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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| NLP | 2015-07-21 16:20 |
Hokkaido | Bibai Onsen Yu-rinkan | Analysis of Wave-Motion on 9 or 10 Van Der Pol Oscillators Coupled by Inductors as A Ring Ryouhei Takano, Shouhei Fujimoto, Masayuki Yamauchi, Shunji Maeda, Takeshi Tanaka (Hiroshima I.T.)  NLP2015-73 |
We can observed various synchronization phenomena on coupled oscillators. Changing synchronization states can be observ... [more] |
NLP2015-73 pp.31-36 |
| DC | 2014-12-19 13:00 |
Toyama | Study on reduction and control of NBTI-induced degradation in FPGA-based ring oscillators Yasuo Sato, Yousuke Miyake, Seiji Kajihara (Kyutech) DC2014-67 |
Ring oscillators are used for variety of applications to enhance reliability on LSIs or FPGAs; however, the performance ... [more] | DC2014-67 pp.1-6 |
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| DC | 2014-12-19 13:25 |
Toyama | A Temperature Monitor Using Ring-Oscillators on FPGA Yousuke Miyake, Yasuo Sato, Seiji Kajihara (kyutech) DC2014-68 |
On-chip temperature monitors are often used to guarantee the reliability of VLSIs and monitors using ring oscillators ha... [more] | DC2014-68 pp.7-12 |
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| MW | 2014-12-18 13:50 |
Tokyo | Aoyama Gakuin Univ. Aoyama Campus | Noise characteristic of variable phase oscillator for out-phasing power amplifiers Ken Endo, Yuto Takahashi, Hidehisa Shiomi, Yasuyuki Okamura (Osaka Univ.) MW2014-157 |
This paper presents noise characteristic of a ring oscillator and LC oscillator as VCO used for an out-phasing modulatio... [more] | MW2014-157 pp.49-52 |
| ICD, CPSY | 2014-12-02 14:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.) ICD2014-106 CPSY2014-118 |
Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] | ICD2014-106 CPSY2014-118 pp.123-128 |
| ICD, SDM | 2014-08-05 14:55 |
Hokkaido | Hokkaido Univ., Multimedia Education Bldg. | Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage Azusa Oshima, Ryo Kishida, Michitarou Yabuuchi, Kazutoshi Kobayashi (KIT) SDM2014-79 ICD2014-48 |
Reliability issues, such as plasma-induced damage (PID) and Bias Temperature Instability (BTI), become dominant on inte... [more] |
SDM2014-79 ICD2014-48 pp.93-98 |
| DC | 2014-06-20 13:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A method of LSI degradation estimation using ring oscillators Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2014-11 |
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] | DC2014-11 pp.7-14 |
| NLP | 2014-01-22 15:20 |
Hokkaido | Niseko Park Hotel | Dynamics of phase oscillator populations with multifrequencies Yu Terada (Kyoto Univ.), Toshio Aoyagi (Kyoto Univ./JST) NLP2013-159 |
Synchronization plays an important role in nature and its analytical research based on phase oscillator model have been ... [more] | NLP2013-159 pp.157-161 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2013-11-28 13:20 |
Kagoshima | Evaluations of Variations on Ring Oscillators from Plasma Induced Damage in Bulk and SOTB Processes Ryo Kishida, Michitarou Yabuuchi, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-83 DC2013-49 |
A degradation of reliability caused by plasma induced damage has become a significant concern with miniaturizing a devic... [more] | VLD2013-83 DC2013-49 pp.159-164 |
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| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2013-11-28 13:45 |
Kagoshima | A Study on Design Structure of Ring Oscillators with Plural Frequency Characteristics in FPGAs Yousuke Miyake, Masafumi Monden, Yasuo Sato, Seiji Kajihara (Kyusyu Inst. of Tech.) VLD2013-84 DC2013-50 |
FPGAs are used in various embedded systems including highly reliable systems, therefore, it is important to ensure its r... [more] | VLD2013-84 DC2013-50 pp.165-170 |
|
| MW, AP (Joint) |
2013-09-12 13:25 |
Tokyo | NHK Science Tech. Research Lab. | Fundamental limit and its realization for injection-locking technique
-- Applications -- Yoji Yabe, Shusaku Iikura, Kazuki Nakada, Tomoyuki Morikawa, Temuulen Enkhee, Ryohei Nagatome, Hisa-Aki Tanaka (UEC) MW2013-89 |
Since injection-locking improves frequency stability in the oscillator, its researches have been steadily progressed for... [more] | MW2013-89 pp.5-10 |
| ASN, RCS, NS, SR (Joint) |
2013-07-18 15:45 |
Shizuoka | Hamamatsu Act City | [Poster Presentation]
A study on Robust Multiple Hypothesis Testing Approach for Dynamic Spectrum Sharing Takashi Miura, Kenta Umebayashi (TUAT), Janne J Lehtomaki (Univ. of Oulu), Yasuo Suzuki (TUAT) NS2013-60 RCS2013-111 SR2013-49 ASN2013-78 |
This paper tackles the four-level hypothesis problem for spectrum sharing between primary users (PUs) and secondary user... [more] | NS2013-60 RCS2013-111 SR2013-49 ASN2013-78 pp.137-142(NS), pp.179-184(RCS), pp.153-158(SR), pp.165-170(ASN) |
| DC | 2013-06-21 16:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Method of Transistor Degradation Estimation Using Ring Oscillators Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2013-15 |
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] | DC2013-15 pp.31-36 |
| DC | 2013-02-13 16:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Temperature and voltage estimation considering manufacturing variability for a monitoring circuit Yousuke Miyake, Wataru Tsumori, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.), Yukiya Miura (Tokyo Metropolitan Univ.) DC2012-89 |
Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, a highly accur... [more] | DC2012-89 pp.55-60 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 14:30 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | Design of temperature and voltage monitoring circuit structure for field test Wataru Tsumori, Yousuke Miyake, Yasuo Sato, Seiji Kajihara (KIT), Yukiya Miura (TMU) VLD2012-101 DC2012-67 |
For improving reliability of LSIs, the delay increase caused by aging during system operation should be detected before ... [more] | VLD2012-101 DC2012-67 pp.243-248 |
| NC | 2012-10-05 13:35 |
Fukuoka | Kyushu Institute of Technology (Wakamatsu Campus) | A data gathering scheme in wireless sensor networks using a spiking neural network with local information Ikki Fujita, Hidehiro Nakano, Arata Miyauchi (Tokyo City Univ.) NC2012-54 |
In WSNs, compact wireless sensor nodes are deployed in observation area, form an impromptu network and gather sensing ... [more] |
NC2012-54 pp.103-107 |
| NLP, CAS | 2012-09-21 14:50 |
Kochi | Eikokuji Campus, University of Kochi | Studies on Couplings of SET Ring Oscillators for In-Phase Oscillation Haruka Noda, Keisuke Nagata, Hisato Fujisaka, Takeshi Kamio, Kazuhisa Haeiwa (Hiroshima City Univ.) CAS2012-46 NLP2012-72 |
Ring oscillator with single-electron tunneling (SET) transistors has a very large phase noise because electron tunneling... [more] | CAS2012-46 NLP2012-72 pp.87-91 |
| MW | 2012-03-02 10:30 |
Saga | Saga University | An Oscillator Array using Positive Feedback Push-Push Oscillators Kenta Takata, Kengo Kawasaki, Takayuki Tanaka, Masayoshi Aikawa (Saga Univ.) MW2011-181 |
In this paper, an oscillator array using positive feedback Push-Push oscillators for a beam steering array antenna is de... [more] | MW2011-181 pp.77-80 |
| DC | 2012-02-13 16:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Evaluation of a thermal and voltage estimation circuit for field test Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Kohei Miyase (Kyutech), Yukiya Miura (TMU) DC2011-86 |
High dependability is required for an embedded system VLSI. High functionality and high performance of VLSI, due to the ... [more] | DC2011-86 pp.61-66 |
| NLP | 2011-05-26 13:50 |
Kagawa | Olive park olive memorial hall | Analyses of All-Coupled and Nearest-Neighbor-Coupled Single-Electron Ring Oscillators Masakazu Ishida, Keisuke Nagata, Hisato Fujisaka, Takeshi Kamio, Kazuhisa Haeiwa (Hiroshima City Univ.) NLP2011-3 |
Ring oscillators constructed with single-electron transistor have large phase noise because of probabilistic electron t... [more] |
NLP2011-3 pp.9-14 |
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