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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2019-11-28 14:10 |
Osaka | Central Electric Club | Non-homogeneous Markov Process Modeling for Software Reliability Assessment Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima U.)  R2019-44 |
In this paper, we focus on non-homogeneous Markov processes, which are generalizations of the well-known non-homogeneous... [more] | R2019-44 pp.7-12 |
| R | 2019-11-28 14:35 |
Osaka | Central Electric Club | Process-Oriented Software Reliability Modeling with Debugging Difficulties Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2019-45 |
We discuss software reliability growth modeling by considering the relationship between the debugging process, which mai... [more] | R2019-45 pp.13-18 |
| R | 2019-10-25 14:00 |
Nagasaki | Fukue Culture Center | Multiple Change-Point Modeling for Software Reliability Assessment Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2019-38 |
We discuss Markovian imperfect debugging modeling for software reliability assessment with multiple changes of testing e... [more] | R2019-38 pp.1-6 |
| SAT | 2019-10-10 15:20 |
Fukuoka | JR HAKATA CITY {10F RoomA+B} | Development of highly maintainable and reliable RF transceiver for satellite base stations Munehiro Matsui, Akira Matsushita, Fumihiro Yamashita (NTT) SAT2019-52 |
Maintainability and reliability is required for sustainable operation of satellite communication system. This paper pres... [more] | SAT2019-52 pp.21-26 |
| NS | 2019-10-10 16:10 |
Aichi | Nagoya Institute of Technology | [Invited Talk]
On recent developments in network reliability computation using binary decision diagrams Jun Kawahara (Kyoto Univ.) NS2019-113 |
Given a network with static link failure probabilities, the network reliability is to compute the probability that two s... [more] | NS2019-113 pp.59-62 |
| NS, IN, CS, NV (Joint) |
2019-09-06 11:40 |
Miyagi | Research Institute of Electrical Communication, Tohoku Univ. | Efficient Reliability Evaluation of Multi-Domain Networks with Secure Intra-Domain Privacy Atsushi Taniguchi, Takeru Inoue, Kohei Mizuno (NTT), Takashi Kurimoto, Atsuko Takefusa, Shigeo Urushidani (NII) CS2019-55 |
Communication networks are now an essential infrastructure of society. Many services are constructed across multiple net... [more] | CS2019-55 pp.45-50 |
| LQE, OPE, CPM, EMD, R | 2019-08-22 16:45 |
Miyagi | [Invited Talk]
3D Flash Memory Cell Reliability Yuichiro Mitani, Harumi Seki, Takanori Asano, Yasushi Nakasaki (Toshiba Memory) R2019-26 EMD2019-24 CPM2019-25 OPE2019-53 LQE2019-31 |
As conventional planar NAND flash memories are limited from physical and electrical scaling point of view, the three-dim... [more] | R2019-26 EMD2019-24 CPM2019-25 OPE2019-53 LQE2019-31 pp.35-38 |
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| NC, IBISML, IPSJ-MPS, IPSJ-BIO [detail] | 2019-06-17 13:00 |
Okinawa | Okinawa Institute of Science and Technology | Reliability Assessment by Bayesian Deep Learning for Image-Caption Retrieval Task Kenta Hama, Takashi Matsubara, Kuniaki Uehara (Kobe Univ.) IBISML2019-1 |
Following the development of black-box machine learning algorithms, the practical demand of the re- liability assessment... [more] | IBISML2019-1 pp.1-8 |
| OFT | 2019-05-17 10:45 |
Osaka | Ｉ-site NANBA | 20-year reliability test results for SC optical connectors on outside plant Yoshiteru Abe, Kota Shikama, Kazunori Katayama (NTT) OFT2019-22 |
Optical connectors are currently used in both indoor environments such as buildings and in outdoor equipment such as aer... [more] | OFT2019-22 pp.93-96 |
| SSS | 2019-04-23 13:35 |
Tokyo | Study on the analysis method for accidents based on human factors Nobuo Mitomo (Nihon Univ.), Atsushi Hashimoto (JR-East) SSS2019-2 |
(To be available after the conference date) [more] | SSS2019-2 pp.5-8 |
|
| IMQ, IE, MVE, CQ (Joint) [detail] |
2019-03-15 13:50 |
Kagoshima | Kagoshima University | Network reliability evaluation with arbitrary dependencies on link failures Jun Kawahara (NAIST), Takeru Inoue (NTT), Shoji Kasahara (NAIST) CQ2018-113 |
Given a network and the failure ratio of each link of the network, network reliability evaluation is to compute the prob... [more] | CQ2018-113 pp.111-116 |
| EMD | 2019-03-01 14:00 |
Tokyo | Contact reliability of electrical contacts by continuous make/break test of electromagnetic contactor Ikarashi Masanari, Ogaki Asuka, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2018-67 |
In this research, we conducted 5 million times of opening and closing experiments with contacts under minute load condit... [more] | EMD2018-67 pp.41-46 |
|
| EMD, R | 2019-02-15 14:55 |
Osaka | [Invited Talk]
SPICE based circuit performance degradation simulation with MOSFET aging models Koji Tanaka, Shinichiro Amemiya, Hitoshi Okamura, Masanori Shimasue (MoDeCH) R2018-56 EMD2018-57 |
Now, semiconductor products are used in many high reliability products such as vehicle parts and medical equipment. Natu... [more] | R2018-56 EMD2018-57 pp.25-30 |
|
| MW, ED | 2019-01-18 10:40 |
Tokyo | Hitachi, Central Research Lab. | The failure mode analysis on GaN-HEMT under High temperature operation Yasuyo Yotsuda (SEDI), Yasunori Tateno, Takumi Yonemura, Masato Furukawa, Hiroshi Yamamoto (SEI), Yukinori Nose, Satoshi Shimizu (SEDI) ED2018-81 MW2018-148 |
(To be available after the conference date) [more] | ED2018-81 MW2018-148 pp.67-70 |
| R | 2018-12-15 14:30 |
Okinawa | Modelling of High-performance and Flexible Protocol considering ECN bit error Mitsutaka Kimura (Gifu City Women's Coll.), Mitsuhiro Imaizumi (Aichi Gakusen Univ.), Toshio Nakagawa (Aichi Tech.) R2018-46 |
Recently, long-distance transmission network has been demanded for high reliability in communication system such as clou... [more] | R2018-46 pp.17-22 |
|
| R | 2018-10-26 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Note on Goodness-of-fit Tests for Software Reliability Models Hiroyuki Okamura, Daisuke Sumida, Tadashi Dohi (Hiroshima Univ.) R2018-34 |
Software reliability models (SRMs) are the stochastic processes of the number of faults detected in the development phas... [more] | R2018-34 pp.1-6 |
| OCS, OFT, LSJ (Joint) [detail] |
2018-08-31 09:30 |
Hokkaido | Hakodate Hokuyo Building 8Kai Hall | Small Footprint Air-gap Multi Fiber Connector Hajime Arao, Sho Yakabe, Fumiya Uehara, Dai Sasaki, Takayuki Shimazu (SEI) OCS2018-25 |
Commonly used optical connectors realize good characteristics by using a PC connection technology. However PC connection... [more] | OCS2018-25 pp.37-42 |
| ICM | 2018-07-06 13:00 |
Aomori | A Method of Designing Service Function Chaining with High Reliability Aiko Oi, Motomu Nakajima, Yuji Soejima, Mitsuho Tahara (NTT) ICM2018-21 |
Adapting virtualization technologies to carrier networks, such as Network Function Virtualization (NFV) and Software-def... [more] | ICM2018-21 pp.59-64 |
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| SDM | 2018-06-25 11:40 |
Aichi | Nagoya Univ. VBL3F | Control of SiO2/GaN Interface for High-performance GaN MOSFET Tauji Hosoi, Takahiro Yamada, Mikito Nozaki (Osaka Univ.), Tokio Takahashi, Hisashi Yamada, Mitsuaki Shimizu (AIST), Akitaka Yoshigoe (JAEA), Takayoshi Shimura, Heiji Watanabe (Osaka Univ.) SDM2018-18 |
A high-quality gate insulator together with low interface states is indispensable for GaN-based power MOSFETs. We have r... [more] | SDM2018-18 pp.11-14 |
| EMD | 2018-06-15 15:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Effect of circuit conditions on various characteristics such as molten metal bridge and arc discharge of auxiliary contact for electromagnetic contactor Kiyoshi Yoshida, Koichiro Sawa (NIT), Kenji Suzuki (Fuji Electric FA Components & Systems) EMD2018-11 |
We have carried out an open and close operation experiments to evaluate the contact reliability of the auxiliary contact... [more] | EMD2018-11 pp.19-23 |
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