| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
Technical Committee on Integrated Circuits and Devices (ICD) (Searched in: 2015)
Search Results: Keywords 'from:2015-12-17 to:2015-12-17'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD, CPSY | 2015-12-17 16:00 |
Kyoto | Kyoto Institute of Technology | [Poster Presentation]
60GHz Millimeter-wave Transceiver with Automatic Image Calibration Shotaro Maki, Yuki Seo, Kenichi Okada, Akira Matsuzawa (Tokyo Tech)  ICD2015-82 CPSY2015-95 |
Several Gbps wireless communication could be realized with 9 GHz unlicensed bandwidth in 60 GHz. However large area FFT ... [more] | ICD2015-82 CPSY2015-95 p.67 |
| ICD, CPSY | 2015-12-17 16:00 |
Kyoto | Kyoto Institute of Technology | [Poster Presentation]
RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (KU) |
[more] | |
| ICD, CPSY | 2015-12-18 09:00 |
Kyoto | Kyoto Institute of Technology | Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes. Eiji Sonezaki, Kubota Kanto, Masaki Masuda, Shohei Kanda, Jun Furuta, Kazutoshi Kobayashi (KIT) ICD2015-83 CPSY2015-96 |
According to process down scaling, LSI becomes less reliable for soft errors. To increase the tolerance of FFs for soft ... [more] | ICD2015-83 CPSY2015-96 pp.69-74 |
| ICD, CPSY | 2015-12-18 09:25 |
Kyoto | Kyoto Institute of Technology | Substrate Noise Isolation Improvement by Helium-3 Ion Irradiation Technique in a Triple-well CMOS Process Ning Li (Tokyo Tech), Takeshi Inoue (S.H.I.Examination & Inspection), Takuichi Hirano, Jian Pang, Rui Wu, Kenichi Okada (Tokyo Tech), Hitoshi Sakane (S.H.I.Examination & Inspection), Akira Matsuzawa (Tokyo Tech) ICD2015-84 CPSY2015-97 |
[more] | ICD2015-84 CPSY2015-97 pp.75-80 |
| ICD, CPSY | 2015-12-18 10:00 |
Kyoto | Kyoto Institute of Technology | [Invited Talk]
A Story of a Startup Semiconductor Company, From Creation to Evacuation
-- What to learn in your university life -- Kazuo Taki (Kobe Univ.) ICD2015-85 CPSY2015-98 |
This article shows 10-year experiences on a startup semiconductor design company, originally started from university res... [more] | ICD2015-85 CPSY2015-98 pp.81-82 |
| ICD, CPSY | 2015-12-18 10:50 |
Kyoto | Kyoto Institute of Technology | [Invited Talk]
GaN Power Switching Devices and its Integrated Circuits Shuichi Nagai (Panasonic) ICD2015-86 CPSY2015-99 |
A GaN power semiconductor device attacks great attention due to its high-speed and low loss operation under high tempera... [more] | ICD2015-86 CPSY2015-99 pp.83-85 |
| ICD, CPSY | 2015-12-18 12:40 |
Kyoto | Kyoto Institute of Technology | [Invited Talk]
Evaluation of Radiation-induced Soft Errors on LSI Jun Furuta (KIT) ICD2015-87 CPSY2015-100 |
[more] | ICD2015-87 CPSY2015-100 pp.87-92 |
| ICD, CPSY | 2015-12-18 13:30 |
Kyoto | Kyoto Institute of Technology | Power optimization based on a simple power model for a micro-controller Hayate Okuhara, Yu Fujita, Kuniaki Kitamori (Keio Univ.), Kimiyoshi Usami (Shibaura Institute of Tech.), Hideharu Amano (Keio Univ.) ICD2015-88 CPSY2015-101 |
[more] | ICD2015-88 CPSY2015-101 pp.93-98 |
| ICD, CPSY | 2015-12-18 13:55 |
Kyoto | Kyoto Institute of Technology | Ultra Low Power Reconfigurable Accelerator CCSOTB Koichiro Masuyama, Yu Fujita, Hayate Okuhara, Hideharu Amano (Keio Univ.) ICD2015-89 CPSY2015-102 |
[more] | ICD2015-89 CPSY2015-102 pp.99-103 |
| ICD, CPSY | 2015-12-18 14:30 |
Kyoto | Kyoto Institute of Technology | A Low Latency Distributed Routing Method for Random Topologies in HPC Networks Ryuta Kawano, Hiroshi Nakahara (Keio Univ.), Ikki Fujiwara (NII), Hiroki Matsutani, Hideharu Amano (Keio Univ.), Michihiro Koibuchi (NII) ICD2015-90 CPSY2015-103 |
End-to-end network latency has become an important issue for parallel application on large-scale High Performance Comput... [more] | ICD2015-90 CPSY2015-103 pp.105-110 |
| ICD, CPSY | 2015-12-18 14:55 |
Kyoto | Kyoto Institute of Technology | Topology Optimization of 3D-Stacked Chips under Maxiumum Wire Length Constraint Hiroshi Nakahara, Daichi Fujiki, Seiichi Tade, Ryota Yasudo, Ryuta Kawano, Hiroki Matsutani (Keio Univ.), Michihiro Koibuchi (NII), Koji Nakano (Hiroshima Univ.), Hideharu Amano (Keio Univ.) ICD2015-91 CPSY2015-104 |
(To be available after the conference date) [more] | ICD2015-91 CPSY2015-104 pp.111-116 |
| ICD, CPSY | 2015-12-18 15:20 |
Kyoto | Kyoto Institute of Technology | A FPGA/GPU cooperation in Gravitational Calculation using PEACH2 Chiharu Tsuruta, Takahiro Kaneda (Keio Univ.), Yohei Miki (Univ. of Tsukuba), Hideharu Amano (Keio Univ.) ICD2015-92 CPSY2015-105 |
PEACH2 (PCI Express Adaptive Communication Hub ver2) has been developed for low latency direct communication between a... [more] |
ICD2015-92 CPSY2015-105 pp.117-122 |
| ICD, CPSY | 2015-12-18 15:55 |
Kyoto | Kyoto Institute of Technology | Performance Analysis of Analog to Digital Converter Based on Stochastic Comparator Md. Maruf Hossain, Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Tokyo University) ICD2015-93 CPSY2015-106 |
A performance model for Analog to Digital Converter (ADC) based on stochastic comparator has been proposed by analyzing ... [more] | ICD2015-93 CPSY2015-106 pp.123-128 |
| ICD, CPSY | 2015-12-18 16:20 |
Kyoto | Kyoto Institute of Technology | A Time-Mode Analog Signal Accumulator Using a Single Buffer Ring without Output Drift Calibration Tomohiko Yano, Toru Nakura, Testuya Iizuka, Kunihiro Asada (Univ. of Tokyo) ICD2015-94 CPSY2015-107 |
This paper presents a time-mode analog signal accumulator whose input and output are both represented by the time differ... [more] | ICD2015-94 CPSY2015-107 pp.129-134 |
| ICD, CPSY | 2015-12-18 16:45 |
Kyoto | Kyoto Institute of Technology | Autonomously Tracking PVT Variations of Pulse Width Controlled PLL using Hill-Climbing Method Toi Takashi, Toru Nakura, Tetsuya Iizuka, Kunihiro Asada (Tokyo Univ.) ICD2015-95 CPSY2015-108 |
[more] | ICD2015-95 CPSY2015-108 pp.135-140 |
[Return to Top Page]