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Technical Committee on Reliability (R) (Searched in: 2007)
Search Results: Keywords 'from:2007-09-14 to:2007-09-14'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2007-09-14 10:30 |
Kochi | Kochi Univ. of Technology | Material Processing by Microplasma in SEM Hidenori Ohi, Yasuaki Okazaki, Tomoyoshi Takahashi, Akimitsu Hatta (Kochi Univ. Technol.)  R2007-29 |
It has been demonstrated that microplasma was generated in SEM operated under low vacuum mode using micro-gas nozzle for... [more] | R2007-29 pp.1-4 |
| R | 2007-09-14 10:55 |
Kochi | Kochi Univ. of Technology | Fault logic trace by Using Transistor Operating Point Analysis
-- Diagnosis of Feed Back Fault with Oscillating Phenomenon -- Masaru Sanada, Tonoya Nakamura, Keishi Hashida (KUT) R2007-30 |
[more] | R2007-30 pp.5-10 |
| R | 2007-09-14 11:20 |
Kochi | Kochi Univ. of Technology | An idea of fault model by RC network, and the transistor level fault diagnosis trial. Yutaka Yoshizawa (NEC Electoronics) R2007-31 |
I introduce an idea of fault model by RC network. By using this model, not only short fault, resistive short/open fault ... [more] | R2007-31 pp.11-16 |
| R | 2007-09-14 13:10 |
Kochi | Kochi Univ. of Technology | [Invited Talk]
The Latest Trend of Defect Modeling in LSI Diagnosis
-- Tutorial -- Yasuo Sato (Hitachi) R2007-32 |
This paper addresses the latest trend of defect modeling for LSI diagnosis. Diagnosis methodology finds the suspicious n... [more] | R2007-32 pp.17-22 |
| R | 2007-09-14 13:40 |
Kochi | Kochi Univ. of Technology | An expanded Per-Test X-Fault Diagnosis Method for LSI Circuits Yusuke Nakamura, Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), K. K. Saluja (Univ. of Wisconsin) R2007-33 |
The behavior of defects has become complex and more than one defects often occur in a single circuit due to shrinking fe... [more] | R2007-33 pp.23-28 |
| R | 2007-09-14 14:05 |
Kochi | Kochi Univ. of Technology | Evaluation of transmission line for LSI tester and simulation modeling Hidekazu Tsuchiya, Takeshi Asakawa (Tokai univ.), Masayuki Sato (Genesis technology) R2007-34 |
Recently, the operating speed of LSI is more fast. Therefore, it is more important to evaluate the transmission line of ... [more] | R2007-34 pp.29-34 |
| R | 2007-09-14 15:00 |
Kochi | Kochi Univ. of Technology | The failure analyses and the article of good quality analysis of the electronic component
-- The efforts for the reliability improvement of the electronic component which is for automobile use -- Yasuo Imai, Ｄａｉｋｉ Ｔａｎａｋａ (ＯＥＧ) R2007-35 |
In recent years, that the electronic component, which is for automobile use, is important is rising rapidly. It got to u... [more] | R2007-35 pp.35-39 |
| R | 2007-09-14 15:25 |
Kochi | Kochi Univ. of Technology | Structural analysis as quality evaluation of LSI manufacturing. Masahito Kajinuma, Akira Mizoguchi, Koichirou Takeuchi (MELCO) R2007-36 |
The technology of commercial grade parts, especially semiconductor device, make advance. On the other hand, market share... [more] | R2007-36 pp.41-44 |
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