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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED, SDM |
2008-01-30 16:20 |
Hokkaido |
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Control of Nonlinear Characteristics in GaAs-based Three-terminal Nanowire Junction Devices and its Application to Logic Gates Shaharin Fadzli Abd Rahman, Yuta Shiratori, Seiya Kasai (Hokkaido Univ.) ED2007-243 SDM2007-254 |
[more] |
ED2007-243 SDM2007-254 pp.33-38 |
ED, SDM |
2008-01-31 11:15 |
Hokkaido |
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Implementation of active and sequential circuits on GaAs-based nanowire network structures controlled by Schottky wrap gates Seiya Kasai (Hokkaido Univ., JST), Hong-Quan Zhao, Tamotsu Hashizume (Hokkaido Univ.) ED2007-249 SDM2007-260 |
Implementation of active and sequential circuits on semiconductor-based nanowire networks with a specific topology and p... [more] |
ED2007-249 SDM2007-260 pp.63-68 |
SDM, ED |
2007-02-01 16:00 |
Hokkaido |
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Investigation of A Novel Logic Circuit Implementation Scheme Utilizing Topological Correlation between Logic Graph by Decision Diagram and Nanowire Network Structures Seiya Kasai, Tatsuya Nakamura, Yuta Shiratori (Hokkaido Univ.) |
This report presents study on a novel scheme to implement logic information processing function on nanowire network stru... [more] |
ED2006-245 SDM2006-233 pp.29-34 |
SDM, ED |
2007-02-02 11:25 |
Hokkaido |
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Fabrication and Characterization of Three-GaAs Nanowire-Junction Devices Controlled by Schottky Wrap Gates Tatsuya Nakamura, Seiya Kasai, Yuta Shiratori, Tamotsu Hashizume (Hokkaido Univ.) |
[more] |
ED2006-253 SDM2006-241 pp.73-77 |
MW, ED |
2007-01-19 13:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Fabrication and Characterization of Schottky Wrap Gate Controlled AlGaN/GaN Nanowire FETs Takahiro Tamura, Junji Kotani, Seiya Kasai, Tamotsu Hashizume (Hokkaido Univ., RCIQE) |
Schottky wrap gate (WPG) controlled AlGaN/GaN nanowire FETs were fabricated and characterized. The devices with channel ... [more] |
ED2006-232 MW2006-185 pp.179-182 |
ED, SDM, R |
2006-11-24 16:05 |
Osaka |
Central Electric Club |
Seiya Kasai, Alberto F. Basile, Tamotsu Hashizume (Hokkaido Univ.) |
[more] |
R2006-37 ED2006-182 SDM2006-200 pp.33-38 |
ED, SDM |
2006-01-27 10:30 |
Hokkaido |
Hokkaido Univ. |
Study on switching characteristics of quantum wire transistors and single electron transistors controlled by Schottky wrap gate for ultra-low power quantum nano integrated logic circuits Seiya Kasai, Miki Yumoto, Hideki Hasegawa (Hokkaido Univ.) |
To confirm the ultra-low power consumption capability of quantum nano integrated logic circuits, such as nanoprocessors,... [more] |
ED2005-234 SDM2005-246 pp.15-20 |
ED, SDM |
2006-01-27 10:55 |
Hokkaido |
Hokkaido Univ. |
Investigation of GaAs-based single electron device for hexagnal BDD single electron logic curcuit Yuji Abe, Tatsuya Nakamura, Takahiro Tamura, Seiya Kasai, Tamotsu Hashizume, Hideki Hasegawa (Hokkaido Univ) |
(To be available after the conference date) [more] |
ED2005-235 SDM2005-247 pp.21-26 |
R, ED, SDM |
2005-11-25 15:55 |
Osaka |
Central Electric Club |
Investigation of gate leakage current and gate control anomalies in nanometer-scale Schottky gate AlGaN/GaN HFETs Seiya Kasai, Junji Kotani, Hideki Hasegawa, Tamotsu Hashizume (Hokkaido Univ.) |
Anomalous gate leakage current and gate control anomaly in AlGaN/GaN HFETs having nanometer-scale Schottky gates were in... [more] |
R2005-46 ED2005-181 SDM2005-200 pp.47-52 |
LQE, ED, CPM |
2005-10-13 15:40 |
Shiga |
Ritsumeikan Univ. |
Lateral tunneling transport in submicron gates on AlGaN/GaN HFET Junji Kotani, Seiya Kasai, Hideki Hasegawa, Tamotsu Hashizume (Hokkaido Univ.) |
[more] |
ED2005-132 CPM2005-119 LQE2005-59 pp.67-70 |
LQE, ED, CPM |
2005-10-14 13:00 |
Shiga |
Ritsumeikan Univ. |
Liquid sensor using gateless AlGaN/GaN HEMT structure Takuya Kokawa, Takeshi Kimura, Taketomo Sato, Seiya Kasai, Hideki Hasegawa, Tamotsu Hashizume (Hokkaido Univ.) |
[more] |
ED2005-147 CPM2005-134 LQE2005-74 pp.39-42 |
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