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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 41 - 60 of 77 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
HCS 2012-01-20
10:30
Aichi   Psychological assessment of emotional intelligence -- Self-report assessment and performance-based assessment --
Sahoko Komatsu, Chinami Narisawa, Yuji Hakoda (Kyushu Univ.) HCS2011-54
We studied on assessments of emotional intelligence (EI). EI is the intelligence to perceive, recognize and control one’... [more] HCS2011-54
pp.5-10
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-30
11:20
Miyazaki NewWelCity Miyazaki A Method of Thermal Uniformity Control During BIST
Eri Murata (NAIST), Satoshi Ohtake (Oita Univ.), Yasuhiko Nakashima (NAIST) VLD2011-86 DC2011-62
Along with the improvement in semiconductor technology, it is important to ensure product quality that small delay defec... [more] VLD2011-86 DC2011-62
pp.197-202
OCS, LQE, OPE 2011-10-27
09:20
Kochi Kochi University of Technology Experimental Demonstration of 10GS/s 5bit Optical Quantization for Photonic Analog-to-Digital Conversion
Takema Satoh, Koji Takahashi, Hideki Matsui, Kazuyoshi Itoh, Tsuyoshi Konishi (Osaka Univ.) OCS2011-56 OPE2011-94 LQE2011-57
We report the experimental demonstration of 10-GS/s 5-bit optical quantization using soliton self-frequency shift (SSFS)... [more] OCS2011-56 OPE2011-94 LQE2011-57
pp.13-16
EMCJ 2011-07-14
11:20
Tokyo Kikai-Shinko-Kaikan Bldg. Measurement of Self-Inductance of IC Package with THRU Pattern Embedded Instead of Chip
Ayumi Tanimichi, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2011-49
In IC package modeling of electrical properties, to compare model parameters extracted from results
of electromagnetic ... [more]
EMCJ2011-49
pp.31-36
DC 2011-06-24
13:30
Tokyo Kikai-Shinko-Kaikan Bldg. Effective multi-cycle signatures in testable response analyzers
Yuki Fukazawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2011-9
In the BIST (built-in self-test) scheme, we have proposed a concurrent testable response analyzer, called an encoding-ba... [more] DC2011-9
pp.5-10
TL 2011-02-04
11:10
Tokyo Kikai-Shinko-Kaikan Bldg. Japanese learners experience less difficulty with English garden-path sentences than native speakers by using subcategorization information of a verb
Chie Nakamura (JSPS/Keio Univ.), Manabu Arai (JSPS/Tokyo Univ.), Yasunari Harada (Waseda Univ.) TL2010-48
This study investigates the difference in processing structurally ambiguous (so-called ‘garden-path’) sentences in Engli... [more] TL2010-48
pp.13-18
HCS 2011-01-21
11:00
Osaka Osaka University Nakanoshima Center The Definition of 'Excessive' Normative Consciousness
Yoriko Uehara, Naoki Kugihara (Osaka Univ.) HCS2010-47
The purpose of this study is that define ‘Excessive’ normative consciousness. We proposed a model that match or unmatch ... [more] HCS2010-47
pp.19-24
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2010-11-29
16:25
Fukuoka Kyushu University Experimental Evaluation of Built-in Test Pattern Generation with Image Decoders
Yuka Iwamoto, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2010-63 DC2010-30
Built-in Self Test (BIST) is one of effective methods for testing today's very large-scale SoCs.In BIST scheme, a t... [more] VLD2010-63 DC2010-30
pp.43-48
HIP, ITE-HI, ITE-CE 2010-10-14
14:30
Miyagi RIEC A crossmodal contingent aftereffect between visual and vestibular senses
Kenzo Sakurai (TGU), Yuika Suzuki, Shuichi Sakamoto, Jiro Gyoba, Yo-iti Suzuki (Tohoku Univ.) HIP2010-48
We conducted an experiment to explore color-contingent self-motion aftereffects. Observers were asked to report whether... [more] HIP2010-48
pp.11-14
TL 2010-08-05
15:35
Tokyo Kikai-Shinko-Kaikan Bldg. The involvement of inhibition function during garden-path recovery in sentence processing
Hiroaki Oishi (RIKEN/JSPS), Nobuyuki Jincho (RIKEN), Reiko Mazuka (RIKEN/Duke Univ.) TL2010-19
This study investigated the involvement of the inhibition function during the garden-path recovery in sentence processin... [more] TL2010-19
pp.49-54
ICD, ITE-IST 2010-07-22
14:00
Osaka Josho Gakuen Osaka Center [Invited Talk] Digitally-Assisted Analog Test Technology -- Analog Circuit Test Technology in Nano-CMOS Era --
Haruo Kobayashi, Takahiro J. Yamaguchi (Gunma Univ.) ICD2010-27
This paper reviews current production testing issues for analog and
mixed-signal SoC, and discusses the following:
(i)... [more]
ICD2010-27
pp.37-42
RECONF 2010-05-13
16:20
Nagasaki   A Case Study of Evaluation Technique for Soft Error Tolerance on SRAMs-based FPGAs.
Tsuyoshi Kimura, Noritaka Kai, Yoshiaki Tsutsumi, Motoki Amagasaki, Morihiro Kuga, Toshinori Sueyoshi (Kumamoto Univ.) RECONF2010-7
SRAM-based field programmable gate arrays (FPGAs) are vulnerable to a single event upset (SEU),which is induced by radia... [more] RECONF2010-7
pp.37-42
NC, MBE
(Joint)
2010-03-09
13:45
Tokyo Tamagawa University On statistical inference of estimating fluorescent indicator and intracellular ionic concentrations on the basis of a self-organizing state-space model
Ryohei Iwahashi (Osaka Univ.), Takashi Tateno (Osaka Univ./JST) NC2009-94
For measuring concentration of free calcium ([Ca2+]i) inside living cells, indicator dyes including fura-2 are widely us... [more] NC2009-94
pp.39-44
HIP, HCS, MVE, WIT
(2nd)
2009-12-10
- 2009-12-12
Hokkaido Sappolo Convention Center Comparison of learning-condition for voice authentication with self-organizing map
Subaru Yoshikawa, Hideharu Ishida, Kazuhiro Notomi (Kanagawa Institute of Technology), Keiichi Saito (Tokyo Denki Univ.)
Recently, scenes of personal authentication are increasing, so we are evaluating a variety of authentication methods wit... [more]
MI 2009-07-15
10:40
Tokyo AIST Tokyo waterfront annex 11F meeting room #1 An Image Analysis for Tree-drawing Test Using Moments in each Order and Fourier Translation.
Takuya Kura, Toru Fujiwara, Shuhei Miyata, Rintaro Abe, Masahiko Shinno (Shinshinkai) MI2009-43
The tree drawing (baum) test is a formal test admired by the health insurance and widely used in the mental medicine, in... [more] MI2009-43
pp.19-24
DC, CPSY 2009-04-21
15:45
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. A design of testable response analyzers in built-in self-test
Yuki Fukazawa, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) CPSY2009-7 DC2009-7
In the BIST(Built-in self-test) scheme, the occurrence of faults in BIST circuits, e.g., test generators and response co... [more] CPSY2009-7 DC2009-7
pp.37-42
NC, MBE
(Joint)
2009-03-13
13:25
Tokyo Tamagawa Univ. Estimation of landmine class likelihood by evaluating the degree of matching in ring-CSOM space
Yukimasa Nakano, Akira Hirose (Tokyo Univ.) NC2008-169
For metal detectors and ground penetrating radar (GPR) systems, it has been a hard task to visualize antipersonnel plast... [more] NC2008-169
pp.387-391
ET 2009-03-07
16:25
Kagawa   A Method for maintaining learners' motivation on the self-study material contribution and sharing system
Hideki Wake, Toshihiro Hayashi, Hiroyuki Tarumi (Kagawa Univ.) ET2008-106
We developed a self study material contribution and sharing system called "KSS". We investigated the learners’ status on... [more] ET2008-106
pp.77-82
IA, SITE 2009-03-06
10:10
Kumamoto   The Education of Internet Ethics in Korea and International Cooperation Methods
Jungho Park (Sunmoon Univ.), Jinwook Chung (Sunkyunkwan Univ.), Angu Kang, Jaechul Seo (National Internet Development Agency, Korea) SITE2008-84 IA2008-107
In these days, many problems such as internet fraud are occurred in the internet by abnormal increase of internet spread... [more] SITE2008-84 IA2008-107
pp.237-240
MW 2008-11-20
15:40
Nagasaki Nagasaki-Univ. A Study on Wideband Characteristics of Folded Dipole Antenna by Using a Electromagnetic Simulator
Masaya Hirayama, Takashi Yamano, Kim Yongho, Hisashi Morishita (National Defense Academy) MW2008-129
The latest trends in handset unit used in the cellular phone is to reduce the size and the weight. Antenna used for such... [more] MW2008-129
pp.61-66
 Results 41 - 60 of 77 [Previous]  /  [Next]  
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