Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SANE |
2018-11-09 08:50 |
Overseas |
China (Xuchang) |
Throughput and Frame Error Rate Evaluation in different frequencies for Integrated-Aeronautical Mobile Communication Terminal Kazuyuki Morioka, Naoki Kanada, Shunichi Futatsumori, Akiko Kohmura, Naruto Yonemoto, Yasuto Sumiya (ENRI) SANE2018-81 |
Due to a rapid increase in air traffic volume, air traffic management (ATM) has become essential. An aeronautical radio ... [more] |
SANE2018-81 pp.127-131 |
ET |
2018-10-20 10:05 |
Fukuoka |
Fukuoka Institute of Technology |
Development of Seating Chart Creation System to Improve Efficiency of Office Work in School Using Database System Yuto Misaka (Saga Univ.), Sachiko Morita (Kochi Univ.), Hisao Fukumoto, Tatsuya Furukawa (Saga Univ.) ET2018-38 |
Creating the seating charts for classes is one of teachers' task. We have created the seating charts by hand, so that it... [more] |
ET2018-38 pp.1-6 |
PRMU, BioX |
2018-03-19 11:15 |
Tokyo |
|
Personal Authentication by Pen-Holding Style using Image Taken from Bottom Minako Sato, Takao Yamanaka (Sophia Univ.) BioX2017-60 PRMU2017-196 |
In this paper, a novel personal authentication method is proposed by using images of pen-holding style taken from the bo... [more] |
BioX2017-60 PRMU2017-196 pp.145-150 |
CS, CAS |
2018-03-13 10:10 |
Fukuoka |
Nishijin Plaza, Kyushu University |
Implementation and Performance Evaluation of Low-PAPR SOCC-OFDM Communications Systems Tomoki Yokokawa, Hideki Ochiai (Yokohama Natl. Univ.) CAS2017-148 CS2017-102 |
One of the major drawbacks of orthogonal frequency-division multiplexing (OFDM) systems is its signal with high peak-to-... [more] |
CAS2017-148 CS2017-102 pp.87-92 |
VLD, HWS (Joint) |
2018-02-28 16:55 |
Okinawa |
Okinawa Seinen Kaikan |
Reliability Evaluation of Mixed Error Correction Scheme for Soft-Error Tolerant Datapaths Junghoon Oh, Mineo Kaneko (JAIST) VLD2017-102 |
Among several problems with miniaturization of LSIs, soft-errors are one of serious problems to make reliability worse. ... [more] |
VLD2017-102 pp.79-84 |
VLD, HWS (Joint) |
2018-02-28 17:20 |
Okinawa |
Okinawa Seinen Kaikan |
Evaluation of a Radiation-Hardened Method and Soft Error Resilience on Stacked Transistors in 28/65 nm FDSOI Processes Haruki Maruoka, Kodai Yamada, Mitsunori Ebara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2017-103 |
The continuous downscaling of transistors has resulted in an increase of reliability issues for semiconductor chips. In ... [more] |
VLD2017-103 pp.85-90 |
VLD, HWS (Joint) |
2018-02-28 17:45 |
Okinawa |
Okinawa Seinen Kaikan |
Evaluation of Soft Error Tolerance on Flip-Flop depending on 65 nm FDSOI Transistor Threshold-Voltage Mitsunori Ebara, Haruki Maruoka, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2017-104 |
Moore's Law has been miniaturizing integrated circuits, which
can make a lot of high performance devices such as PCs an... [more] |
VLD2017-104 pp.91-96 |
SR |
2018-01-26 14:50 |
Fukuoka |
Fukuoka univ. |
On Implementation of Low-PAPR SOCC-OFDM Communications System using Software Defined Radio Tomoki Yokokawa, Hideki Ochiai (Yokohama Natl. Univ.) SR2017-108 |
One of the major drawbacks of orthogonal frequency-division multiplexing (OFDM) systems is its sig- nal with high peak-t... [more] |
SR2017-108 pp.85-89 |
HCGSYMPO (2nd) |
2017-12-13 - 2017-12-15 |
Ishikawa |
THE KANAZAWA THEATRE |
BubbleFlick: Improved Japanese Kana Flick Input Interface for Smartwatch and Its 30 day Continuing Evaluation Takaki Tojo, Tsuneo Kato, Seiichi Yamamoto (Doshisha Univ.) |
A user-friendly Japanese text-entry method for smartwatches is anticipated to enhance the appeal of smartwatches to pote... [more] |
|
EMM |
2017-11-07 13:00 |
Kagoshima |
Kagoshima Univ. (Inamori Academy) |
A Study of DCT-OFDM-Based Watermarking Scheme Assisted by Error Correcting Code Shogo Shigemoto, Minoru Kuribayashi, Nobuo Funabiki (Okayama Univ.) EMM2017-64 |
There are two variants for the DCT-OFDM-based watermarking scheme that retains high robustness against various kinds of ... [more] |
EMM2017-64 pp.47-52 |
ET |
2017-10-21 14:30 |
Fukuoka |
Kyusyu Institute of Technology (Tobata Campus) |
Design and Implementation of Drag-and-Drop Type Seating Chart Creation System Using Database System Yuto Misaka, Sachiko Morita, Hisao Fukumoto, Tatsuya Furukawa (Saga Univ.) ET2017-47 |
When we create the seating charts for classes and the booth layouts for joint job fairs, it not only takes times but als... [more] |
ET2017-47 pp.37-42 |
RCS |
2017-06-23 09:30 |
Okinawa |
Ishigaki Shoukou Kaikan |
A Multiple Differential Detection Based on Channel Prediction Employing Soft-Output Per-Survivor Processing Kazuki Shimomura, Toshiki Mori, Hiroshi Kubo (Ritsumeikan Univ.) RCS2017-77 |
In order to improve tracking capability for fast time-varying channels, this paper proposes demodulation schemes employi... [more] |
RCS2017-77 pp.161-166 |
RCS |
2017-06-23 10:10 |
Okinawa |
Ishigaki Shoukou Kaikan |
Study on Random codebook Design and its constraint for Massive SCMA Detection Keisuke Inagaki, Takumi Takahashi, Shinsuke Ibi, Seiichi Sampei (Osaka Univ.) RCS2017-81 |
This paper proposes a random codebook design and its constraint for Gaussian belief propagation (GaBP) in massive Sparse... [more] |
RCS2017-81 pp.185-190 |
RCS |
2017-04-24 09:55 |
Kagawa |
Kotohira Onsen Kotosankaku |
A Study on Criterion of Adaptively Scaled Belief for PDA in Overloaded MIMO Channels Takumi Takahashi, Shinsuke Ibi, Seiichi Sampei (Osaka Univ.) RCS2017-2 |
This paper proposes a new design criterion of adaptively scaled belief (ASB) in probabilistic data association (PDA), es... [more] |
RCS2017-2 pp.5-10 |
ISEC, WBS, IT |
2017-03-10 10:55 |
Tokyo |
TOKAI University |
Studies on evaluationg system for q-ary linear block codes based on q-input r-output symmetric channels(2) Kyoshiro Furuya, Kazuhiko Yamaguchi (UEC) IT2016-123 ISEC2016-113 WBS2016-99 |
Kawashima and Yamaguchi proposed method to compute probability of decoding error of soft decision decoding for q-ary lin... [more] |
IT2016-123 ISEC2016-113 WBS2016-99 pp.155-160 |
SIS |
2017-03-03 11:20 |
Kanagawa |
Kanagawa Inst. Tech. Yokohama Office |
Implementation of Fast Edge-preserving Smoothing Filter based on Image Gradient on a Hardware/Software Co-design System Hiroto Komatsu (NIT, Tokuyama Col.), Hakaru Tamukoh (Kyutech), Noriaki Suetake (Yamaguchi Univ.), Takanori Koga (NIT, Tokuyama Col.) SIS2016-59 |
Edge-preserving smoothing is the processing that smooths unnecessary small amplitude signals with keeping primal edges i... [more] |
SIS2016-59 pp.95-100 |
VLD |
2017-03-03 13:25 |
Okinawa |
Okinawa Seinen Kaikan |
Effect on the Chip Area of Component Adjacency Constraint for Soft-Error Tolerant Datapaths Junghoon Oh, Mineo Kaneko (JAIST) VLD2016-129 |
Due to the downsizing of VLSI, reliability issues caused by soft-errors have become more explicit. Several studies in sy... [more] |
VLD2016-129 pp.151-156 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 14:15 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
Evaluation of Radiation-Hard Circuit Structures in a FDSOI Process by TCAD Simulations Kodai Yamada, Haruki Maruoka, Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-49 DC2016-43 |
According to the Moore's law, LSIs are miniaturized and the
reliability of LSIs is degraded. To improve the tolerance ... [more] |
VLD2016-49 DC2016-43 pp.31-36 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 14:40 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
Evaluation of Soft Error Hardness of FinFET and FDSOI Processes by the PHITS-TCAD Simulation System Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-50 DC2016-44 |
The impact of soft errors has been serious with process scaling of integrated circuits. Simulation methods for soft erro... [more] |
VLD2016-50 DC2016-44 pp.37-41 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:05 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions Masashi Hifumi, Shigehiro Umehara, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-51 DC2016-45 |
We evaluate tolerance for soft errors of FFs on a 28/65 nm FDSOI. We fabricated three different layouts of non-redundant... [more] |
VLD2016-51 DC2016-45 pp.43-48 |