|
|
Technical Committee on Superconductive Electronics (SCE) (Searched in: 2011)
|
|
Search Results: Keywords 'from:2011-10-12 to:2011-10-12'
|
[Go to Official SCE Homepage (Japanese)] |
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SCE |
2011-10-12 13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Origin of dark count in superconducting nanowire single-photon detectors Taro Yamashita, Shigehito Miki, Kazumasa Makise, Wei Qiu, Hirotaka Terai, Mikio Fujiwara, Masahide Sasaki, Zhen Wang (NICT) SCE2011-12 |
We investigated a physical mechanism of the dark count in superconducting nanowire single-photon detectors. The direct-c... [more] |
SCE2011-12 pp.1-6 |
SCE |
2011-10-12 13:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Capacitance measurements of sub-micron Al junctions using SQUID resonance Kento Kikuchi, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki (UEC Tokyo) SCE2011-13 |
It is necessary to extract the capacitances, resistances and inductances experimentally for fabrication sub-micron Al ju... [more] |
SCE2011-13 pp.7-12 |
SCE |
2011-10-12 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Response of SQUID inductance to magnetic nanoparticle films Shun Yano, Takayuki Okumura, Hiroyuki Akaike, Akira Fujimaki (Nagoya Univ.) SCE2011-14 |
We present the response of SQUID inductance to magnetic nanoparticle films. We have been studying the use of magnetic ma... [more] |
SCE2011-14 pp.13-17 |
SCE |
2011-10-12 14:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Improvement in electrical characteristics of NbN tunnel junctions with plasma-nitrided AlNx barriers Tatsunori Funai, Naoto Naito, Hiroyuki Akaike, Akira Fujimaki (Nagoya Univ.) SCE2011-15 |
We present the fabrication process of NbN tunnel junctions with plasma-nitrided AlNx barriers and the electrical charact... [more] |
SCE2011-15 pp.19-24 |
SCE |
2011-10-12 14:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Development of AC programmable Josephson voltage standard Michitaka Maruyama, Chiharu Urano, Takahiro Yamada, Hirotake Yamamori, Nobu-hisa Kaneko (AIST) SCE2011-16 |
Josephson voltage standard (JVS) systems are widely used for the calibration of DC voltage in National Metrology Institu... [more] |
SCE2011-16 pp.25-30 |
SCE |
2011-10-12 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Examination of Cryogenic CMOS Amplifiers for Josephson-CMOS Hybrid Memories Hyunjoo Jin, Keita Kuwabara, Yuki Yamanashi, Nobuyuki Yoshikawa (Yokohama National Univ.) SCE2011-17 |
[more] |
SCE2011-17 pp.31-36 |
SCE |
2011-10-12 15:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Development of Nb multi-layer Advanced Fabrication Process for Large-scale SFQ Circuits Shuichi Nagasawa, Kenji Hinode, Tetsuro Satoh, Mutsuo Hidaka (ISTEC-SRL), Akira Fujimaki, Hiroyuki Akaike (Nagoya Uni.), Nobuyuki Yoshikawa (Yohohama National Uni.), Kazuyoshi Takagi, Naofumi Takagi (Kyoto Uni.) SCE2011-18 |
We have been developing a Nb multi-layer fabrication process for large-scale SFQ circuits. We have been evaluating both ... [more] |
SCE2011-18 pp.37-42 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|