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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD 2015-03-02
16:10		 Okinawa Okinawa Seinen Kaikan A High Stability and Low Leakage Current Six-Transistor CMOS SRAM Employing a Single Low Supply Voltage
Nobuaki Kobayashi, Ryusuke Ito, Koji Motojima, Tadayoshi Enomoto (Chuo Univ.) VLD2014-160		  [more] VLD2014-160
pp.43-48
IE, ICD, VLD, IPSJ-SLDM [detail] 2014-10-02
16:15		 Miyagi   A Low Supply Voltage Six-Transistor CMOS SRAM Employing Adaptively Lowering Memory Cell Supply Voltage for "Write" Operation
Nobuaki Kobayashi (Nagaoka Univ. of Tech.), Ryusuke Ito, Tadayoshi Enomoto (Chuo Univ.) VLD2014-66 ICD2014-59 IE2014-45		 We developed and applied a new circuit, called the “Self-controllable Voltage Level (SVL)” circuit, not only to expand b... [more] VLD2014-66 ICD2014-59 IE2014-45
pp.33-38
ICD, SDM 2014-08-05
10:25		 Hokkaido Hokkaido Univ., Multimedia Education Bldg. Development of a Low Standby Power, Six-Transistor CMOS SRAM Employing a Single Power Supply
Ryusuke Ito (Chuo Univ.), Nobuaki Kobayashi (NUT), Tadayoshi Enomoto (Chuo Univ.) SDM2014-73 ICD2014-42		 We developed and applied a new circuit, called the “Self-controllable Voltage Level (SVL)” circuit, not only to expand b... [more] SDM2014-73 ICD2014-42
pp.59-64
EID, ITE-IDY, IEE-EDD 2012-01-28
11:17		 Akita Akita University Fundamental properties of liquid crystal MMW phase shifter by using novel microstrip line structure
Yusuke Ito, Takayuki Sasamori, Yoji Isota, Ryouta Ito, Michinori Honma, Toshiaki Nose (Akita Pref. Univ.) EID2011-29		  [more] EID2011-29
pp.87-90
AI, IPSJ-ICS 2008-03-06
15:25		 Hokkaido   The Influence of market trend and investors' risk attitude on their investment behavior
Yuto Iwasaki, Kazuhiro Ueda (The Univ. of Tokyo), Yusuke Ito (Simplex Institute Inc.), Kiyoshi Izumi (AIST) AI2007-57		 The purpose of this research is to experimentally clarify the influence of market factors (market trend and volatility) ... [more] AI2007-57
pp.79-84
MSS, CAS 2005-11-10
11:20		 Yamaguchi Yamaguchi University On the Complexity of Fault Testing for Reversible Circuits
Shigeru Ito, Yusuke Ito, Satoshi Tayu, Shuichi Ueno (Tokyo Inst. of Tech.) 		This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on a set of wires of a r... [more] CAS2005-51 CST2005-20
pp.13-16
IE, CQ, LOIS, IEE-CMN 2004-09-16
15:00		 Hyogo   Continuous Assessment and Mapping of User-level QoS in Audio-Video Transmission
Ryusuke Ito, Yoshihiro Ito, Shuji Tasaka (NIT) 		 [more] CQ2004-74 OIS2004-28 IE2004-35
pp.31-36
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