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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD, EMCJ | 2009-05-22 13:50 |
Tokyo | Kanda camupus, Nippon Institute of Technology | Measurement and simulation of electrostatic discharge waveform when ESD is given to PCB ground Mikiya Iida (Toshiba)  EMCJ2009-16 EMD2009-8 |
The electrical discharge wave form when ESD was given to GND of the microstripline was measured by a current probe, and ... [more] | EMCJ2009-16 EMD2009-8 pp.41-44 |
| EMD, EMCJ | 2009-05-22 14:15 |
Tokyo | Kanda camupus, Nippon Institute of Technology | Relation Between Radiated Electromagnetic Field Intensity and Electrode Condition due to Micro Gap Discharge Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-17 EMD2009-9 |
he relationship between breakdown field strength and radiated electromagnetic field intensity was examined in experiment... [more] | EMCJ2009-17 EMD2009-9 pp.45-48 |
| EMCJ | 2009-04-24 14:55 |
Okayama | Estimation of Discharge Currents Injected onto Ground for Contact Discharge from ESD-Gun Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-5 |
International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for e... [more] | EMCJ2009-5 pp.25-29 |
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| EMCJ | 2009-04-24 15:20 |
Okayama | Uncertainty of Discharge Current Waveform for Contact Discharge of ESD-Gun onto Ground Takashi Adachi (Nagoya Inst. of Tech.), Norio Yamamoto (Industrial Research Center of Shiga Prefecture), Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-6 |
International Electro-technical Commission (IEC) prescribes the immunity test (IEC61000-4-2) of electronic equipment aga... [more] | EMCJ2009-6 pp.31-34 |
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| OPE, CPM, R | 2009-04-17 13:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Electrostatic-Discharge Tolerance of AlGaInAs Laser Diodes Hiroyuki Ichikawa, Chie Fukuda, Shinji Matsukawa, Kotaro Hamada, Nobuyuki Ikoma, Takashi Nakabayashi (Sumitomo Electric Industries, Ltd.) R2009-2 CPM2009-2 OPE2009-2 |
This is a report on electrostatic discharge (ESD)-induced degradation of AlGaInAs/InP laser diodes. We found that the do... [more] | R2009-2 CPM2009-2 OPE2009-2 pp.7-10 |
| RCS, AN, MoNA, SR (Joint) |
2009-03-06 15:15 |
Kanagawa | YRP | Proposal of Secure Wireless Communication Using Spatially Separated Propagation Areas in Wireless Mesh Networks Masataka Araki, Shinichi Miyamoto, Seiichi Sampei (Osaka Univ) RCS2008-262 |
Private wireless network has to establish flexible wireless interconnection between various types of nodes in the limite... [more] | RCS2008-262 pp.295-300 |
| EMCJ | 2009-01-23 15:20 |
Fukuoka | Immunity Characteristics on an LSI Package Takashi Yoshinaga, Takashi Harada (NEC Corp.), David Pommerenke (MST) EMCJ2008-110 |
(To be available after the conference date) [more] | EMCJ2008-110 pp.47-51 |
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| EMCJ | 2008-12-19 14:20 |
Gifu | Gifu Univ. | Radiated Impulsive Electromagnetic Fields Caused by Collision ESD (part 3) Masamitsu Honda (IPL) EMCJ2008-95 |
We analyzed collision ESD phenomena both the charging process of the metal objects in movement and transient electromagn... [more] | EMCJ2008-95 pp.51-56 |
| EMCJ | 2008-12-19 15:10 |
Gifu | Gifu Univ. | ESD phenomena of Magnetic Recording head and ESD/EMI control activity Takayoshi Ohtsu (Hitachi GST) EMCJ2008-97 |
ESD(Electro Static Discharge) Phenomena of GMR head was explained. It includes ?Break down, ?Melting, ?Pin reverse, ?Fre... [more] | EMCJ2008-97 pp.63-68 |
| EMCJ | 2008-12-19 15:35 |
Gifu | Gifu Univ. | Uncertainty of Voltage Waveform induced by Indirect Discharge of ESD-gun onto Vertical Coupling Plane Norio Yamamoto (Industrial Research Center of Shiga Pref.), Yoshinori Taka, Osamu Fujiwara (Nagoya Institute of Technology) EMCJ2008-98 |
The International Electro-technical Commission (IEC) prescribes ESD immunity tests (IEC610000-4-2) for electronic equipm... [more] | EMCJ2008-98 pp.69-73 |
| EMCJ | 2008-12-19 16:00 |
Gifu | Gifu Univ. | Influence of Built-In Inductor on Rising Part of Discharge Current Waveform for Contact Discharge of ESD-Gun. Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (NIT), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2008-99 |
The International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment f... [more] | EMCJ2008-99 pp.75-79 |
| EMCJ | 2008-11-21 11:10 |
Tokyo | AIST Tokyo Waterfront | A Method for Estimating Wideband Transients Using Transmission Loss of High Performance Semi-Rigid Coaxial Cable. Ken Kawamata (Hachinohe Institute of Technology), Yoshinori Taka (Nagoya Institute of Technology), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Institute of Technology) EMCJ2008-82 |
The very fast transients due to micro-gap discharges as low voltage electrostatic discharges (ESDs) were investigated in... [more] | EMCJ2008-82 pp.45-48 |
| IA | 2008-09-26 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Special Talk]
Network Operation on JGN2plus
-- Stability and Challenges on tesbed network from operational side -- Seiichi Yamamoto (Univ of Tokyo/NICT), Kazuhiko Nakamura (NICT), Takashi Miyake (Kurashiki University of Science and The Arts), Yoshihiko Kanaumi (Univ of Tokyo/NEC/NICT), Katsuyuki Hasebe (NTT Communications/NICT), Yoshiyuki Ohta (NICT), Jin Tanaka (KDDI/NICT), Yukiji Mikamo (Obis/NICT), Hiroaki Hazeyama (Nara Institute of Science and Technology/NICT), Kazumasa Kobayashi (Kurashiki University of Science and The Arts), Shinji Shimojo (NICT) IA2008-35 |
Japan Gigabit Network(JGN) is High Speed Advanced Testbed Network for Research and Development(R\&D), which is operated ... [more] | IA2008-35 pp.33-38 |
| EMCJ, EMD | 2008-07-18 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Immunity Estimation for Printed Circuit Boards to Electrostatic Discharge by Circuit Simulation and Conducted Immunity Measurement of ICs Yasuhiro Shiraki (Mitsubishi Elec. Corp.) EMCJ2008-43 EMD2008-25 |
Abstract The author proposed a hybrid method as ESD estimation technique at design stage. It consists of a conducted im... [more] | EMCJ2008-43 EMD2008-25 pp.15-20 |
| EMCJ, EMD | 2008-07-18 14:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) EMCJ2008-45 EMD2008-27 |
Abstract Relationship between breakdown field strength and radiated electromagnetic field strength was examined in expe... [more] | EMCJ2008-45 EMD2008-27 pp.27-30 |
| SDM, ED | 2008-07-11 11:35 |
Hokkaido | Kaderu２・７ | A Latchup-Free Power-Rail ESD Clamp Circuit with Stacked-Bipolar Devices in a High-Voltage Technology Jae-Young Park, Jong-Kyu Song, Chang-Soo Jang, Joon-Tae Jang, San-Hong Kim, Sung-Ki Kim, Taek-Soo Kim (Dongbu HiTek) ED2008-76 SDM2008-95 |
The holding voltage of the high-voltage devices the snapback breakdown condition has been known to be much smaller than ... [more] | ED2008-76 SDM2008-95 pp.193-197 |
| EMCJ | 2008-03-07 13:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Influence of Test Methods for Indirect Discharge of ESD Gun onto Horizontal Coupling Plane Norio Yamamoto (IRCS) EMCJ2007-123 |
The International Electro-technical Commission (IEC) prescribes the ESD immunity test (IEC610000-4-2) for electronic equ... [more] | EMCJ2007-123 pp.37-42 |
| EMD, R | 2008-02-15 10:40 |
Kyoto | Development of Simple ESD Checker and it's Application
-- Detection of ESD Checker and it's Application -- Norio Yamasaki, Masaru Sanada (KUT) R2007-59 EMD2007-114 |
Simple Electro Static Discharge(ESD) tester has been developed for evaluating ESD sensitivity of LSI and studying ESD pr... [more] | R2007-59 EMD2007-114 pp.1-6 |
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| DC | 2008-02-08 09:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | ESD/Latch up Failure Analysis of CMOS LSI
-- Failure Mode Analysis with Atutual Data -- Hideo Kohinata, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2007-67 |
As the CMOS LSI advances, ESD/Latch-up problem is becoming more serious problem as a weakness of CMOS LSI structure. Thi... [more] | DC2007-67 pp.1-5 |
| EMCJ, MW | 2007-10-26 13:30 |
Miyagi | Tohoku University | Estimation of Transition Duration due to Discharge from Measured Waveforms in Bandwidth-limited. Yoshinori Taka (NIT), Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) EMCJ2007-73 MW2007-120 |
The voltage and current transition duration due to small gap discharge as the low voltage ESD was investigated in time d... [more] | EMCJ2007-73 MW2007-120 pp.111-115 |
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