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Technical Committee on Reliability (R)  (Searched in: 2019)

Search Results: Keywords 'from:2020-02-14 to:2020-02-14'
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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD, R 2020-02-14
13:35		 Shizuoka   Trend on standardization of Dependability -- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan --
Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) R2019-54 EMD2019-54		 IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Shanghai, China... [more] R2019-54 EMD2019-54
pp.1-6
EMD, R 2020-02-14
14:00		 Shizuoka   Hardware security as a root of trust in information systems -- Focusing on EM information security --
Yuichi Hayashi (NAIST) R2019-55 EMD2019-55		  [more] R2019-55 EMD2019-55
pp.7-11
EMD, R 2020-02-14
14:35		 Shizuoka   Observations of break arc behaviors of AgSnO2 contacts in a DC inductive load under application of an external magnetic field
Makoto Hasegawa, Seika Tokumitsu (Chitose Inst. of Science & Technology) R2019-56 EMD2019-56		 When AgSnO2 contacts were operated to break an inductive DC load circuit up to 20V-17A with an applied external magnetic... [more] R2019-56 EMD2019-56
pp.13-16
EMD, R 2020-02-14
15:00		 Shizuoka   Forcible division of break arcs in small space occurring in a 150V-400VDC/10A resistive circuit by a dividing plate made of PTFE
Yuichiro Kimura, Junya Sekikawa (Shizuoka Univ.) R2019-57 EMD2019-57		  [more] R2019-57 EMD2019-57
pp.17-21
EMD, R 2020-02-14
15:25		 Shizuoka   A Study on Design of Filter by Preference Set-based Design -- Evaluation of Robustness --
Yoshiki Kayano, Yoshio Kami, Fengchao Xiao (UEC) R2019-58 EMD2019-58		  [more] R2019-58 EMD2019-58
pp.23-28
 Results 1 - 5 of 5  /   
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