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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| NLP | 2024-05-09 13:15 |
Kagawa | Kagawa Prefecture Social Welfare Center | Application of Unidirectionally Coupled Phase Oscillators in a Ring to Central Pattern Generator Takumi Yoshioka, Kentaro Takeda (Kagawa Univ.) |
(To be available after the conference date) [more] | |
| PRMU | 2021-10-09 11:15 |
Online | Online | Path dependence of latent personal characteristic features in swiping behavior Kazuki Sakai, Josuke Kuroiwa, Tomohiro Odaka, Haruhiko Sirai (Fukui Univ.), Izumi Suwa (Jin-ai Women's College)  PRMU2021-23 |
The purpose of this paper is to investigate the path dependency of personal authentication using latent personal charact... [more] | PRMU2021-23 pp.40-45 |
| NC, MBE (Joint) |
2021-03-04 15:25 |
Online | Online | Examination of measurement method and feature of biometrics identification with eye movement Yudai Niitsu, Minoru Nakayama (Tokyo Tech) MBE2020-49 |
Biometric identification using eye movement has been attracting attention as a highly secure identification method with ... [more] | MBE2020-49 pp.44-47 |
| BioX | 2019-10-03 14:45 |
Okinawa | [Short Paper]
A Study on biometric information effective for user authentication using gesture pattern Daiki Izumoto, Yasushi Yamazaki (Kitakyushu Univ.) BioX2019-57 |
Pattern lock, which is one of the personal authentication methods using a touch panel of a smartphone, is convenient and... [more] | BioX2019-57 pp.17-18 |
|
| KBSE, SS, IPSJ-SE [detail] | 2018-07-18 09:40 |
Hokkaido | Proposal of a usage investigation tool of similar coding pattern Koki Ogasawara, Tetsuya Kanda, Katsuro Inoue (Osaka Univ) SS2018-1 KBSE2018-11 |
Coding pattern is a code snippet that appears repeatedly in source code. Reusing coding pattern helps software developer... [more] | SS2018-1 KBSE2018-11 pp.1-6 |
|
| RECONF, CPSY, DC, IPSJ-ARC (Joint) [detail] |
2017-05-24 10:15 |
Hokkaido | Noboribetsu-Onsen Dai-ichi-Takimoto-Kan | Deterministic Path Delay Measurement Using Short Cycle Test Pattern for Aging Detection Kentaro Kato, Umi Mori (NIT) CPSY2017-12 DC2017-12 |
hort cycle test pattern can sensitize target paths deterministically and periodically in short interval. It is useful to... [more] | CPSY2017-12 DC2017-12 pp.69-74 |
| SCE | 2017-04-21 13:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An RSFQ Pattern Matching Circuit Based on Systolic Architecture Kazuyoshi Takagi, Masaya Ohata, Naofumi Takagi (Kyoto Univ.) SCE2017-7 |
We propose a regular expression pattern matching circuit using rapid single flux quantum (RSFQ) circuit. Proposed circu... [more] |
SCE2017-7 pp.35-39 |
| CCS | 2015-11-09 15:30 |
Kyoto | Inamori Foundation Memorial Building, Kyoto Univ. | Common-noise-induced synchronization of oscillator networks and its optimization Yoji Kawamura (JAMSTEC), Hiroya Nakao (Tokyo Tech) CCS2015-53 |
We investigate common-noise-induced synchronization between two identical networks of coupled phase oscillators exhibiti... [more] | CCS2015-53 pp.47-51 |
| BioX, ITE-ME, ITE-IST | 2015-06-30 11:30 |
Ishikawa | Kanazawa University, Kakuma Campus | A Further Approach toward Pattern Lock Resistant against Shoulder Surfing So Higashikawa, Tomoaki Kosugi, Masahiro Mambo (Kanazawa Univ.) BioX2015-12 |
Mobile terminals adopt a login authentication called pattern lock, which achieves both high resistance to brute force at... [more] | BioX2015-12 pp.85-89 |
| ICD, IPSJ-ARC | 2014-03-07 10:15 |
Aichi | Flexible Word-Parallel Euclidean Distance Search Associative Memory for Applications with Varying Dimensionality of Reference Vectors Toshinobu Akazawa, Hans Jurgen Mattausch (Hiroshima Univ.) ICD2013-138 |
The reported fully word-parallel associative memory architecture for nearest Euclidean distance (ED) search, which has f... [more] | ICD2013-138 pp.33-37 |
|
| DC | 2014-02-10 15:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Test Data Reduction Method for BIST-Aided Scan Test by Controlling Scan Shift and Partial Reset of Inverter Code Ryota Mori, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) DC2013-88 |
BIST-aided scan test (BAST) has been proposed as one of the techniques that enhances scan-based BIST. The BAST architect... [more] | DC2013-88 pp.55-60 |
| ICD | 2014-01-28 15:00 |
Kyoto | Kyoto Univ. Tokeidai Kinenkan | [Poster Presentation]
Digital Word-Parallel Associative Memory for Smallest Euclidean Distance Search and Architecture verification in 180nm/65nm CMOS Toshinobu Akazawa, Hans Juergen Mattausch (Hiroshima Univ.) ICD2013-132 |
The reported digital word-parallel associative memory architecture for nearest Euclidean distance (ED) search is based o... [more] | ICD2013-132 p.77 |
| ICD | 2014-01-29 14:00 |
Kyoto | Kyoto Univ. Tokeidai Kinenkan | Development of a Learning and Recognition SoC Based on the k Nearest-Neighbor Algorithm with High-Speed, Low-Power and Error-Free Operation Shogo Yamasaki, Toshinobu Akazawa, Fengwei An, Hans Juergen Mattausch (Hiroshima Univ) ICD2013-136 |
In this study, we propose the hardware implementation of the k-nearest neighbor method on an SoC with learning and recog... [more] | ICD2013-136 pp.85-88 |
| SS, IPSJ-SE | 2012-11-01 13:40 |
Hiroshima | Hiroshima City University | A discussion of fault patterns for concurrent systems Han-Myung Chang, Masami Noro, Atsushi Sawada, Atsushi Yoshida, Yoshinari Hachisu, Reishi Yokomori (Nanzan Univ.) SS2012-40 |
In model checking, when a model checker fails to verify deadlock free, or some safety property or liveness property, its... [more] | SS2012-40 pp.41-46 |
| MRIS, ITE-MMS | 2012-10-19 08:55 |
Akita | AIT | [Invited Talk]
5Tb/in2 Bit Patterned Media Fabricated by a Directed Self-Assembling Polymer Mask Yoshiyuki Kamata, Tomoyuki Maeda, Hiroyuki Hieda, Ryosuke Yamamoto, Naoko Kihara, Akira Kikitsu (Toshiba corp.) MR2012-25 |
FePt bit patterned media (BPM) was fabricated with a self-assembled polymer mask with 12 nm pitch (equivalent to 5 Tdot/... [more] | MR2012-25 pp.43-48 |
| NC | 2012-07-31 11:10 |
Shiga | Ritsumeikan Univ. College of Information Science and Engineering | Detection of M-sequences from cell cultures Yoshi Nishitani (Osaka Univ.), Chie Hosokawa (AIST), Yuko Mizuno-Matsumoto (Univ. of Hyogo), Tomomitsu Miyoshi, Hajime Sawai, Shinichi Tamura (Osaka Univ.) NC2012-27 |
We consider that the memory is composed of feedback shift register (FSR) circuit in the cerebral cortex. In this study, ... [more] | NC2012-27 pp.71-76 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-29 10:15 |
Miyazaki | NewWelCity Miyazaki | A BIST-Aided Scan Test using Shifting Inverter Code and a TPG Method for Test Data Reduction Yasuhiko Okada, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) VLD2011-74 DC2011-50 |
BIST-aided scan test (BAST) has been proposed as one of the techniques that enhance scan-based BIST.The BAST architectur... [more] | VLD2011-74 DC2011-50 pp.133-138 |
| SS | 2011-10-28 10:30 |
Ishikawa | JAIST | A discussion of inspections based on patterns for CSP descriptions Han-Myung Chang, Masami Noro, Atsushi Sawada, Atsushi Yoshida, Yoshinari Hachisu, Reishi Yokomori (Nanzan Univ.) SS2011-35 |
In model checking, when a model checker fails to verify deadlock free, or some safety property or liveness property, its... [more] | SS2011-35 pp.49-54 |
| IA | 2010-08-06 14:25 |
Tokyo | IIJ Kanda Jinbocho Bldg. | Network Application Identification using Sequential Transition Patterns of Payload Length Tsuyoshi Sato, Yuji Waizumi, Kazuyuki Tanaka (Tohoku Univ.) IA2010-23 |
Recently, increasing of information leakages caused by illegal use of network applications have been reported．To prevent... [more] | IA2010-23 pp.41-46 |
| CPM | 2010-07-29 15:20 |
Hokkaido | Michino-Eki Shari Meeting Room | Proposal and Experimental Evaluation of A Novel Method for Eye-Pattern Improvement on Transmission Lines Masami Ishiguro, Yuki Shimauchi, Noriyuki Aibe (Tsukuba Univ.), Ikuo Yoshihara (Miyazaki Univ.), Moritoshi Yasunaga (Tsukuba Univ.) CPM2010-34 |
Recently GHz frequency signal is required to be propagated in the PCB (printed circuit board) with low distortions. To o... [more] | CPM2010-34 pp.17-22 |
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