCJ2009-98 |
A radio-frequency (RF) radiated immunity/susceptibility test method using a frequency-modulated rotating-electromagnetic... [more] | EMCJ2009-98 pp.1-6 |
| EMCJ | 2010-01-21 10:00 |
Okinawa | University of the Ryukyus | Study on Impulse Radiation System Hidenori Sekiguchi, Shinji Seto (NICT) EMCJ2009-99 |
The security of electronic equipments is concerned by intentional electromagnetic interference (IEMI), because the elect... [more] | EMCJ2009-99 pp.7-12 |
| EMCJ | 2010-01-21 10:25 |
Okinawa | University of the Ryukyus | An electromagnetic field immunity test system applying 128-element array antenna Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Mitsubishi Electric Corp.) EMCJ2009-100 |
Abstract The electromagnetic field immunity test system (such as IEC61000-4-3, SAE J1113-21) defines not only exposing a... [more] | EMCJ2009-100 pp.13-17 |
| EMCJ | 2010-01-21 11:00 |
Okinawa | University of the Ryukyus | A Study on Immunity Requirements for Ethernet Ports of Telecommunication Equipments in Customer Premises Yuichiro Okugawa, Masakatsu Ogawa, Kentaro Mokushi, Kazuhiro Takaya, Kazuo Murakawa (NTT East Corp.) EMCJ2009-101 |
Immunity test methods for electronics equipments are specified in IEC 61000 series. Especially, the immunity requirement... [more] | EMCJ2009-101 pp.19-24 |
| EMCJ | 2010-01-22 10:30 |
Okinawa | University of the Ryukyus | Evaluation of Noise Voltage Transmitted from an External Cable to PCB's Signal Traces Takefumi Kumamoto, Hiroyuki Matsumura (Mitsubishi Electric Engineering Company Limited), Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.) EMCJ2009-114 |
This study experimentally clarifies the relationship between the common mode noise induced on the cable connected to the... [more] | EMCJ2009-114 pp.93-98 |
| EMCJ | 2009-06-05 11:10 |
Tokyo | Tokyo Big Sight (Tokyo International Exihibition Center) | Study on EMC problem of medical electronic equipment caused by wideband electromagnetic wave-source Kengo Kitaichi (Tokyo City Univ.), Shinobu Ishigami, Kenichi Takizawa, Yasushi Matsumoto, Kiyoshi Hamaguchi (NICT), Masamitsu Tokuda (Tokyo City Univ.) EMCJ2009-25 |
In this study, radiated immunity tests for four kinds of medical electronic equipment, an infusion pump, a syringe pump,... [more] | EMCJ2009-25 pp.19-24 |
| EMCJ | 2009-06-05 12:00 |
Tokyo | Tokyo Big Sight (Tokyo International Exihibition Center) | Immunity Test of IP Device against Burst Impulsive Noises Naomichi Nakamura, Yoshiharu Akiyama, Yasunao Suzuki, Ryuichi Kobayashi (NTT) EMCJ2009-27 |
The use of IP services is spreading widely with the advent of IP network. These services, especially real-time services ... [more] | EMCJ2009-27 pp.31-34 |
| EMD, EMCJ | 2009-05-22 15:00 |
Tokyo | Kanda camupus, Nippon Institute of Technology | Electric field strength from an electromagnetic field immunity test system applying array antenna technology Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Mitsubishi Electric Corp.) EMCJ2009-18 EMD2009-10 |
The electromagnetic field immunity test system (such as MIL-STD-461 [1], SAE J1113-21 [2]) defines not only exposing an ... [more] | EMCJ2009-18 EMD2009-10 pp.49-53 |
| EMCJ | 2009-04-24 14:30 |
Okayama | Examination of the optimum conditions of common-mode noise immunity test by the WBFC method with inclination of impressed noise current Naoki Kagawa (Fukuyama Univ.) EMCJ2009-4 |
WBFC method is one of the simple immunity tests to the integrated electric circuits. So, factors of positioning of the ... [more] | EMCJ2009-4 pp.19-24 |
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| MW, EMCJ | 2008-10-24 10:25 |
Yamagata | Yamagata Univ. | [Invited Talk]
EMC STANDARDIZATION IN RUSSIA Alexander Worshevsky (SMTU) EMCJ2008-70 MW2008-114 |
Federal agency of technical regulation is the national standardization body in Russia. EMC law is under consideration. M... [more] | EMCJ2008-70 MW2008-114 pp.65-70 |
| EMCJ | 2008-09-26 14:30 |
Osaka | Osaka Univ. | A Discussion about the Malfunction and the Electromagnetic Immunity of an Information Technology Equipment under HPEM environments Hidenori Sekiguchi, Shinji Seto (NICT), Ikuya Minematsu (KEC) EMCJ2008-53 |
Electromagnetic disturbances might cause information technology equipments (ITEs) to malfunction and to be broken down. ... [more] | EMCJ2008-53 pp.19-24 |
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