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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| IT | 2020-12-02 13:00 |
Online | Online | Error exponent of probability that optimal strategy will fail under cost and profit constraints Kiminori Iriyama  IT2020-36 |
In information theory, it is interesting to study the exponential rate when the error probability exponentially converge... [more] | IT2020-36 pp.67-72 |
| NS, ICM, CQ, NV (Joint) |
2020-11-26 09:30 |
Online | Online | A Study on Path Reachability Including Distance-Constrained Detours Miyu Otani, Takanori Hara, Masahiro Sasabe, Shoji Kasahara (NAIST) CQ2020-49 |
When links and/or nodes are down in a network, the network may not function normally. Most of the existing work focuses ... [more] | CQ2020-49 pp.10-15 |
| SDM | 2020-11-20 10:30 |
Online | Online | [Invited Talk]
Power Device Degradation Estimation by Machine Learning of Gate Waveforms Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo) SDM2020-29 |
A method to detect bonding wire lift-off of SiC MOSFETs using machine learning from the gate voltage waveform is propose... [more] | SDM2020-29 pp.32-35 |
| COMP, IPSJ-AL | 2020-09-02 10:00 |
Online | Online | Procedure to Receive Linguistic Information
-- To construct Common Human Intelligence -- Kumon Tokumaru (Writer) COMP2020-7 |
Humans are eusocial animal. Language is a communication tool inside community and a tool to generate and develop collect... [more] | COMP2020-7 pp.9-16 |
| CQ | 2020-07-17 14:15 |
Online | Online | High Reliability Network Design Problem Considering Reduction Cost of Failure Probability of Simultaneous Failure Sets Yuma Morino, Hiroyoshi Miwa (Kwansei Gakuin Univ.) CQ2020-33 |
It is important to design a robust information network resistant to network failures. The protection method to decrease ... [more] | CQ2020-33 pp.63-68 |
| DE | 2020-06-27 10:05 |
Online | Online | A Recommendation Method of Health Article based on Association Rule for Health Terms Appeared on the Web Trinh Viet Thong, Takano Kosuke (KAIT) DE2020-4 |
This paper presents a recommendation method of health articles based on association rules for health terms appeared on W... [more] | DE2020-4 pp.19-24 |
| EMD, R | 2020-02-14 13:35 |
Shizuoka | Trend on standardization of Dependability
-- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan -- Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) R2019-54 EMD2019-54 |
IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Shanghai, China... [more] | R2019-54 EMD2019-54 pp.1-6 |
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| SDM | 2020-01-28 13:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Formation of High Reliability Hydrogen-free MONOS Cells Using Deuterated Ammonia Masaki Noguchi, Tatsunori Isogai, Hiroyuki Yamashita, Keiichi Sawa, Ryota Fujitsuka, Takanori Yamanaka, Shunsuke Okada, Tomonori Aoyama, Fumiki Aiso, Junko Abe, Yoshiro Ogawa, Seiji Nakagawa, Hideshi Miyajima (KIOXIA) SDM2019-82 |
For high reliability non-volatile memory cell dielectrics, hydrogen-free deuterated tunnel SiON and charge-trap SiN film... [more] | SDM2019-82 pp.1-4 |
| HCS | 2020-01-26 09:50 |
Oita | Room407, J:COM HorutoHall OITA (Oita) | The Relationships between Psychological Well-being and Twitter Use among University Students Hiro Inoue, Shaoyu Ye (Univ. of Tsukuba) HCS2019-68 |
In this study, we examined the general social credibility of (1) whether social networks obtained through Twitter and fa... [more] | HCS2019-68 pp.83-88 |
| DC | 2019-12-20 16:30 |
Wakayama | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] | DC2019-85 pp.37-42 |
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| R | 2019-12-13 15:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Lindley Type Distributions and Software Reliability Assessment Qi Xiao, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2019-53 |
Dennis Victor Lindley proposed an interesting one-parameter continuous probability distribition, which is called Lindley... [more] | R2019-53 pp.19-24 |
| R | 2019-11-28 14:10 |
Osaka | Central Electric Club | Non-homogeneous Markov Process Modeling for Software Reliability Assessment Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima U.) R2019-44 |
In this paper, we focus on non-homogeneous Markov processes, which are generalizations of the well-known non-homogeneous... [more] | R2019-44 pp.7-12 |
| R | 2019-11-28 14:35 |
Osaka | Central Electric Club | Process-Oriented Software Reliability Modeling with Debugging Difficulties Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2019-45 |
We discuss software reliability growth modeling by considering the relationship between the debugging process, which mai... [more] | R2019-45 pp.13-18 |
| R | 2019-10-25 14:00 |
Nagasaki | Fukue Culture Center | Multiple Change-Point Modeling for Software Reliability Assessment Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2019-38 |
We discuss Markovian imperfect debugging modeling for software reliability assessment with multiple changes of testing e... [more] | R2019-38 pp.1-6 |
| SDM | 2019-10-24 09:30 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
NiAl as Cu alternative for ultrasmall feature sizes Linghan Chen, Junichi Koike, Daisuke Ando, Yuji Sutou (Tohoku Univ.) SDM2019-59 |
Conventional Cu interconnect will suffer from a great line resistivity increase due to aggressive downscaling of the dim... [more] | SDM2019-59 pp.29-33 |
| SAT | 2019-10-10 15:20 |
Fukuoka | JR HAKATA CITY {10F RoomA+B} | Development of highly maintainable and reliable RF transceiver for satellite base stations Munehiro Matsui, Akira Matsushita, Fumihiro Yamashita (NTT) SAT2019-52 |
Maintainability and reliability is required for sustainable operation of satellite communication system. This paper pres... [more] | SAT2019-52 pp.21-26 |
| NS | 2019-10-10 16:10 |
Aichi | Nagoya Institute of Technology | [Invited Talk]
On recent developments in network reliability computation using binary decision diagrams Jun Kawahara (Kyoto Univ.) NS2019-113 |
Given a network with static link failure probabilities, the network reliability is to compute the probability that two s... [more] | NS2019-113 pp.59-62 |
| NS, IN, CS, NV (Joint) |
2019-09-06 11:40 |
Miyagi | Research Institute of Electrical Communication, Tohoku Univ. | Efficient Reliability Evaluation of Multi-Domain Networks with Secure Intra-Domain Privacy Atsushi Taniguchi, Takeru Inoue, Kohei Mizuno (NTT), Takashi Kurimoto, Atsuko Takefusa, Shigeo Urushidani (NII) CS2019-55 |
Communication networks are now an essential infrastructure of society. Many services are constructed across multiple net... [more] | CS2019-55 pp.45-50 |
| LQE, OPE, CPM, EMD, R | 2019-08-22 16:45 |
Miyagi | [Invited Talk]
3D Flash Memory Cell Reliability Yuichiro Mitani, Harumi Seki, Takanori Asano, Yasushi Nakasaki (Toshiba Memory) R2019-26 EMD2019-24 CPM2019-25 OPE2019-53 LQE2019-31 |
As conventional planar NAND flash memories are limited from physical and electrical scaling point of view, the three-dim... [more] | R2019-26 EMD2019-24 CPM2019-25 OPE2019-53 LQE2019-31 pp.35-38 |
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| R | 2019-07-26 14:00 |
Iwate | Ichinoseki Cultural Center | Limit theorem of a connected-(r,s)-out-of-(m,n):F lattice system Koki Yamada, Taishin Nakamura, Hisashi Yamamoto, Lei Zhou, Xiao Xiao (Tokyo Met. Univ.) R2019-14 |
In previous studies, several methods for computing the reliability of a connected-(r,s)-out-of-(m,n):F lattice system ha... [more] | R2019-14 pp.1-6 |
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