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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2016-02-17 10:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation Fuqiang Li, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara (Kyutech)  DC2015-87 |
Both logic paths and clock paths are subject to the impact of IR-Drop which occurs in capture mode during scan test. Thi... [more] | DC2015-87 pp.7-12 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 15:45 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | [Fellow Memorial Lecture]
Improving System Dependability by VLSI Test Technology Seiji Kajihara (KIT) VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51 |
VLSI Test technology for detection of manufacturing faults has been developed to improve test quality that is the capabi... [more] | VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51 pp.43-44(VLD), pp.9-10(CPM), pp.9-10(ICD), pp.19-20(CPSY), pp.43-44(DC), pp.19-20(RECONF) |
| IBISML | 2015-11-27 14:00 |
Ibaraki | Epochal Tsukuba | [Poster Presentation]
Nonnegative matrix factorization of test scores Atsunori Kanemura (AIST), Hiroko Onari, Manabu Shikauchi, Masataka Hashimoto (Recruit Career), Shotaro Akaho (AIST) IBISML2015-80 |
When assessing skills of humans or designing itemsets, having fewer number of items is cost-efficient both in time and m... [more] | IBISML2015-80 pp.203-208 |
| MoNA | 2015-08-04 14:35 |
Hyogo | Kobe University Centennial Hall (Rokko Hall) | [Encouragement Talk]
How high is the floor? Floor Height Estimation Based on Mobile Phones with Sensor Data Haruki Izumikawa, Yuki Hirota, Hiroshi Hanano, Chihiro Ono (KDDI Labs.) MoNA2015-12 |
We have undertaken research and development with the objectives of making cellular coverage distinctly visible and ident... [more] | MoNA2015-12 pp.21-24 |
| EMCJ, IEE-EMC, IEE-MAG | 2015-06-26 11:00 |
Overseas | KMITL, Thailand | [Invited Talk]
EMC Facilities for Products Certification for AEC Kraison Aunchaleevarapan (PTEC, NSTDA, Thailand.) EMCJ2015-22 |
ASEAN Free Trade Area has set the standard of products to replace the existing tax measures. In this matter is enforce ... [more] | EMCJ2015-22 p.33 |
| DC | 2015-02-13 16:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg | An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) DC2014-86 |
Multi-cycle capture testing has been proposed to improve test quality of scan testing. However, fault diagnosis for mult... [more] | DC2014-86 pp.49-54 |
| IBISML | 2014-03-07 11:35 |
Nara | Nara Women's University | Bayesian Test of Independence Takanori Ayano, Joe Suzuki (Osaka Univ.) IBISML2013-77 |
This paper proposes Bayesian estimators of mutual information and independence tests. Given independently emitted $n$ ... [more] |
IBISML2013-77 pp.79-86 |
| KBSE | 2014-03-06 16:45 |
Okinawa | Okinawaken-Seinenkaikan | Equivalent Mutants Detection Method Using Symbolic Execution Takaya Ueshiba, Weitao Wang, Hirohide Haga (Doshisha Univ.) KBSE2013-88 |
This paper proposes a method for automatically detecting equivalent mutants using symbolic execution. In mutation analys... [more] | KBSE2013-88 pp.55-60 |
| LOIS, ICM | 2014-01-17 10:50 |
Nagasaki | Nagasaki Museum of History and Culture | Improving Exploratory Testing by Techniques for Visualizing Test Session Logs Hajime Nakajima, Hidetaka Koya, Takeshi Masuda, Tsutomu Maruyama (NTT) ICM2013-43 LOIS2013-47 |
Testing which allows us to guarantee the quality of systems within the limited development time is one of the important ... [more] | ICM2013-43 LOIS2013-47 pp.47-52 |
| DC | 2013-12-13 13:00 |
Ishikawa | Efficient Scan-Based BIST Architecture for Application-Dependent FPGA Test Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue (NAIST) DC2013-68 |
This paper presents a scan-based BIST architecture for testing of application-dependent circuits configured on FPGA. I... [more] |
DC2013-68 pp.1-6 |
|
| DC | 2013-12-13 13:25 |
Ishikawa | Variable Test-Timing Generation for Built-In Self-Test on FPGA Yasuo Sato, Munehiro Matsuura, Hitoshi Arakawa, Yousuke Miyake, Seiji Kajihara (Kyushu Inst. of Tech.) DC2013-69 |
This paper proposes a variable test-timing generation method that should be used for built-in self-test on FPGA. Applica... [more] | DC2013-69 pp.7-12 |
|
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2013-11-29 09:45 |
Kagoshima | A Method of High Quality Transition Test Generation Using RTL Information Hiroyuki Nakashima, Satoshi Ohtake (Oita Univ.) VLD2013-94 DC2013-60 |
With the miniaturization and high speed of large scale integrated circuits (VLSIs), it has become important to test dela... [more] | VLD2013-94 DC2013-60 pp.239-244 |
|
| SS, IPSJ-SE | 2013-10-24 13:50 |
Ishikawa | A representation of relationships between functions and variables in source code Yamato Takahashi, Kazuya Fukuhara, Toshimitsu Inomata, Yoshikazu Arai, Shintaro Imai (Iwate Prefectural Univ.) SS2013-40 |
In development of embedded software, the quality of software is very important. A code review is performed in order ... [more] |
SS2013-40 pp.49-54 |
|
| CQ | 2013-07-12 10:15 |
Hokkaido | Hokkaido University | 3D Video Quality Assessment Test in a Packet Loss Network Takahiro Yamasaki, Takashi Nishi (OKI) CQ2013-23 |
3D video communication would be expected to enrich remote office communication. Usually, remote office communication car... [more] | CQ2013-23 pp.55-60 |
| NS, IN (Joint) |
2013-03-08 09:40 |
Okinawa | Okinawa Zanpamisaki Royal Hotel | QoE-based Log Collection in Minimization of Drive Tests Haruki Izumikawa (KDDI Labs.), Ryuichi Yasunaga, Katsuhiro Kujirai, Shigeyuki Terachi, Yoshikazu Shirai (KDDI Engineering), Nao Kobayashi, Keizo Sugiyama (KDDI Labs.) NS2012-227 |
We have been conducting research into the creation of a coverage map or a map of coverage holes for mobile access system... [more] | NS2012-227 pp.361-365 |
| DC | 2013-02-13 16:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Data volume reduction method for unknown value handling in built-in self test used in field Yuta Yoshimi (NAIST), Kazumi Hatayama, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue (NAIST/JST) DC2012-90 |
Many approaches on test pattern compression targeted unknown value handling. It is because unknown values have impacts o... [more] | DC2012-90 pp.61-66 |
| IN, IA (Joint) |
2012-12-14 08:55 |
Hiroshima | Hiroshima City Univ. | Stationarity Analysis and Prediction Model Construction of TCP Throughput by using Application-Level Mechanism Hiroshi Yoshida, Kozo Satoda (NEC Corp.) IN2012-128 |
The end-to-end TCP throughput on best-effort networks, e.g., the Internet and mobile networks, fluctuates widely dependi... [more] | IN2012-128 pp.39-44 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 16:00 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | A Method to Estimate the Number of Don't-Care Bits with Netlist Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (KIT) VLD2012-104 DC2012-70 |
X-filling is often utilized so as to achieve test compression, test power reduction, or test quality improvement etc. i... [more] |
VLD2012-104 DC2012-70 pp.261-266 |
| MW (Workshop) |
2012-08-08 - 2012-08-10 |
Overseas | Chulalongkorn University, Bangkok, Thailand | Evaluation of 5-GHz Band MIMO Communication Quality Under the Wireless Power Transmission Situation in a Spacecraft Shuntaro Tashiro (Tokyo University of Science), Takumasa Noji (Tokyo Metropolitan University), Takako Kuroyanagi (Nihon Univ.), Goh Fukuda (Tokyo University of Science), Yuta Kobayashi, Satoshi Yoshida, Yusuke Maru, Yoshihiro Naruo, Shigeo Kawasaki (JAXA/ISAS) |
Effects on multiple inputs multiple outputs (MIMO) communication quality from a wireless power transmission (WPT) syste... [more] |
|
| CQ | 2012-07-13 13:35 |
Ehime | Ehime Univ. | 3D Video Quality Assessment Test for Interoffice Communication Takahiro Yamasaki, Takashi Nishi, Masato Nonaka (OKI) CQ2012-36 |
3D video communication would be expected to enrich remote office communication. Usually, remote office communication car... [more] | CQ2012-36 pp.113-117 |
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