Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
Reliability Evaluation of NAND Flash Memory Atsuro Kobayashi, Shogo Hachiya, Masafumi Doi, Tsukasa Tokutomi, Ken Takeuchi (Chuo Univ) ICD2014-92 CPSY2014-104 |
[more] |
ICD2014-92 CPSY2014-104 p.63 |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
A Low-voltage Operation Programing-voltage Generator for ReRAM Masahiro Tanaka, Tomoya Ishii, Shogo Hachiya, Ken Takeuchi (Chuo univ.) ICD2014-93 CPSY2014-105 |
Although the conventional Solid State Drive (SSD) consist of only NAND flash memory, Resistive RAM (ReRAM) and NAND flas... [more] |
ICD2014-93 CPSY2014-105 p.65 |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
Analysis of linear model with external interference noise in oscillators. Koichiro Hida, Shinji Shimizu, Shuei Morishita, Takao Kihara, Tsutomu Yoshimura (OIT) ICD2014-94 CPSY2014-106 |
The influence of the external interference noise on oscillators is analyzed employing the concept of injection-locked ph... [more] |
ICD2014-94 CPSY2014-106 pp.67-72 |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
Application of Stochastic A/D Conversion to SAR-ADC Yusaku Hirai, Tomohiro Asano, Sadahiro Tani, Toshifumi Kurata, Keiji Tatsumi (Osaka Univ.), Takatsugu Kamata (SPChange), Toshimasa Matsuoka (Osaka Univ.) ICD2014-95 CPSY2014-107 |
In this study, a digitally controlled variable threshold comparator is studied using stochastic A/D conversion that util... [more] |
ICD2014-95 CPSY2014-107 pp.73-78 |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
Investigation of Frequency Characteristic of High Linearity Gm-Cell with Level Shifter Tohru Kaneko, Shinya Yokomizo, Masaya Miyahara, Akira Matsuzawa (Tokyo Tech.) ICD2014-96 CPSY2014-108 |
High speed Gm-C filter requires high speed and high linearity Gm-cell like a flipped voltage follower; however it has po... [more] |
ICD2014-96 CPSY2014-108 pp.79-84 |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
I/Q Calibration for Millimeter-wave Tranceivers Using Detector Shotaro Maki, Seitaro Kawai, Yuki Seo, Shinji Sato, Satoshi Kondo, Kenichi Okada, Akira Matsuzawa (Tokyo Tech) ICD2014-97 CPSY2014-109 |
Currently, wireless communication using 60 GHz is actively researched. In 60 GHz, communication faster than 40 Gbps can ... [more] |
ICD2014-97 CPSY2014-109 p.85 |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
Injection-Locked-Oscillator-Based Phase Shifter with High Phase Resolution Keigo Yonemoto, Kyoya Takano, Kosuke Katayama, Shuhei Amakawa, Takeshi Yoshida, Minoru Fujishima (Hiroshima Univ.) ICD2014-98 CPSY2014-110 |
[more] |
ICD2014-98 CPSY2014-110 pp.87-91 |
ICD, CPSY |
2014-12-01 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Poster Presentation]
Study of 300 GHz CMOS wireless transceiver system Hiroshi Adachi, Kosuke Katayama, Kyoya Takano, Shuhei Amakawa, Takeshi Yoshida, Minoru Fujishima (Hiroshima Univ.) ICD2014-99 CPSY2014-111 |
[more] |
ICD2014-99 CPSY2014-111 p.93 |
ICD, CPSY |
2014-12-02 09:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Current-Mode Successive Approximation Analog-to-Digital Converter in 0.18um CMOS Technology Takumu Yomogita, Cong-Kha Pham (UEC) ICD2014-100 CPSY2014-112 |
An 8-bit current-mode Successive Approximation (SAR) Analog-to-Digital Converter (ADC) has been proposed.
This proposed... [more] |
ICD2014-100 CPSY2014-112 pp.95-99 |
ICD, CPSY |
2014-12-02 09:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Class AB CMOS Rail-to-Rail Op Amp with reduced crossover distortion Mamoru Ohsawa, Cong-Kha Pham (UEC) ICD2014-101 CPSY2014-113 |
This paper introduces the opamp that has Rail-to-Rail Input and Output in low voltage and low power.Proposed circuit has... [more] |
ICD2014-101 CPSY2014-113 pp.101-105 |
ICD, CPSY |
2014-12-02 10:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Normally-Off Computing with Perpendicular STT-MRAM Hiroki Noguchi, Kazutaka Ikegami, Naoharu Shimomura, Tetsufumi Tanamoto, Junichi Ito, Shinobu Fujita (Toshiba) ICD2014-102 CPSY2014-114 |
[more] |
ICD2014-102 CPSY2014-114 pp.107-112 |
ICD, CPSY |
2014-12-02 11:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
The Evolution of CMOS Image Sensors Yusuke Oike (Sony) ICD2014-103 CPSY2014-115 |
This presentation introduces the evolution of CISs and their applications utilizing image quality, 3D integration, and w... [more] |
ICD2014-103 CPSY2014-115 p.113 |
ICD, CPSY |
2014-12-02 13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Superliner or Cruiser
-- For the Integrative and Disruptive Innovation -- Tetsuya Iizuka (THINE) ICD2014-104 CPSY2014-116 |
At the very begging time of the so-called Japan’s lost two decades plus, the author launched his own small business, a f... [more] |
ICD2014-104 CPSY2014-116 pp.115-120 |
ICD, CPSY |
2014-12-02 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
What Should IT/Semiconductor Engineer Learn to Survive in the Harsh Global Competition? Ken Takeuchi (Chuo Univ.) ICD2014-105 CPSY2014-117 |
[more] |
ICD2014-105 CPSY2014-117 p.121 |
ICD, CPSY |
2014-12-02 14:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.) ICD2014-106 CPSY2014-118 |
Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] |
ICD2014-106 CPSY2014-118 pp.123-128 |
ICD, CPSY |
2014-12-02 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Implementation and Evaluation of Multi-Output Organic TFT Temperature Sensor Kosuke Takeuchi, Takayuki Sagae, Tomochika Harada (Yamagata Univ.) ICD2014-107 CPSY2014-119 |
Presently, sensors are used to all electronic equipment. Monitoring environmental information, such as temperature, ligh... [more] |
ICD2014-107 CPSY2014-119 pp.129-134 |
ICD, CPSY |
2014-12-02 15:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Uniqueness Evaluation of a Current Mismatch type ID Generation Circuit Kenichi Matsunaga, Shoichi Oshima (NTT), Tadashi Minotani (NTT TELECON), Toshihiko Kondo, Hiroki Morimura (NTT) ICD2014-108 CPSY2014-120 |
This paper presents a low-power and uniquely-distributed ID-generation circuit using process variation. Developed circui... [more] |
ICD2014-108 CPSY2014-120 pp.135-139 |
ICD, CPSY |
2014-12-02 16:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An accelerating method of NBTI degradation transition analysis based on logic simulation Kazunori Mori, Toru Nakura, Tetsuya Iizuka, Kunihiro Asada (UTokyo) ICD2014-109 CPSY2014-121 |
Negative Bias Temperature Instability (NBTI) degradation is one of the important problems in nano-scale transistors.In t... [more] |
ICD2014-109 CPSY2014-121 pp.141-145 |