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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMM | 2016-03-02 15:40 |
Kagoshima | Yakushima Environ. and Cultural Vill. Center | [Poster Presentation]
Comparative Study on Robustness of Synchronization Information Embedded into an Audio Watermarked Frame Jessada Karnjana, Pham Nhien, Shengbei Wang, Nhut Minh Ngo, Masashi Unoki (JAIST)  EMM2015-83 |
Most of reported audio watermarking techniques are frame-based. That is, a host audio signal is segmented into frames, a... [more] | EMM2015-83 pp.41-44 |
| VLD | 2016-02-29 13:55 |
Okinawa | Okinawa Seinen Kaikan | Random Testing of C Compilers Based on Test Program Generation by Equivalence Transformation Kazuhiro Nakamura, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2015-112 |
This article proposes a method of generating test programs for random testing of C compilers based on equivalence transf... [more] | VLD2015-112 pp.7-12 |
| DC | 2016-02-17 14:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-92 |
Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage wi... [more] | DC2015-92 pp.37-42 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 13:50 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | Background Sequence Generation for Neighborhood Pattern Sensitive Fault Testing in Random Access Memories Shin'ya Ueoka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) VLD2015-40 DC2015-36 |
The Neighborhood Pattern Sensitive Fault (NPSF) is widely discussed fault model for memories, and it occurs when a memor... [more] | VLD2015-40 DC2015-36 pp.19-24 |
| QIT (2nd) |
2015-11-24 13:40 |
Kanagawa | NTT Atsugi R&D center | [Poster Presentation]
Generation of physical random numbers by using homodyne detection Kodai Hirakawa, Yusuke Oguri, Kaori Kono, Shota Oya, Takumi Nakano, Tsubasa Ichikawa, Takuya Hirano (Gakushuin Univ.), Toyohiro Tsurumaru (Mitsubishi Electric) |
Physical random numbers generated by using quantum measurement are in principle impossible to predict.We have demonstra... [more] | |
| SDM | 2015-10-29 16:00 |
Miyagi | Niche, Tohoku Univ. | Electrical Properties of MOSFETs Introducing Atomically Flat Gate Insulator/Silicon Interface Tetsuya Goto, Rihito Kuroda, Tomoyuki Suwa, Akinobu Teramoto, Toshiki Obara, Daiki Kimoto, Shigetoshi Sugawa (Tohoku Univ.), Yutaka Kamata, Yuki Kumagai, Katsuhiko Shibusawa (LAPIS Semi. Miyagi) SDM2015-74 |
Atomically flattening technology was introduced to the widely-used complementary metal oxide silicon (CMOS) process empl... [more] | SDM2015-74 pp.17-22 |
| CCS | 2015-08-07 10:45 |
Hokkaido | Dai-ichi Takimotokan (Noboribetsu, Hokkaido) | Discrete Fourier Transform Test Based on the Simultaneous Use of Multiple Sequences Hiroki Okada, Ken Umeno (Kyoto Univ.) CCS2015-42 |
In this paper, we review the problems in the Discrete Fourier Transform (DFT) test included in SP800-22 released by ... [more] |
CCS2015-42 pp.73-78 |
| IPSJ-CSEC, ISEC, SITE, ICSS, EMM, IPSJ-SPT [detail] | 2015-07-02 11:05 |
Aichi | NAGOYA TRADE & INDUSTRY CENTER | Chosen Initial Vector Attack against Pseudorandom Number Generator QP-DYN Kenichi Arai, Yasutaka Igarashi, Toshinobu Kaneko (Tokyo Univ of Science) ISEC2015-11 SITE2015-9 ICSS2015-21 EMM2015-19 |
QP--DYN is a new pseudorandom number generator (PRNG) proposed by Ohya and Accardi. In 2014, Iriyama and Ohya introduce... [more] |
ISEC2015-11 SITE2015-9 ICSS2015-21 EMM2015-19 pp.15-21 |
| PRMU, BioX | 2015-03-20 14:00 |
Kanagawa | Training of Random Forests Using Covariate Shift on Parallel Distributed Processing Ryoji Wakayama (Chubu Univ.), Akisato Kimura (NTT), Takayoshi Yamashita, Yuji Yamauchi, Hironobu Fujiyoshi (Chubu Univ.) BioX2014-73 PRMU2014-193 |
Machine learning with big data improves a classification performance but increases computatinal cost for learning. Paral... [more] | BioX2014-73 PRMU2014-193 pp.205-210 |
|
| ICSS | 2015-03-04 09:50 |
Okinawa | Meio Univiersity | A study on the safety of the pseudo-random number generator in RFID Hiroyuki Sato (JAIST), Atsuko Miyaji (JAIST/JST CREST), Chunhua Su (JAIST) ICSS2014-75 |
One of the ways of verifing that whether pseudo-random number generator (PRNG) meets the security requirements or not is... [more] | ICSS2014-75 pp.73-78 |
| RECONF, CPSY, VLD, IPSJ-SLDM [detail] | 2015-01-29 18:00 |
Kanagawa | Hiyoshi Campus, Keio University | CF3: Test suite for arithmetic optimization of C compilers Yusuke Hibino, Nagisa Ishiura (KGU) VLD2014-130 CPSY2014-139 RECONF2014-63 |
This article presents a compiler test suite "CF3," which targets arithmetic optimization, especially constant folding, o... [more] | VLD2014-130 CPSY2014-139 RECONF2014-63 pp.117-122 |
| RECONF, CPSY, VLD, IPSJ-SLDM [detail] | 2015-01-30 11:30 |
Kanagawa | Hiyoshi Campus, Keio University | Detecting Missed Arithmetic Optimization Opportunities Using Random Testing of C Compilers Atsushi Hashimoto, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2014-139 CPSY2014-148 RECONF2014-72 |
This article presents new methods of detecting missed arithmetic optimization opportunities of C compilers by random tes... [more] | VLD2014-139 CPSY2014-148 RECONF2014-72 pp.169-174 |
| ET | 2014-10-18 15:40 |
Ishikawa | Kanazawa Univ. (Kakuma Campus) | Study on Automatic Grading of Programming Assignments on Random Algorithms Saburo Higuchi (Ryukoku Univ.) ET2014-48 |
We discuss automatic grading of programming assignments with blackbox testing. For programs that involve random algorit... [more] |
ET2014-48 pp.59-60 |
| SDM | 2014-10-17 13:50 |
Miyagi | Niche, Tohoku Univ. | Analysis of trap density causing random telegraph noise in MOSFETs Toshiki Obara, Akinobu Teramoto, Rihito Kuroda, Akihiro Yonezawa, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2014-93 |
The incidence ratio of Random Telegraph Noise in 131,072 MOSFETs was evaluated statistically by using array test circuit... [more] | SDM2014-93 pp.55-59 |
| EA | 2014-08-19 13:30 |
Miyagi | Tohoku Gakuin Univ. | Towards sentence intelligibility tests under long-path echoes and its estimation method without transmission characteristics. Yosuke Kobayashi (Miyakonojo NCT), Noritaka Takahashi, Kazuhiro Kondo (Yamagata Univ.) EA2014-13 |
In this paper, we propose a sentence intelligibility evaluation method for outdoors public address systems. For this, we... [more] | EA2014-13 pp.7-12 |
| SANE | 2013-12-03 09:30 |
Overseas | VAST/VNSC(2nd Dec.) & Melia Hotel (3rd Dec), Hanoi, Vietnam | Random vibration analysis of the F-2 nanosatellite structure Thuong Nguyen Van, Hung Nguyen Viet, Khanh Nguyen Phu, Tuan Le Anh (HUST) SANE2013-95 |
A random vibration analysis of a Nanosatellite structure in the launch phase is presented in this paper. The objective o... [more] | SANE2013-95 pp.139-144 |
| SS, IPSJ-SE | 2013-10-25 13:30 |
Ishikawa | Efficient random test case generation for constrained interaction testing Yasuhiro Hirasaki, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) SS2013-45 |
This paper discusses interaction testing using random testing. Random testing can generate test cases very fast, but d... [more] |
SS2013-45 pp.163-166 |
|
| IT | 2013-05-24 14:45 |
Fukui | Hotel Matuya Sensen at Awara-onsen, Fukui Pref. | String complexity based on reduplicative parsing and its application to randomness testing Shigeru Maya, Hirosuke Yamamoto (Univ. of Tokyo) IT2013-8 |
A randomness test based on LZ-compelxity was included in the NIST statistical test suite. However, it was removed becaus... [more] | IT2013-8 pp.35-40 |
| VLD | 2013-03-06 10:30 |
Okinawa | Okinawa Seinen Kaikan | A worst-case-aware design methodology for oscillator-based true random number generator with stochastic behavior modeling Takehiko Amaki, Masanori Hashimoto (Osaka Univ.), Yukio Mitsuyama (Kochi Univ. of Tech.), Takao Onoye (Osaka Univ.) VLD2012-154 |
This paper presents a worst-case-aware design methodology for an oscillator-based true random number generator (TRNG) ro... [more] | VLD2012-154 pp.99-104 |
| CPSY, VLD, RECONF, IPSJ-SLDM [detail] | 2013-01-16 15:35 |
Kanagawa | Scaling the size of Expressions in Random Testing of Arithmetic Optimization of C Compilers Eriko Nagai, Atsushi Hashimoto, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2012-117 CPSY2012-66 RECONF2012-71 |
This paper presents an enhanced method of testing validity of arithmetic optimization of C compilers using random progra... [more] | VLD2012-117 CPSY2012-66 RECONF2012-71 pp.57-62 |
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