IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 29 of 29 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IE, ICD, VLD, IPSJ-SLDM [detail] 2013-10-07
10:30
Aomori   A Memory Based Filed Programmable Device for Energy saving MCUs
Tetsuya Matsumura (Nihon Univ.), Yoshifumi Kawamura (Renesas Electronics), Naoya Okada (Kanazawa Univ.), Kazutami Arimoto (Okayama Prefectual Univ.), Hiroshi Makino (OIT), Yoshio Matsuda (Kanazawa Univ.) VLD2013-46 ICD2013-70 IE2013-46
A Field Programmable Sequencer and memory (FPSM), which is an embedded memory based programmable peripherals for Micro C... [more] VLD2013-46 ICD2013-70 IE2013-46
pp.1-6
ICD, ITE-IST 2013-07-04
11:40
Hokkaido San Refre Hakodate [Invited Talk] Low Power Short Range Wireless Communication LSI and Interface -- The Development of Wireless Sensor Node with Bluetooth Smart --
Mitsuhiko Noda, Hajime Murakami (LAPIS SEMICONDUCTOR) ICD2013-28
The application possibility was confirmed by the wireless sensor node which had used Bluetooth Smart. The activity meter... [more] ICD2013-28
pp.25-30
ICD 2011-12-16
09:55
Osaka   A 65-nm Radiation-Hard Flip-Flop Tolerant to Multiple Cell Upsets
Ryosuke Yamamoto, Chikara Hamanaka (Kyoto Inst. of Tech.), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2011-129
MCUs in redundant FFs is a dominant factor in a current deep-submicron process. A layout structure to avoid MCUs is prop... [more] ICD2011-129
pp.131-136
VLD 2010-03-10
15:25
Okinawa   Generation Mechanism of SEU and MCU Caused by Parasitic Lateral Bipolar Transitstors
Chikara Hamanaka (Kyoto Institute of Tech.), Jun Furuta, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Institute of Tech.), Hidetoshi Onodera (Kyoto Univ./JST, CREST) VLD2009-103
Tolerance for soft-error decreases as integration advances. SEU(Single Event Upset), flipping one bit
and MCU(Multi-Cel... [more]
VLD2009-103
pp.25-30
IA, SITE 2009-03-05
13:40
Kumamoto   Design of HD Videoconference Systems for Remote Lectures at 18 National Universities
Takeshi Sakurada, Yoichi Hagiwara (Tokyo Univ. of A&T) SITE2008-59 IA2008-82
So far, many of Japanese universities have performed a remote lecture between universities using SCS (Space Collaboratio... [more] SITE2008-59 IA2008-82
pp.91-95
DC, CPSY 2008-04-23
15:00
Tokyo Tokyo Univ. Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
Eishi Ibe (PERL) CPSY2008-7 DC2008-7
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in
semicon... [more]
CPSY2008-7 DC2008-7
pp.37-42
ICD 2008-04-18
11:15
Tokyo   [Invited Talk] Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems -- Evolution of Multi-Node Upset Issues --
Eishi Ibe (PERL) ICD2008-10
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] ICD2008-10
pp.51-56
CQ, LOIS, IE, IEE-CMN, ITE-ME 2007-09-28
15:05
Tokushima The university of Tokushima A Study of video quality improvement for large scale video conference
Kazutoshi Nakano, Reiji Tanaka (OKI) CQ2007-66 OIS2007-56 IE2007-63
Today, companies and organization are using IP based video conference system at an increasing pace. But in case of multi... [more] CQ2007-66 OIS2007-56 IE2007-63
pp.165-170
EE 2006-11-10
15:00
Tokyo   **
Yoshimichi Nakamura (WINZ), Kazuo Kobayashi, Gousei Katou, Ken Hirata, Saeko Matsuura (Shiba Tech Univ.), Hideki Omori (Matsushita Electric), Junji Tabuchi (Mitsui&Co) EE2006-36
While development of a distributed power supply is activating, the opportunity of the energy control by "embedded softwa... [more] EE2006-36
pp.43-48
 Results 21 - 29 of 29 [Previous]  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan