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Technical Committee on Computer Systems (CPSY)  (Searched in: 2014)

Search Results: Keywords 'from:2014-12-01 to:2014-12-01'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 21 - 38 of 38 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Reliability Evaluation of NAND Flash Memory
Atsuro Kobayashi, Shogo Hachiya, Masafumi Doi, Tsukasa Tokutomi, Ken Takeuchi (Chuo Univ) ICD2014-92 CPSY2014-104
 [more] ICD2014-92 CPSY2014-104
p.63
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] A Low-voltage Operation Programing-voltage Generator for ReRAM
Masahiro Tanaka, Tomoya Ishii, Shogo Hachiya, Ken Takeuchi (Chuo univ.) ICD2014-93 CPSY2014-105
Although the conventional Solid State Drive (SSD) consist of only NAND flash memory, Resistive RAM (ReRAM) and NAND flas... [more] ICD2014-93 CPSY2014-105
p.65
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Analysis of linear model with external interference noise in oscillators.
Koichiro Hida, Shinji Shimizu, Shuei Morishita, Takao Kihara, Tsutomu Yoshimura (OIT) ICD2014-94 CPSY2014-106
The influence of the external interference noise on oscillators is analyzed employing the concept of injection-locked ph... [more] ICD2014-94 CPSY2014-106
pp.67-72
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Application of Stochastic A/D Conversion to SAR-ADC
Yusaku Hirai, Tomohiro Asano, Sadahiro Tani, Toshifumi Kurata, Keiji Tatsumi (Osaka Univ.), Takatsugu Kamata (SPChange), Toshimasa Matsuoka (Osaka Univ.) ICD2014-95 CPSY2014-107
In this study, a digitally controlled variable threshold comparator is studied using stochastic A/D conversion that util... [more] ICD2014-95 CPSY2014-107
pp.73-78
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Investigation of Frequency Characteristic of High Linearity Gm-Cell with Level Shifter
Tohru Kaneko, Shinya Yokomizo, Masaya Miyahara, Akira Matsuzawa (Tokyo Tech.) ICD2014-96 CPSY2014-108
High speed Gm-C filter requires high speed and high linearity Gm-cell like a flipped voltage follower; however it has po... [more] ICD2014-96 CPSY2014-108
pp.79-84
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] I/Q Calibration for Millimeter-wave Tranceivers Using Detector
Shotaro Maki, Seitaro Kawai, Yuki Seo, Shinji Sato, Satoshi Kondo, Kenichi Okada, Akira Matsuzawa (Tokyo Tech) ICD2014-97 CPSY2014-109
Currently, wireless communication using 60 GHz is actively researched. In 60 GHz, communication faster than 40 Gbps can ... [more] ICD2014-97 CPSY2014-109
p.85
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Injection-Locked-Oscillator-Based Phase Shifter with High Phase Resolution
Keigo Yonemoto, Kyoya Takano, Kosuke Katayama, Shuhei Amakawa, Takeshi Yoshida, Minoru Fujishima (Hiroshima Univ.) ICD2014-98 CPSY2014-110
 [more] ICD2014-98 CPSY2014-110
pp.87-91
ICD, CPSY 2014-12-01
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Study of 300 GHz CMOS wireless transceiver system
Hiroshi Adachi, Kosuke Katayama, Kyoya Takano, Shuhei Amakawa, Takeshi Yoshida, Minoru Fujishima (Hiroshima Univ.) ICD2014-99 CPSY2014-111
 [more] ICD2014-99 CPSY2014-111
p.93
ICD, CPSY 2014-12-02
09:20
Tokyo Kikai-Shinko-Kaikan Bldg. A Current-Mode Successive Approximation Analog-to-Digital Converter in 0.18um CMOS Technology
Takumu Yomogita, Cong-Kha Pham (UEC) ICD2014-100 CPSY2014-112
An 8-bit current-mode Successive Approximation (SAR) Analog-to-Digital Converter (ADC) has been proposed.
This proposed... [more]
ICD2014-100 CPSY2014-112
pp.95-99
ICD, CPSY 2014-12-02
09:45
Tokyo Kikai-Shinko-Kaikan Bldg. Class AB CMOS Rail-to-Rail Op Amp with reduced crossover distortion
Mamoru Ohsawa, Cong-Kha Pham (UEC) ICD2014-101 CPSY2014-113
This paper introduces the opamp that has Rail-to-Rail Input and Output in low voltage and low power.Proposed circuit has... [more] ICD2014-101 CPSY2014-113
pp.101-105
ICD, CPSY 2014-12-02
10:20
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Normally-Off Computing with Perpendicular STT-MRAM
Hiroki Noguchi, Kazutaka Ikegami, Naoharu Shimomura, Tetsufumi Tanamoto, Junichi Ito, Shinobu Fujita (Toshiba) ICD2014-102 CPSY2014-114
 [more] ICD2014-102 CPSY2014-114
pp.107-112
ICD, CPSY 2014-12-02
11:10
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] The Evolution of CMOS Image Sensors
Yusuke Oike (Sony) ICD2014-103 CPSY2014-115
This presentation introduces the evolution of CISs and their applications utilizing image quality, 3D integration, and w... [more] ICD2014-103 CPSY2014-115
p.113
ICD, CPSY 2014-12-02
13:00
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Superliner or Cruiser -- For the Integrative and Disruptive Innovation --
Tetsuya Iizuka (THINE) ICD2014-104 CPSY2014-116
At the very begging time of the so-called Japan’s lost two decades plus, the author launched his own small business, a f... [more] ICD2014-104 CPSY2014-116
pp.115-120
ICD, CPSY 2014-12-02
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] What Should IT/Semiconductor Engineer Learn to Survive in the Harsh Global Competition?
Ken Takeuchi (Chuo Univ.) ICD2014-105 CPSY2014-117
 [more] ICD2014-105 CPSY2014-117
p.121
ICD, CPSY 2014-12-02
14:50
Tokyo Kikai-Shinko-Kaikan Bldg. Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process
Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.) ICD2014-106 CPSY2014-118
Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] ICD2014-106 CPSY2014-118
pp.123-128
ICD, CPSY 2014-12-02
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. Implementation and Evaluation of Multi-Output Organic TFT Temperature Sensor
Kosuke Takeuchi, Takayuki Sagae, Tomochika Harada (Yamagata Univ.) ICD2014-107 CPSY2014-119
Presently, sensors are used to all electronic equipment. Monitoring environmental information, such as temperature, ligh... [more] ICD2014-107 CPSY2014-119
pp.129-134
ICD, CPSY 2014-12-02
15:40
Tokyo Kikai-Shinko-Kaikan Bldg. Uniqueness Evaluation of a Current Mismatch type ID Generation Circuit
Kenichi Matsunaga, Shoichi Oshima (NTT), Tadashi Minotani (NTT TELECON), Toshihiko Kondo, Hiroki Morimura (NTT) ICD2014-108 CPSY2014-120
This paper presents a low-power and uniquely-distributed ID-generation circuit using process variation. Developed circui... [more] ICD2014-108 CPSY2014-120
pp.135-139
ICD, CPSY 2014-12-02
16:05
Tokyo Kikai-Shinko-Kaikan Bldg. An accelerating method of NBTI degradation transition analysis based on logic simulation
Kazunori Mori, Toru Nakura, Tetsuya Iizuka, Kunihiro Asada (UTokyo) ICD2014-109 CPSY2014-121
Negative Bias Temperature Instability (NBTI) degradation is one of the important problems in nano-scale transistors.In t... [more] ICD2014-109 CPSY2014-121
pp.141-145
 Results 21 - 38 of 38 [Previous]  /   
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