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Technical Committee on Electromechanical Devices (EMD)  (Searched in: 2009)

Search Results: Keywords 'from:2009-05-22 to:2009-05-22'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 13 of 13  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD, EMCJ 2009-05-22
09:35
Tokyo Kanda camupus, Nippon Institute of Technology An experimental study on influence of surrounding atmosphere to gaseous phase transition in contacts break arc
Kiyoshi Yoshida, Naomichi Yamada (Nippon Inst. of Tech.) EMCJ2009-9 EMD2009-1
Arc duration time and the influence of a surrounding gas on the gaseous phase transition were experimentally researched ... [more] EMCJ2009-9 EMD2009-1
pp.1-6
EMD, EMCJ 2009-05-22
10:00
Tokyo Kanda camupus, Nippon Institute of Technology Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (V) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (Keio Univ.) EMCJ2009-10 EMD2009-2
Authors developed the mechanism which gave real vibration to electrical contacts by hammering oscillation in the vertica... [more] EMCJ2009-10 EMD2009-2
pp.7-13
EMD, EMCJ 2009-05-22
10:25
Tokyo Kanda camupus, Nippon Institute of Technology Arc Energy and Electrode Loss of AgNi Contacts for Electromagnetic Contactors
Koichiro Sawa (Keio Univ.), Kenji Suzuki, Masaaki Watanabe (Fuji Electric FA Components & Systems Co.,Ltd.,) EMCJ2009-11 EMD2009-3
The authors have been examining an evaluation method of the electrode loss of AgNi contact for electromagnetic contactor... [more] EMCJ2009-11 EMD2009-3
pp.15-20
EMD, EMCJ 2009-05-22
11:05
Tokyo Kanda camupus, Nippon Institute of Technology Characteristics of break arc in a DC20-500V/5-30A circuit
Tomohiro Atsumi, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.) EMCJ2009-12 EMD2009-4
 [more] EMCJ2009-12 EMD2009-4
pp.21-26
EMD, EMCJ 2009-05-22
11:30
Tokyo Kanda camupus, Nippon Institute of Technology Melting bridge formation processwhich differs in the material
Masami Mori (Nippon Inst. of Tech.) EMCJ2009-13 EMD2009-5
 [more] EMCJ2009-13 EMD2009-5
pp.27-32
EMD, EMCJ 2009-05-22
13:00
Tokyo Kanda camupus, Nippon Institute of Technology Non-contact Measurement of Passive Intermodulation in Electrical Contacts
Nobuhiro Kuga (Yokohama Nat'l Univ.) EMCJ2009-14 EMD2009-6
 [more] EMCJ2009-14 EMD2009-6
p.33
EMD, EMCJ 2009-05-22
13:25
Tokyo Kanda camupus, Nippon Institute of Technology A study on characteristics extraction of contact voltage waveform at slowly breaking silver contact
Shingo Hanawa, Yoshiki Kayano, Kazuaki Miyanaga, Hiroshi Inoue (Akita Univ.) EMCJ2009-15 EMD2009-7
When the electrical contact is driven to break, the bridge makes the arc discharge. It has been found that there are two... [more] EMCJ2009-15 EMD2009-7
pp.35-40
EMD, EMCJ 2009-05-22
13:50
Tokyo Kanda camupus, Nippon Institute of Technology Measurement and simulation of electrostatic discharge waveform when ESD is given to PCB ground
Mikiya Iida (Toshiba) EMCJ2009-16 EMD2009-8
The electrical discharge wave form when ESD was given to GND of the microstripline was measured by a current probe, and ... [more] EMCJ2009-16 EMD2009-8
pp.41-44
EMD, EMCJ 2009-05-22
14:15
Tokyo Kanda camupus, Nippon Institute of Technology Relation Between Radiated Electromagnetic Field Intensity and Electrode Condition due to Micro Gap Discharge
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-17 EMD2009-9
he relationship between breakdown field strength and radiated electromagnetic field intensity was examined in experiment... [more] EMCJ2009-17 EMD2009-9
pp.45-48
EMD, EMCJ 2009-05-22
15:00
Tokyo Kanda camupus, Nippon Institute of Technology Electric field strength from an electromagnetic field immunity test system applying array antenna technology
Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu, Yoshihiko Konishi (Mitsubishi Electric Corp.) EMCJ2009-18 EMD2009-10
The electromagnetic field immunity test system (such as MIL-STD-461 [1], SAE J1113-21 [2]) defines not only exposing an ... [more] EMCJ2009-18 EMD2009-10
pp.49-53
EMD, EMCJ 2009-05-22
15:25
Tokyo Kanda camupus, Nippon Institute of Technology Voltage Distribution Measurement of Power Plane by Decoupling Capacitor on PCBs
Yuichi Sasaki, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (MITSUBISHI ELECTRIC) EMCJ2009-19 EMD2009-11
 [more] EMCJ2009-19 EMD2009-11
pp.55-59
EMD, EMCJ 2009-05-22
15:50
Tokyo Kanda camupus, Nippon Institute of Technology Equivalent Circuit Expressions for EMI Problems in PLC
Yoshio Kami (Univ. of Electro-Comm.), Akira Sugiura (NICT) EMCJ2009-20 EMD2009-12
Power line communication (PLC) is a system using a main-line network without newly constructing any transmission line sy... [more] EMCJ2009-20 EMD2009-12
pp.61-66
EMD, EMCJ 2009-05-22
16:15
Tokyo Kanda camupus, Nippon Institute of Technology Antenna Calibration by 3-Antenna Method with the In-Phase Synthetic Method
Katsumi Fujii, Yukio Yamanaka (NICT), Akira Sugiura (Telecom Engineering Center) EMCJ2009-21 EMD2009-13
In antenna calibration, reflected waves from surrounding objects seriously deteriorate the accuracy of the results. To r... [more] EMCJ2009-21 EMD2009-13
pp.67-72
 Results 1 - 13 of 13  /   
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