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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 16:35 |
Ehime | Ehime Prefecture Gender Equality Center | Test Generation for Hardware Trojan Detection Using the Delay Difference of a Pair of Independent Paths Suguru Rikino, Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.)  VLD2019-46 DC2019-70 |
Hardware Trojan detection is important to ensure security of LSIs. If a hardware Trojan is inserted in a signal line o... [more] |
VLD2019-46 DC2019-70 pp.151-155 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2019-03-18 09:00 |
Kagoshima | Nishinoomote City Hall (Tanega-shima) | A Test Generation Method for Resistive Open Faults Using MAX-SAT Problem Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) CPSY2018-117 DC2018-99 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] | CPSY2018-117 DC2018-99 pp.315-320 |
| EE, IEE-SPC (Joint) |
2019-03-07 14:40 |
Okinawa | Evaluation of Detection Accuracy based on The Influence of Power Distortion in System Protection Relay Rukai Sun, Nishimura Kazunori (Hiroshima Ins. Tech.), Yonemoto Kazuhiro, Hiroi Hideyuki, Tsuchida Takashi (KDK) EE2018-58 |
In recent years, ground fault accidents such as electric shock and fire have occurred frequently due to the rapid rise i... [more] | EE2018-58 pp.1-6 |
|
| EE | 2019-01-16 11:00 |
Kumamoto | KCIC | Fault detection of photovoltaic strings using parameter estimation of string circuit model Shigeomi Hara, Makoto Kasu (Saga Univ.) EE2018-39 |
We aim at detecting faults and recognizing those sorts for photovoltaic strings in mega solar power plants. We use measu... [more] | EE2018-39 pp.7-11 |
| MoNA | 2018-08-02 14:05 |
Hokkaido | Otaru Citizen Center | Extended GEDIR Routing with Detection of Node Failure Naoshi Yakura, Hiroaki Higaki (Tokyo Denki Univ.) MoNA2018-7 |
In data message transmissions in wireless ad-hoc networks, it is assumed that all wireless node correctly work in accord... [more] | MoNA2018-7 pp.7-12 |
| EMCJ | 2018-07-27 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-30 |
Intentional electromagnetic interference (IEMI) is a threat to destroy integrated circuits (ICs) or elements by using hi... [more] | EMCJ2018-30 pp.49-54 |
| HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] | 2018-07-26 15:25 |
Hokkaido | Sapporo Convention Center | A Study on Systematic Insertion of Hardware Trojan Based on Path Delay Akira Ito, Rei Ueno, Naofumi Homma, Takafumi Aoki (Tohoku Univ.) ISEC2018-44 SITE2018-36 HWS2018-41 ICSS2018-47 EMM2018-43 |
This paper presents a non-reversible and analytical method for inserting a path delay hardware Trojan (PDHT). The conven... [more] | ISEC2018-44 SITE2018-36 HWS2018-41 ICSS2018-47 EMM2018-43 pp.349-356 |
| HWS | 2018-04-13 15:25 |
Fukuoka | A Compact Countermeasure against Laser-Fault-Injection Attack Utilizing Bulk-Current Sensor and Instantaneous Supply-Shunt Circuit Kohei Matsuda (Kobe Univ.), Tatsuya Fujii, Shoji Natsu, Takeshi Sugawara, Kazuo Sakiyama (UCE), Yu-ichi Hayashi (NAIST), Makoto Nagata, Noriyuki Miura (Kobe Univ.) HWS2018-8 |
A compact sense-and-reacts countermeasure is proposed against laser fault injection attack on cryptographic processors. ... [more] | HWS2018-8 pp.41-44 |
|
| SS, MSS | 2018-01-18 15:45 |
Hiroshima | Study on Deployment of a Computer Algebra System for Generating Random Test Patterns for Combinational Circuits Tsutomu Inamoto, Yoshinobu Higami (Ehime Univ.) MSS2017-57 SS2017-44 |
In this study, the authors display an attempt of deploying a computer algebra system to improve the fault detection rate... [more] | MSS2017-57 SS2017-44 pp.59-64 |
|
| SS, MSS | 2018-01-19 12:45 |
Hiroshima | Classification of problem detection for incomplete software requirements using the development standard process Toma Miyamura (NAIST), Shinji Kawaguchi, Naoki Ishihama, Kazuki Kakimoto (JAXA), Hajimu Iida (NAIST), Masafumi Katahira (JAXA) MSS2017-66 SS2017-53 |
Software faults in spacecraft software leads to mission failures. To identify software faults, we focus on the incomplet... [more] | MSS2017-66 SS2017-53 pp.107-112 |
|
| SANE | 2017-10-04 13:50 |
Tokyo | Maison franco - japonaise (Tokyo) | Fault Detection in the Curah Lengkong at Mt Semeru, Indonesia
-- Topographic and Ground Penetrating Radar Evidences -- Christopher Gomez (Kobe Univ.), Franck Lavigne (Sorbonne Univ.), Danang Sri Hadmoko (Univ. Gadja Madah) SANE2017-44 |
The Semeru Volcano is a stratovolcano in East Java in Indonesia, that is well known for its regular phreatomagmatic eru... [more] |
SANE2017-44 pp.7-10 |
| EMCJ, IEE-EMC, IEE-MAG | 2017-05-18 14:43 |
Overseas | Nanyang Technological University | [Poster Presentation]
A Method of Fault Detection in Encryption Device Based on Leaked EM Information from Adder Circuit Naoto Saga (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-9 |
In this study, we observe leaked EM information radiated from an encryption device to estimate a timing of fault caused ... [more] | EMCJ2017-9 pp.5-6 |
| ASN, MoNA, MICT (Joint) |
2017-01-20 14:40 |
Oita | Defect Causal Analysis in Solar Panel using Thermal Image : A Deep Learning Approach Seungho Lee, Makoto Suzuki, Hiroyuki Morikawa (UTokyo) ASN2016-87 |
Deteriorated solar panels cause not only decreasing of power generation but also significantly safety concerns such as c... [more] | ASN2016-87 pp.95-100 |
|
| EMCJ | 2016-09-16 11:55 |
Hyogo | University of Hyogo | TDR with Utility-Pole-Distance Resolution Considering Mode Conversion for Detection of Fault Type in Power Distribution Lines Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.), Shinpei Oe, Tsuyoshi Sasaoka, Yasuharu Sakai (Kansai Electric Power Co. Inc.) EMCJ2016-52 |
It is necessary to detect a fault point in a distribution system for accident restoration in power grid. Applying a puls... [more] | EMCJ2016-52 pp.13-18 |
| OCS, NS, PN (Joint) |
2016-06-23 09:00 |
Hokkaido | Hokkaido University | Low Load Flow Quality Measurement for Data Center Network Tatsuya Fukuda, Yusuke Shinohara, Shinjiro Yagi (NEC) NS2016-29 |
It is important for data center operators to monitor their network and ensuring that the network work f... [more] | NS2016-29 pp.7-12 |
| DC | 2016-06-20 14:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Random Test Pattern Generation based on Entropy Toshiaki Ohmameuda (Nat. Inst. Tech., Gunma Coll.) DC2016-13 |
In this paper the random test pattern generation method based on entropy is proposed. The circuits in this paper are c... [more] |
DC2016-13 pp.19-23 |
| VLD, CAS, MSS, SIP | 2016-06-16 10:10 |
Aomori | Hirosaki Shiritsu Kanko-kan | Automatic Test Pattern Generation for Multiple Stuck-At Faults: When Testing for Single Faults is Insufficient Conrad JinYong Moore, Amir Masoud Gharehbaghi, Masahiro Fujita (Univ. of Tokyo) CAS2016-3 VLD2016-9 SIP2016-37 MSS2016-3 |
As fabricated circuitry gets larger and denser, modern industrial ATPG techniques which focus on the detection of single... [more] | CAS2016-3 VLD2016-9 SIP2016-37 MSS2016-3 pp.13-18 |
| ET | 2016-03-05 16:15 |
Kagawa | Kawaga Univ. (Saiwai-cho Campus) | A Proposal for a Misconfiguration Detection Method based on Program Analysis Techniques for Network Construction Exercises for Beginners Yuichiro Tateiwa, Naohisa (NIT) ET2015-106 |
In this study, we propose a method that specifies regions (we call them fault regions) where misconfigurations concernin... [more] | ET2015-106 pp.71-76 |
| VLD | 2016-02-29 15:50 |
Okinawa | Okinawa Seinen Kaikan | ILP Based Synthesis of Soft-Error Tolerant Datapaths Considering Adjacency Constraint between Components Junghoon Oh, Mineo Kaneko (JAIST) VLD2015-116 |
As the device size decreases, the reliability degradation due to soft-errors is becoming one of the serious issues in VL... [more] | VLD2015-116 pp.31-36 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 14:40 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | On discrimination method of a resistive open using delay variation induced by signal transitions on adjacent lines Kotaro Ise, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) VLD2015-42 DC2015-38 |
The effect of a resistive open results in small delay in an IC. It is difficult to test small delay since signal delay a... [more] | VLD2015-42 DC2015-38 pp.31-36 |
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