Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IE, ICD, VLD, IPSJ-SLDM [detail] |
2013-10-07 10:30 |
Aomori |
|
A Memory Based Filed Programmable Device for Energy saving MCUs Tetsuya Matsumura (Nihon Univ.), Yoshifumi Kawamura (Renesas Electronics), Naoya Okada (Kanazawa Univ.), Kazutami Arimoto (Okayama Prefectual Univ.), Hiroshi Makino (OIT), Yoshio Matsuda (Kanazawa Univ.) VLD2013-46 ICD2013-70 IE2013-46 |
A Field Programmable Sequencer and memory (FPSM), which is an embedded memory based programmable peripherals for Micro C... [more] |
VLD2013-46 ICD2013-70 IE2013-46 pp.1-6 |
ICD, ITE-IST |
2013-07-04 11:40 |
Hokkaido |
San Refre Hakodate |
[Invited Talk]
Low Power Short Range Wireless Communication LSI and Interface
-- The Development of Wireless Sensor Node with Bluetooth Smart -- Mitsuhiko Noda, Hajime Murakami (LAPIS SEMICONDUCTOR) ICD2013-28 |
The application possibility was confirmed by the wireless sensor node which had used Bluetooth Smart. The activity meter... [more] |
ICD2013-28 pp.25-30 |
ICD |
2011-12-16 09:55 |
Osaka |
|
A 65-nm Radiation-Hard Flip-Flop Tolerant to Multiple Cell Upsets Ryosuke Yamamoto, Chikara Hamanaka (Kyoto Inst. of Tech.), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2011-129 |
MCUs in redundant FFs is a dominant factor in a current deep-submicron process. A layout structure to avoid MCUs is prop... [more] |
ICD2011-129 pp.131-136 |
VLD |
2010-03-10 15:25 |
Okinawa |
|
Generation Mechanism of SEU and MCU Caused by Parasitic Lateral Bipolar Transitstors Chikara Hamanaka (Kyoto Institute of Tech.), Jun Furuta, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Institute of Tech.), Hidetoshi Onodera (Kyoto Univ./JST, CREST) VLD2009-103 |
Tolerance for soft-error decreases as integration advances. SEU(Single Event Upset), flipping one bit
and MCU(Multi-Cel... [more] |
VLD2009-103 pp.25-30 |
IA, SITE |
2009-03-05 13:40 |
Kumamoto |
|
Design of HD Videoconference Systems for Remote Lectures at 18 National Universities Takeshi Sakurada, Yoichi Hagiwara (Tokyo Univ. of A&T) SITE2008-59 IA2008-82 |
So far, many of Japanese universities have performed a remote lecture between universities using SCS (Space Collaboratio... [more] |
SITE2008-59 IA2008-82 pp.91-95 |
DC, CPSY |
2008-04-23 15:00 |
Tokyo |
Tokyo Univ. |
Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems Eishi Ibe (PERL) CPSY2008-7 DC2008-7 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in
semicon... [more] |
CPSY2008-7 DC2008-7 pp.37-42 |
ICD |
2008-04-18 11:15 |
Tokyo |
|
[Invited Talk]
Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
-- Evolution of Multi-Node Upset Issues -- Eishi Ibe (PERL) ICD2008-10 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] |
ICD2008-10 pp.51-56 |
CQ, LOIS, IE, IEE-CMN, ITE-ME |
2007-09-28 15:05 |
Tokushima |
The university of Tokushima |
A Study of video quality improvement for large scale video conference Kazutoshi Nakano, Reiji Tanaka (OKI) CQ2007-66 OIS2007-56 IE2007-63 |
Today, companies and organization are using IP based video conference system at an increasing pace. But in case of multi... [more] |
CQ2007-66 OIS2007-56 IE2007-63 pp.165-170 |
EE |
2006-11-10 15:00 |
Tokyo |
|
** Yoshimichi Nakamura (WINZ), Kazuo Kobayashi, Gousei Katou, Ken Hirata, Saeko Matsuura (Shiba Tech Univ.), Hideki Omori (Matsushita Electric), Junji Tabuchi (Mitsui&Co) EE2006-36 |
While development of a distributed power supply is activating, the opportunity of the energy control by "embedded softwa... [more] |
EE2006-36 pp.43-48 |