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Technical Committee on Reliability (R)  (Searched in: 2011)

Search Results: Keywords 'from:2011-06-17 to:2011-06-17'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2011-06-17
13:30
Tokyo   Exact distributions of the median absolute deviation and it's application to test of the equality of two variances
Hiroshi Kawakami, Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.), Hisashi Yamamoto (Tokyo Metropolitan Univ.) R2011-15
In reliability engineering, robust methods of estimation and tests play important roles. The MAD (Median Absolute Deviat... [more] R2011-15
pp.1-6
R 2011-06-17
13:55
Tokyo   A Study for Testing and Multivariate Control Chart Under Order Relationships of the Parameters
Daisuke Toma, Hideki Nagatsuka, Hisashi Yamamoto (TMU) R2011-16
Constrained parameter problems arise in a wide variety of applications, including reliability modeling, survival analysi... [more] R2011-16
pp.7-12
R 2011-06-17
14:25
Tokyo   Life Assessment Method of Grease Using a Dynamic Viscoelastic Property
Tamami Tamura, Yoko Todo (Toshiba) R2011-17
The grease has been applied the power of the Sliding parts and the Electric conduction portion of the Operating mechanis... [more] R2011-17
pp.13-16
R 2011-06-17
14:50
Tokyo   THERMAL EFFUSIVITY MEASURMENT OF MULTILAYER PLATING USING THERMAL MICROSCOPE
Kazuya Murakami, Kunihiko Wada (Toshiba) R2011-18
On a non-defective analysis of electronic components, people use X-ray transmission inspection and infrared thermography... [more] R2011-18
pp.17-21
 Results 1 - 4 of 4  /   
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