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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| KBSE, SS, IPSJ-SE [detail] | 2015-07-22 16:10 |
Hokkaido | Test Scenario Generation for Web Scenario Testing Using Design Document Xiaojing Zhang, Haruto Tanno (NTT)  SS2015-17 KBSE2015-10 |
While automated test execution is popular among software development projects, the efficiency of test design is also nee... [more] | SS2015-17 KBSE2015-10 pp.39-44 |
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| DC | 2015-06-16 16:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Using binary decision diagrams for constraint handling in test case generation Tatsuhiro Tsuchiya (Osaka Univ.) DC2015-21 |
This paper discusses constraint handling in test case generation for Combinatorial Interaction Testing (CIT). CIT requir... [more] | DC2015-21 pp.31-34 |
| R | 2014-08-01 13:55 |
Hokkaido | Smile Hotel Hakodate | On improvement of automatic test case generation taking account of reward structure Masaki Imatomi, Tadashi Dohi (Hiroshima Univ.) R2014-15 |
In this article we consider a statistical method to generate test cases automatically based on both Markov usage model... [more] |
R2014-15 pp.7-12 |
| SS, MSS | 2014-01-31 10:45 |
Aichi | Improving a Test Case Generation Method for Faulty Interaction Location Takahiro Nagamoto, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ) MSS2013-64 SS2013-61 |
This paper discusses the location of interaction faults in software interaction testing．In our previous study we propos... [more] |
MSS2013-64 SS2013-61 pp.77-81 |
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| KBSE | 2014-01-28 11:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Detailed Operational Profile Generation Using a Place/transition Net and Software Execution Histories Tomohiko Takagi, Takuya Arao (Kagawa Univ.) KBSE2013-74 |
Statistical testing is effective in evaluating software reliability and detecting failures that can make serious impacts... [more] | KBSE2013-74 pp.53-58 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2013-11-29 08:55 |
Kagoshima | A Method of LFSR Seed Generation for Delay Fault BIST Taro Honda, Satoshi Ohtake (Oita Univ.) VLD2013-92 DC2013-58 |
In this paper, we propose a method to generate LFSR seeds for delay fault BIST. A conventional way to generate seeds is ... [more] | VLD2013-92 DC2013-58 pp.227-231 |
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| SS, IPSJ-SE | 2013-10-25 13:30 |
Ishikawa | Efficient random test case generation for constrained interaction testing Yasuhiro Hirasaki, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) SS2013-45 |
This paper discusses interaction testing using random testing. Random testing can generate test cases very fast, but d... [more] |
SS2013-45 pp.163-166 |
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| SS, IPSJ-SE | 2013-10-25 13:50 |
Ishikawa | Test Case Generation Based on Design Document: Can We Integrate the Technology into Traditional Development Process? Xiaojing Zhang, Haruto Tanno, Takashi Hoshino (NTT) SS2013-46 |
This paper introduce an improvement method to an existing model based test case extraction approach, our improved method... [more] | SS2013-46 pp.167-172 |
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| KBSE | 2013-03-15 12:00 |
Tokyo | Shibaura Institute of Technology | A Software Regression Testing Tool with the Facilities to Restore the State at Program Execution of a Program under Test. Yuhei Otani (Shibaura Inst. of Tech.), Hiroaki Hashiura (Toyo Univ.), Seiichi Komiya (Shibaura Inst. of Tech.) KBSE2012-83 |
In today's software development is often to change or maintain the existing system. Therefore, regression testing is bec... [more] | KBSE2012-83 pp.85-90 |
| SS | 2013-01-10 16:00 |
Okinawa | On the Probability of Interaction Fault Detection Using Random Testing in the Presence of Constraints on Parameter Values Daiki Shigeoka, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) |
This paper discusses random testing, which is a simple approach to test case generation for software testing. A notable ... [more] | SS2012-51 pp.31-35 |
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| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:55 |
Miyazaki | NewWelCity Miyazaki | A study on path selection results of an adaptive field test with process variation and aging degradation for VLSI Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyu Univ) VLD2011-85 DC2011-61 |
It has the problem that good VLSIs in production testing become defective VLSIs in the fields because small delays on si... [more] | VLD2011-85 DC2011-61 pp.191-195 |
| KBSE | 2011-11-11 11:00 |
Nagano | Shinshu Univ. | Document-based Test Case Generation using RDF Store Futoshi Iwama, Taiga Nakamura (IBMJ) KBSE2011-47 |
Automation tool has made less progress in software testing based on document such as requirement and design than unit te... [more] | KBSE2011-47 pp.67-72 |
| KBSE | 2011-03-10 14:20 |
Oita | Beppu International Convention Center | Generating Test Cases from UML Requirement Specifications Based on Coverage Ryo Shikimi, Shinpei Ogata, Saeko Matsuura (Shibaura Inst. of Tech.) KBSE2010-48 |
To develop high quality system, it should be verified that a final product satisfies the requirements specification. Fro... [more] | KBSE2010-48 pp.7-12 |
| SS | 2011-03-08 09:00 |
Okinawa | Okinawa-ken Seinen Kaikan | Modular Verification using Bounded Model Checking technique with Test Case Generation Yuusuke Hashimoto (Sokendai), Shin Nakajima (NII) SS2010-68 |
In bounded model checking technique, some approximation is introduced during the translation from a program to a finite ... [more] | SS2010-68 pp.91-96 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 16:25 |
Fukuoka | Kyushu University | Experimental Evaluation of Built-in Test Pattern Generation with Image Decoders Yuka Iwamoto, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2010-63 DC2010-30 |
Built-in Self Test (BIST) is one of effective methods for testing today's very large-scale SoCs.In BIST scheme, a t... [more] | VLD2010-63 DC2010-30 pp.43-48 |
| SS | 2010-10-15 09:45 |
Iwate | Iwate Prefectural Univ. | Automatic Test Case Generation for Integration Testing Haruto Tanno, Xiaojing Zhang, Takashi Hoshino (NTT) SS2010-34 |
Our research focuses on automatic test case generation for web applications, to test the integration of three-layer, w... [more] |
SS2010-34 pp.37-42 |
| SS | 2009-08-07 09:30 |
Hokkaido | Kitami Institute of Technology | Automating Equivalence Partitioning in Test Case Generation with a Computer Algebra System Satoshi Hattori (Tokyo Inst. of Tech.) SS2009-24 |
We try to use a computer algebra system Mathematica as a test case generation system. In this paper, we deal with black-... [more] | SS2009-24 pp.71-76 |
| SS, KBSE | 2009-05-22 09:30 |
Akita | Akita University | A Design Model Based Methodology for Test Case Extraction and Test Data Generation Xiaojing Zhang, Takashi Hoshino (NTT) SS2009-7 KBSE2009-7 |
In terms of software quality assurance, it is necessary to improve the testing process, which ensure that software works... [more] | SS2009-7 KBSE2009-7 pp.37-42 |
| VLD, CAS, SIP | 2008-06-27 10:00 |
Hokkaido | Hokkaido Univ. | On the Test Environment Generation Problem Using Assignment Decision Diagrams Yuki Shimizu (NAIST), Chia Yee Ooi (UTM), Hideo Fujiwara (NAIST) CAS2008-22 VLD2008-35 SIP2008-56 |
In this paper, we consider a problem of test environment generation for functional register-transfer level (RTL) circuit... [more] | CAS2008-22 VLD2008-35 SIP2008-56 pp.19-24 |
| DC, CPSY, IPSJ-SLDM, IPSJ-EMB | 2008-03-28 13:00 |
Kagoshima | Automatically Generating Testcases with the NuSMV Model Checker Masaya Kadono, Tatsuhiro Tsuchiya, Tohru Kikuno (Osaka Univ.) DC2007-110 CPSY2007-106 |
There are various testing methods of improving the reliability of software.In this study, we consider state transition t... [more] | DC2007-110 CPSY2007-106 pp.155-160 |
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