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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| IA, SITE, IPSJ-IOT [detail] | 2020-03-03 10:30 |
Online | Online | A Study on Efficient Blind Search Utilizing the Rendezvous of Random Walk Agents Fumiya Toyoda, Yusuke Sakumoto, Hiroyuki Ohsaki (Kwansei Gakuin Univ)  SITE2019-96 IA2019-74 |
A blind search is a search method for a network, without using topology information of an entire network. While a blind... [more] | SITE2019-96 IA2019-74 pp.99-104 |
| NLC, IPSJ-NL, SP, IPSJ-SLP (Joint) [detail] |
2019-12-06 13:55 |
Tokyo | NHK Science & Technology Research Labs. | [Poster Presentation]
Estimation of three-dimensional tongue shape from midsagittal tongue contour using regression models Tatsuya Kitamura (Konan Univ.), Hisanori Makinae (NRIPS), Masashi Ito (TIT) SP2019-40 |
In this study, we investigated methods to estimate the tongue contours of the outer sagittal planes from a midsagittal t... [more] | SP2019-40 pp.67-72 |
| CS | 2019-07-04 09:00 |
Kagoshima | Amami City Social Welfare Center | Analyzing MAC address randomization for Wi-Fi signal based mobile device tracking Yuki Furuya, Hiromu Asahina, Kentaroh Toyoda, Iwao Sasase (Keio Univ.) CS2019-17 |
Analyzing facility usage through Wi-Fi signals of users’ mobile devices has become controversial but common. Although W... [more] |
CS2019-17 pp.25-29 |
| SDM, ED, CPM | 2019-05-17 11:10 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Experimental Study on Optimization of 2D Random Nanostructure Formation and Electrical Readout for Nano Artifact Metrics Renpeng Lu, Katsumi Shimizu, Xiang Yin (Hokkaido Univ.), Yosuke Ueba, Mikio Ishikawa, Mitsuru Kitamura (DNP), Seiya Kasai (Hokkaido Univ.) ED2019-24 CPM2019-15 SDM2019-22 |
For nano-artifact metrics utilizing resist collapse in nanometer-scale electron beam lithography, we investigate lithogr... [more] | ED2019-24 CPM2019-15 SDM2019-22 pp.67-70 |
| HWS, VLD | 2019-03-01 10:50 |
Okinawa | Okinawa Ken Seinen Kaikan | Reinforcing Generation of Instruction Sequences in Random Testing of Android Virtual Machine Ryotaro Shimizu, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2018-124 HWS2018-87 |
This article presents a method of reinforcing generation of instruction sequences in random testing of the Android virtu... [more] | VLD2018-124 HWS2018-87 pp.187-192 |
| NLP, NC (Joint) |
2019-01-23 11:00 |
Hokkaido | The Centennial Hall, Hokkaido Univ. | Performance Evaluation of Chaotic Random Numbers Using Integer Logistic Map by NIST Test Shiki Kanamaru (TUS), Yutaka Shimada (Saitama Univ.), Kantaro Fujiwara (UT), Tohru Ikeguchi (TUS) NLP2018-100 |
In this report, we generated pseudorandom numbers using chaotic dynamics and investigated its performance as pseudorando... [more] | NLP2018-100 pp.23-28 |
| SITE, ISEC, LOIS | 2018-11-03 11:30 |
Fukuoka | A Study on a New Evaluation Tool for Pseudo Random Number Generators based on Neural Network Hayato Kimura (Tokai Univ.), Takanori Isobe (Univ. of Hyogo), Toshihiro Ohigashi (Tokai Univ.) ISEC2018-65 SITE2018-43 LOIS2018-25 |
Security of stream cipher depends on PRNG (Pseudo Random Number Generator) of the stream cipher. There are evaluation me... [more] | ISEC2018-65 SITE2018-43 LOIS2018-25 pp.7-12 |
|
| CAS, NLP | 2018-10-18 15:05 |
Miyagi | Tohoku Univ. | Effects of numerical precision on statistical performance of chaotic random numbers Shiki Kanamaru (TUS), Yutaka Shimada (Saitama Univ.), Kantaro Fujiwara (UT), Tohru Ikeguchi (TUS) CAS2018-45 NLP2018-80 |
We investigated the possibility of generating a pseudo random number sequence with good performance by using chaotic dyn... [more] | CAS2018-45 NLP2018-80 pp.45-50 |
| QIT (2nd) |
2018-06-04 13:20 |
Hiroshima | ICCH Ran | [Poster Presentation]
Certifying Quantum Randomness by Probability Estimation Yanbao Zhang (NTT-BRL), Emanuel Knill, Peter Bierhorst (NIST) |
We introduce probability estimation, a broadly applicable framework to certify randomness in a finite sequence of mea... [more] |
|
| MBE, NC, NLP (Joint) |
2018-01-26 13:25 |
Fukuoka | Kyushu Institute of Technology | Methods for Constructing Simple Undirected Regular Graphs Based on Generalized de Bruijn Graphs Ryoya Ishii, Norikazu Takahashi (Okayama Univ.) NLP2017-90 |
The Generalized de Bruijn Graphs (GDBG) are a class of directed regular graphs. Since the average shortest path length o... [more] | NLP2017-90 pp.23-28 |
| IPSJ-ARC, VLD, CPSY, RECONF, IPSJ-SLDM [detail] | 2018-01-19 16:15 |
Kanagawa | Raiosha, Hiyoshi Campus, Keio University | Reinforcing Generation of Control Flow Statements in Random Test System of C Compilers Based on Equivalence Transformation Mitsuyoshi Iwatsuji, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2017-87 CPSY2017-131 RECONF2017-75 |
This article proposes a method of reinforcing generation of control statements in random testing of compilers based on e... [more] | VLD2017-87 CPSY2017-131 RECONF2017-75 pp.163-168 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 09:50 |
Kumamoto | Kumamoto-Kenminkouryukan Parea | On low power oriented test pattern compaction using SAT solver Yusuke Matsunaga (Kyushu Univ.) VLD2017-43 DC2017-49 |
This paper proposes a test pattern compaction method under power consumption constraint, which uses SAT solver based ... [more] |
VLD2017-43 DC2017-49 pp.95-99 |
| SDM | 2017-10-26 14:00 |
Miyagi | Niche, Tohoku Univ. | Analysis of Random Telegraph Noise Behaviors toward Changes of Source Follower Transistor Operation Conditions using High Accuracy Array Test Circuit Shinya Ichino, Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shunichi Wakashima, Shigetoshi Sugawa (Tohoku Univ.) SDM2017-60 |
Behaviors of random telegraph noise (RTN) occurs at CMOS image sensors’ in-pixel source follower transistors (SF) toward... [more] | SDM2017-60 pp.57-62 |
| SIP, CAS, MSS, VLD | 2017-06-20 14:50 |
Niigata | Niigata University, Ikarashi Campus | SAT model sampling for test pattern generation considering signal transition activities Yusuke Matsunaga (Kyushu Univ.) CAS2017-21 VLD2017-24 SIP2017-45 MSS2017-21 |
This paper presents a test pattern generation method with considering signal transition activities using a SAT solver... [more] |
CAS2017-21 VLD2017-24 SIP2017-45 MSS2017-21 pp.107-112 |
| PRMU, CNR | 2017-02-19 11:20 |
Hokkaido | [Poster Presentation]
Online algorithm of swallowing detection using close-range depth sensor Tsubasa Takai, Tomoya Sakai, Misako Higashijima (Nagasaki Univ) PRMU2016-183 CNR2016-50 |
We are developing an online algorithm of detecting and counting swallowing motions from a depth image sequence for cont... [more] |
PRMU2016-183 CNR2016-50 pp.163-164 |
|
| SP, IPSJ-SLP, NLC, IPSJ-NL (Joint) [detail] |
2016-12-22 09:30 |
Tokyo | NTT Musashino R&D | AI-based Japanese Short-answer Scoring and Support System Tsunenori Ishioka, Masayuki Kameda (NCUEE), Dongyue Louis Liu (GRI) NLC2016-36 |
We have developed an automated Japanese short-answer scoring and support machine for new National Center Test written ex... [more] | NLC2016-36 pp.87-92 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:30 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46 |
We propose a circuit analysis method using the bimodal RTN (random telegraph noise) model of the defect-centric distri... [more] |
VLD2016-52 DC2016-46 pp.49-54 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 09:50 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | On SAT based test pattern generation for transition faults considering signal activities Yusuke Matsunaga (Kyushu Univ.) VLD2016-63 DC2016-57 |
This paper presents a test pattern generation method with considering signal transition activities using a SAT solver... [more] |
VLD2016-63 DC2016-57 pp.111-115 |
| DC | 2016-06-20 14:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Random Test Pattern Generation based on Entropy Toshiaki Ohmameuda (Nat. Inst. Tech., Gunma Coll.) DC2016-13 |
In this paper the random test pattern generation method based on entropy is proposed. The circuits in this paper are c... [more] |
DC2016-13 pp.19-23 |
| PRMU, IE, MI, SIP | 2016-05-20 14:40 |
Aichi | Sequential Pool-Design for Adaptive Boolean Compressive Sensing Yohei Kawaguchi, Masahito Togami (Hitachi) SIP2016-27 IE2016-27 PRMU2016-27 MI2016-27 |
A new method for solving adaptive Boolean compressive sensing is proposed. A conventional method determining a pool for... [more] |
SIP2016-27 IE2016-27 PRMU2016-27 MI2016-27 pp.141-145 |
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