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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2021-12-10 13:00 |
Kagawa |
(Primary: On-site, Secondary: Online) |
A Low Power Oriented Multiple Target Test Generation Method Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55 |
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture... [more] |
DC2021-55 pp.1-6 |
DC |
2020-02-26 14:10 |
Tokyo |
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A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92 |
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] |
DC2019-92 pp.37-42 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-28 09:40 |
Oita |
B-ConPlaza |
A Test Generation Method for Low Capture Power Using Capture Safe Test Vectors Atsushi Hirai, Toshinori Hosokawa, Yukari Yamauchi, Masayuki Arai (Nihon Univ.) VLD2014-98 DC2014-52 |
In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the ... [more] |
VLD2014-98 DC2014-52 pp.179-184 |
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