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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2012-05-25 17:20 |
Shimane | A Note on Software Performability Evaluation with Systemability Koichi Tokuno, Shigeru Yamada (Tottori Univ.)  R2012-10 |
In this paper, we discuss the performability evaluation model for the software-based system, introducing the concept of ... [more] | R2012-10 pp.53-58 |
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| OFT | 2012-05-25 10:55 |
Gifu | Hida, Earth Wisdom Center | Field-Assembly Optical Fiber Connector with Coating Removal Parts
-- Novel Optical Fiber Coating Removal Technology -- Dai Sasaki, Tomomi Sano, Kenichiro Ohtsuka, Toshiaki Takahashi (SEI), Yoshikyo Tamekuni, Kazuhito Saito (SEOF), Masataka Shiraishi (SOC) OFT2012-14 |
Field-assembly optical fiber connector which does not need a coating removing and a fiber cleaning action before field a... [more] | OFT2012-14 pp.65-68 |
| EMD | 2011-03-04 15:30 |
Saitama | Nippon Institute of Technology | A study of optimum dimension of the interpole tip width for increase the output power to DC machine Shinya Endou, Kazunari Matsushita, Zhang Qingliang, Takahiro Ueno, Noboru Morita (Nippon Inst. of Tech.) EMD2010-163 |
DC machine has been used in steel industries and paper industries, Owing to their advantages for adjustable speed drive.... [more] | EMD2010-163 pp.45-48 |
| DC | 2011-02-14 13:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Test Pattern Generation for Highly Accurate Delay Testing Keigo Hori (NAIST), Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (NAIST/JST) DC2010-64 |
We propose a new faster-than-at-speed test method to detect small delay defects. As semiconductor technology is scaling ... [more] | DC2010-64 pp.33-38 |
| R | 2010-12-17 13:00 |
Tokyo | Integrated Model for Software Performability Measurement Considering Random Performance Degradation and Field-oriented Restoration Koichi Tokuno, Shigeru Yamada (Tottori Univ.) R2010-37 |
This paper constructs the integrated software performability model reflecting the actual field environment. The time-dep... [more] | R2010-37 pp.1-6 |
|
| ICD (Workshop) |
2010-08-16 - 2010-08-18 |
Overseas | Ho Chi Minh City University of Technology | [Invited Talk]
Circuit Failure Prediction by Field Test (DART) with Delay-Shift Measurement Mechanism Yasuo Sato, Seiji Kajihara (Kyusyu Institute of Technology), Michiko Inoue, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara (NAIST), Yukiya Miura (Tokyo Metropolitan Univ.) |
The main task of test had traditionally been screening of hard defects before shipping. However, current chips are takin... [more] | |
| EE, IEE-SPC | 2010-07-30 11:05 |
Kochi | Kochi National College of Technology | A study of collecting the power quality data in Japan Tetsushi Tsumura, Keiichi Hirose, Mikio Yamasaki (NTT Facilities) EE2010-11 |
Recently, our highly networked information society has progressed. Therefore, no failures and uninterrupted power are ne... [more] | EE2010-11 pp.33-38 |
| EMCJ, MW, IEE-MAG | 2009-10-22 14:20 |
Iwate | Iwate Univ. | Development of the Calibration System for Magnetic Field Probes in the Intermediate Frequency Band Takashi Matsuura (Tokyo Metroporitan Univ.), Katsumi Fujii (NICT), Yukihisa Suzuki, Masao Taki (Tokyo Metroporitan Univ.), Yukio Yamanaka (NICT) EMCJ2009-48 MW2009-97 |
Calibration systems for magnetic probes used for measurements of time varying magnetic field in the intermidiate freque... [more] |
EMCJ2009-48 MW2009-97 pp.25-30 |
| MoNA, ITE-CE, ITE-BCT | 2009-09-25 15:15 |
Okinawa | Tenbusu-Naha | Experimental production of field networks by SunSpot Katsuhiro Naito (Mie Univ.), Masaki Ehara (Tokyo Univ. of Tech.), Kazuo Mori, Hideo Kobayashi (Mie Univ.) MoMuC2009-38 |
An Environmental observation system is a candidate application of sensor networks. In order to achieve the environment... [more] |
MoMuC2009-38 pp.73-78 |
| SDM, ED | 2008-07-11 11:20 |
Hokkaido | Kaderu２・７ | The Analysis of the Floating Field Limiting Ring and Field Plate Chien-Nan Liao (National Central Univ.), Jhih-Chao Huang, Feng-Tso Chien, Ching-Hwa Cheng (Feng Chia Univ.), Yao-Tsung Tsai (National Central Univ.) ED2008-75 SDM2008-94 |
Potential and strength of surface electric field distribution have strongly influence on breakdown voltage and reliabili... [more] | ED2008-75 SDM2008-94 pp.187-191 |
| EMD | 2008-03-07 15:05 |
Tokyo | A Measurement of Current Noise of Short-Time Arc with External DC Mgnetic Field Hikaru Miura, Yoshiki Kayano, Kazuaki Miyanaga, Hiroshi Inoue (Akita Univ.) EMD2007-131 |
Since an arc discharge generated by breaking electrical contact is considered as a main source of an undesired electroma... [more] | EMD2007-131 pp.29-32 |
|
| ED | 2005-12-22 13:35 |
Tokyo | Characterization of field emission cathode with S-K chart Yasuhito Gotoh, Hiroshi Tsuji, Junzo Ishikawa (Kyoto Univ.) |
We have examined the reliability of the equi-potential lines and equi-work function lines given in the previous paper.... [more] |
ED2005-184 pp.11-14 |
|
| R, ED, SDM | 2005-11-25 15:05 |
Osaka | Central Electric Club | -- Yoichi Nogami, Takayuki Hisaka, Naohito Yoshida (Mitsubishi) |
We have studied the degradation mechanisms of AlGaAs/InGaAs pseudomorphic HEMTs (PHEMTs) under high humidity conditions.... [more] | R2005-44 ED2005-179 SDM2005-198 pp.37-41 |
| RECONF | 2005-05-13 17:45 |
Kyoto | Kyoto University | Reconfigurable sensor network based on mutual communications with reliability index Takeshi Fujiwara, Kensuke Komatsu, Hiroyuki Takahashi, Masaharu Nakazawa (Tokyo Univ.) |
In the environment such as outer space where we cannot maintain the artifacts, it is the robustness that is important fo... [more] | RECONF2005-29 pp.85-89 |
| RCS, CS | 2005-01-26 16:40 |
Okinawa | University of the Ryukyus | Performance Evaluation of a Field Experimental Network for Next Generation Broadband Fixed Wireless Access Systems Shinobu Nanba, Takeshi Kitahara, Satoshi Konishi, Shinichi Nomoto (KDDI R&D Labs.) |
Broadband fixed wireless access (BFWA) systems with mesh topology are considered a promising approach to realize high ca... [more] | CS2004-138 RCS2004-245 pp.55-60 |
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