IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 41 - 60 of 226 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2018-06-25
13:30
Aichi Nagoya Univ. VBL3F [Invited Lecture] Inversion channel diamond MOSFET -- Formation of diamond MOS interface by wet annealing --
Tsubasa Matsumoto (Kanazawa Univ.), Hiromitsu Kato, Toshiharu Makino, Masahiko Ogura, Daisuke Takeuchi (AIST), Takao Inokuma (Kanazawa Univ.), Satoshi Yamasaki (AIST), Norio Tokuda (Kanazawa Univ.) SDM2018-20
We fabricated inversion channel diamond MOSFET with normally off characteristics. The diamond MOSFET with the inversion ... [more] SDM2018-20
pp.19-22
EMCJ, MICT
(Joint)
2018-03-16
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. High frequency decoupling for reduction of common-mode current of three-phase inverter
Shiki Fujii (Kyoto Univ.), Tohlu Matsushima (Kyutech), Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2017-111
Recently, electric vehicles have been developed rapidly, and three-phase inverters are also used in its motor drive circ... [more] EMCJ2017-111
pp.37-42
WPT
(2nd)
2017-12-09
- 2017-12-11
Overseas National University of Singapore(AWPT2017) Novel Extended Non-Breakdown Rectifier Topologies for Power-Optimized Waveform based Wireless Power Transfer Systems
Hao Zhang (NUST), Zheng Zhong, Yong-Xin Guo (NUS), Wen Wu (NUST)
This paper presents two novel extended non-breakdown rectifier topologies, which practically solve the rectifier?s early... [more]
WPT, EMCJ
(Joint)
2017-11-21
11:20
Tokyo Kikai-Shinko-Kaikan Bldg. Relation between parasitic coupling around power MOSFET and excitation of common-mode voltage
Tohlu Matsushima, Takao Kuroyanagi, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2017-61
In this report, it is formalized that common-mode voltages are excited by switching current flows on parasitic capacitor... [more] EMCJ2017-61
pp.13-18
SDM 2017-11-09
13:05
Tokyo Kikai-Shinko-Kaikan Bldg. Simple and efficient approach to improve hot carrier immunity of a p-LDMOSFET
Atsushi Sakai, Katsumi Eikyu (REL), Fujii Hiroki, Takahiro Mori (RSMC), Yutaka Akiyama, Yasuo Yamaguchi (REL) SDM2017-63
This paper proposes a simple and efficient method to improve hot carrier (HC) immunity of p-channel LDMOSFET without deg... [more] SDM2017-63
pp.11-14
SDM 2017-11-09
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Characterization and modeling of SiC power MOSFET
Takashi Sato, Kazuki Oishi, Masayuki Hiromoto (Kyoto Univ.), Michihiro Shintani (NAIST) SDM2017-65
(To be available after the conference date) [more] SDM2017-65
pp.21-26
SDM, ICD, ITE-IST [detail] 2017-07-31
10:15
Hokkaido Hokkaido-Univ. Multimedia Education Bldg. Multi Sensor Operation using Octagonal Multi-Output MOSFET
Tomochika Harada (Yamagata Univ.) SDM2017-32 ICD2017-20
By using the Si material and the MOSFET type as the sensor device, it is possible to fabricate the various sensor device... [more] SDM2017-32 ICD2017-20
pp.7-12
SDM, ICD, ITE-IST [detail] 2017-08-01
13:50
Hokkaido Hokkaido-Univ. Multimedia Education Bldg. Evaluation of equivalent MOSFET reduced temperature dependence of threshold voltage
Takuya Yamaguchi, Tatsuya Oku, Kawori Sekine (Meiji Univ.) SDM2017-41 ICD2017-29
A MOSFET has a temperature dependence of threshold voltage and mobility. In this paper, we focused on threshold voltage ... [more] SDM2017-41 ICD2017-29
pp.77-82
SDM, ICD, ITE-IST [detail] 2017-08-02
11:35
Hokkaido Hokkaido-Univ. Multimedia Education Bldg. Gate Controlled Diode Characteristics of Super Steep Subthreshold slope PN-Body Tied SOI-FET for high Efficiency RF Energy Harvesting
Shun Momose, Jiro Ida, Takayuki Mori, Takahiro Yoshida, Junpei Iwata, Takashi Horii, Takahiro Furuta, Takuya Yamada, Daichi Takamatsu, Kenji Itoh (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK) SDM2017-45 ICD2017-33
The gate controlled diode characteristics with our newly super steep subthreshold slope (SS) “PN-Bode Tied SOI FET” was ... [more] SDM2017-45 ICD2017-33
pp.109-114
EMCJ, EMD 2017-07-21
13:05
Tokyo Kikai-Shinko-Kaikan Bldg. Circuit simulation of a Hybrid DC Circuit Breaker consisted of electric contacts and Semiconductor switch
Kyotaro Nakayama, Shungo Zen, Koichi Yasuoka (Tokyo Inst. of Tech.) EMCJ2017-25 EMD2017-13
Recently, a hybrid DC circuit breaker consisted of metal contacts, semiconductor devices and a varistor is intensely stu... [more] EMCJ2017-25 EMD2017-13
pp.1-6
MW
(2nd)
2017-06-14
- 2017-06-16
Overseas KMUTT, Bangkok, Thailand [Short Paper] RF Characteristics of SOTB Devices for GHz Frequency Applications
Van-Trung Nguyen, Koichiro Ishibashi (UEC)
The paper presents RF characteristics of the 65nm SOTB CMOS devices for 1GHz range. With many superior features such as ... [more]
EMD 2017-03-03
14:15
Chiba   Relationship of molten bridge and arcless commutation during current interruption of Hybrid DCCB
Yuta Yamada, Chen Mo, Kyotaro Nakayama, Tatsuya Hayakawa, Shungo Zen, Koichi Yasuoka (Titech) EMD2016-103
In recent years, with the increase in demand for DC power distribution, hybrid DC circuit breakers in which electrical c... [more] EMD2016-103
pp.17-20
EMD, R 2017-02-17
16:20
Shiga Omuron Kusatsu Factory DC300 V-150 A arcless current interruption by using arcless hybrid DC circuit breaker
Tatsuya Hayakawa, Kyotaro Nakayama, Shungo Zen, Koichi Yasuoka (Titech) R2016-69 EMD2016-96
(To be available after the conference date) [more] R2016-69 EMD2016-96
pp.53-58
ICD, CPM, ED, EID, EMD, MRIS, OME, SCE, SDM, QIT
(Joint) [detail]
2017-01-31
14:10
Hiroshima Miyajima-Morino-Yado(Hiroshima) Automatic Design of Operational Amplifier Based on Equation-Based and Genetic Algorithm
Kento Suzuki, Nobukazu Takai, Yoshiki Sugawara, Satoshi Yoshizawa, Kazuto Okochi, Tsukasa Ishii, Saki Shinoda, Masafumi Fukuda (Gunma Univ.) EMD2016-83 MR2016-55 SCE2016-61 EID2016-62 ED2016-126 CPM2016-127 SDM2016-126 ICD2016-114 OME2016-95
It is difficult to design optimal analog circuit in a short time in terms of designing flexibility because the electrica... [more] EMD2016-83 MR2016-55 SCE2016-61 EID2016-62 ED2016-126 CPM2016-127 SDM2016-126 ICD2016-114 OME2016-95
pp.69-74
EMD 2016-12-16
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. Arcless Hybrid DC Circuit Breaker Using Tungsten and Carbon Contacts
Tatsuya Hayakawa, Kyotaro Nakayama, Koichi Yasuoka (Titech) EMD2016-66
A hybrid circuit breaker consists of power semiconductor devices and a varistor connected in parallel with an electrical... [more] EMD2016-66
pp.7-12
ICD, CPSY 2016-12-16
09:40
Tokyo Tokyo Institute of Technology Automatic Design of Bias Circuit Based on the Results of Characterized MOSFET
Kento Suzuki, Nobukazu Takai, Yoshiki Sugawara, Kazuto Okochi, Satoshi Yoshizawa, Tsukasa Ishii, Saki Shinoda, Masafumi Fukuda (Gunma Univ.) ICD2016-91 CPSY2016-97
It is difficult to design optimal analog circuit in a short time in terms of designing flexibility. In an analog circuit... [more] ICD2016-91 CPSY2016-97
pp.119-122
SDM, EID 2016-12-12
15:15
Nara NAIST Study of the inverter circuit of DNA/Si-MOSFET due to the parasitic capacitance control
Hibiki Nakano, Matsuo Naoto, Akira Heya, Tadao Takada, Kazusige Yamana (Univ. of Hyogo), Tadashi Sato, Shin Yokoyama (Univ. Hiroshima) EID2016-23 SDM2016-104
An input/output characteristics of the inverter composed of the DNA/Si-MOSFET and the parasitic capacity was studied. Th... [more] EID2016-23 SDM2016-104
pp.63-66
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-29
09:00
Osaka Ritsumeikan University, Osaka Ibaraki Campus Design and Implementation Methodology of Low-power Standard cell memory with optimized body-bias separation in Silicon-on-Thin-BOX (SOTB)
Yusuke Yoshida, Kimiyoshi Usami (Shibaura Institute of Tech.) VLD2016-53 DC2016-47
We focus on the Standard Cell Memory (SCM) as another option to supersede SRAM for low-voltage operation. This paper des... [more] VLD2016-53 DC2016-47
pp.55-60
SDM 2016-11-10
13:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Potential and Prospects of Low-Energy SOI Devices in Sensor Network Era
Yasuhisa Omura (Kansai Univ.) SDM2016-81
This paper discusses, in detail, the potential and prospects of various SOI devices including SOI TFETs. Device perform... [more] SDM2016-81
pp.15-22
SDM 2016-10-27
10:50
Miyagi Niche, Tohoku Univ. Behavior of Random Telegraph Noise toward Bias Voltage Changing
Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shinya Ichino, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa (Tohoku Univ.) SDM2016-75
As the progression of MOSFETs scaling down continues, the impacts of RTN (Random Telegraph Noise) on the MOSFETs have be... [more] SDM2016-75
pp.35-38
 Results 41 - 60 of 226 [Previous]  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan