Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HWS |
2024-04-19 16:25 |
Tokyo |
(Primary: On-site, Secondary: Online) |
Non-Destructive Hardware Trojan Inspection by Backside Near Infrared Imaging Junichi Sakamoto, Yohei Hori, Shinichi Kawamura (AIST), Yuichi Hayashi (NAIST), Makoto Nagata (KU) HWS2024-5 |
Hardware Trojan detection is a critical topic for maintaining the security of IC supply chain. Previous studies have rep... [more] |
HWS2024-5 pp.18-23 |
CPM |
2024-02-29 15:05 |
Yamagata |
Yamagata University (Primary: On-site, Secondary: Online) |
Shape estimation of magnetic interference fringes using images of magnetooptical microscope Tsubasa Ebihara, Yuya Suzuki, Yuichi Nakamura, Lim PangBoey (Toyohashi Tech) CPM2023-109 |
In order to improve the performance of magnetic hologram memory, it is necessary to quantitatively evaluate the magnetiz... [more] |
CPM2023-109 pp.54-57 |
HWS, ICD |
2022-10-25 11:50 |
Shiga |
(Primary: On-site, Secondary: Online) |
Optical Microscopic Observation of Semiconductor Devices toward Hardware Trojan Detection Hirofumi Sakane, Junichi Sakamoto, Shinichi Kawamura (AIST), Makoto Nagata (Kobe Univ.), Yuichi Hayashi (NAIST) HWS2022-34 ICD2022-26 |
In this paper we focus on detection of hardware Trojan (HT) in semiconductor devices under a scenario with following ste... [more] |
HWS2022-34 ICD2022-26 pp.23-28 |
OME, IEE-DEI |
2022-07-18 15:00 |
Nagano |
Karuizawa-machi Tourism promotion center (Primary: On-site, Secondary: Online) |
[Invited Talk]
Evaluation of depth resolution in structured illumination microscope based on 3D-printed flexure stages Tatsunosuke Matsui, Daigo Fujiwara (Mie Univ.) OME2022-17 |
Recently, various types of 3D-printable optical microscopes have been reported. Many of those are open-sourced, therefor... [more] |
OME2022-17 pp.16-21 |
OME, IEE-DEI, IEE-EFM |
2022-02-10 14:25 |
Online |
Online |
Low-cost fabrication of structured illumination microscope using 3D-printed flexure stage Daigo Fujiwara, Tatsunosuke Matui (Mie Univ.) OME2021-57 |
The OpenFlexure stage and microscope, which is open source and can be replicated by 3D printing, uses a flexure mechanis... [more] |
OME2021-57 pp.14-19 |
OPE, LQE |
2020-11-20 15:30 |
Online |
Online |
Short pulse operation of self holding magneto-optical switch Shun Yajima, Daiki Kano, Murai Toshiya, Yuya Shoji, Nobuhiko Nishiyama, Mizumoto Tetsuya (Titech) OPE2020-49 LQE2020-29 |
We investigate a coplanar waveguide to apply short-pulse electric current for driving self-holding magneto-optical (MO) ... [more] |
OPE2020-49 LQE2020-29 pp.17-22 |
CPM |
2019-02-28 14:40 |
Tokyo |
|
Surface observation of coating iron garnet film using by the Scanning Electron Microscope Daiki Nakasuji, Yuya Funaki, Hiroki Shimamoto, Toshiya Itaya (SNIT), Kousuke Nishimoto, Yuichi Nakamura, Hironaga Uchida (TUT), Ryosuke Hashimoto (SNIT) CPM2018-106 |
Magneto-optical (MO) imaging is a useful non-destructive testing method that can visualize defect two-dimensionally with... [more] |
CPM2018-106 pp.23-25 |
EST, MW, OPE, MWP, EMT, IEE-EMT, THz [detail] |
2018-07-19 10:35 |
Hokkaido |
|
High precision infrared refractive index measurement using Nano-antenna Hibiki Kagami, Tomohiro Amemiya, Keisuke Masuda, Nobuhiko Nishiyama, Shigehisa Arai (Tokyo Tech) EMT2018-21 MW2018-36 OPE2018-24 EST2018-19 MWP2018-20 |
‘Infrared refractive index’ is an indispensable parameter for various fields including infrared photonics. However, to d... [more] |
EMT2018-21 MW2018-36 OPE2018-24 EST2018-19 MWP2018-20 pp.77-82 |
EMD, R |
2014-02-21 13:55 |
Osaka |
|
Three-dimensional comparisons of damage shapes on Ag and AgSnO2 contact surfaces caused by break arc discharges Makoto Hasegawa, Daichi Kawamura (Chitose Inst. of Science and Tech.) R2013-86 EMD2013-142 |
Observation and evaluation of changes (damage growth) on contact surfaces caused by arc discharges are important for rea... [more] |
R2013-86 EMD2013-142 pp.13-18 |
EMD |
2013-11-17 09:25 |
Overseas |
Huazhong University of Science and Technology, Wuhan, P.R.China |
Three-dimensional observation of damage shapes caused by break arcs on Ag and AgSnO2 contact surfaces Daichi Kawamura, Makoto Hasegawa (Chitose Inst. of Science & Tech.) EMD2013-104 |
A growth process of damage shapes (specifically growth of a crater) on a cathode surface of a Ag contact pair and a AgSn... [more] |
EMD2013-104 pp.119-122 |
OME |
2013-10-11 16:00 |
Osaka |
Osaka Univ. Nakanoshima Center |
Application of nonuniformity in optical texture of nematic and chiral nematic liquid crystals for security Keizo Nakayama (Kinki Univ.), Junji Ohtsubo (Shizuoka Univ.) OME2013-65 |
Various optical textures that reflect the nonuniformity of the molecular orientation can be observed using a polarizing ... [more] |
OME2013-65 pp.73-76 |
LQE, LSJ |
2013-05-17 15:45 |
Ishikawa |
|
Spectrum measurement using optically trapped gold nanoparticle Akira Sato, Yoshio Hayasaki (Utsunomiya Univ.) LQE2013-13 |
Gold nanoparticle cause localized surface plasmon resonance, which enhances an incident wave. The scattering light spect... [more] |
LQE2013-13 pp.57-61 |
EMD |
2012-05-25 15:50 |
Miyagi |
Tohoku Bunka Gakuen Univ. |
An experimental study on an optical measurement system for damages on contact surfaces (II) Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science and Technology) EMD2012-6 |
For the purpose of realizing, during switching operations, observation and evaluation of growth processes of a crater an... [more] |
EMD2012-6 pp.27-30 |
EMD, R |
2012-02-17 11:25 |
Kyoto |
|
An experimental study on an optical measurement system for damages on contact surfaces Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science and Technology) R2011-44 EMD2011-118 |
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] |
R2011-44 EMD2011-118 pp.13-18 |
OFT, OCS (Joint) |
2011-08-25 13:15 |
Hokkaido |
|
Novel inspection technique for cleaved optical fiber ends based on Fabry-Perot interferometer Hiroshi Watanabe, Mitsuru Kihara, Masanori Tanaka, Masanobu Toyonaga (NTTEAST) OFT2011-16 |
We propose an inspection technique for cleaved optical fiber ends based on the Fabry-Perot interferometer. An inspected ... [more] |
OFT2011-16 pp.1-6 |
OPE, EMT, LQE, PN, IEE-EMT |
2010-01-29 17:30 |
Kyoto |
|
Label-free imaging of biological samples by stimulated Raman scattering microscopy Yasuyuki Ozeki, Kazuyoshi Itoh (Osaka Univ.) PN2009-66 OPE2009-204 LQE2009-186 |
We have recently developed a technique of label-free imaging of biological samples using stimulated Raman scattering (SR... [more] |
PN2009-66 OPE2009-204 LQE2009-186 pp.167-172 |
ED, LQE, CPM |
2009-11-19 13:05 |
Tokushima |
Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) |
High spatial resolution PL mapping of {11-22} InGaN quantum wells by scanning near-field optical microscope Akio Kaneta, Masaya Ueda, Mitsuru Funato, Yoichi Kawakami (Kyoto Univ.) ED2009-135 CPM2009-109 LQE2009-114 |
Spatially resolved photoluminescence mapping was performed for c plane and {11-22} InGaN/GaN quantum wells (QWs) by a sc... [more] |
ED2009-135 CPM2009-109 LQE2009-114 pp.35-38 |
PN, OPE, OFT, LQE |
2005-01-26 12:35 |
Osaka |
Osaka University |
Optical response of microwave transistors and the application to ultrafast optical detectors Daisuke Nakata, Hiroshi Murata, Yasuyuki Okamura (Osaka Univ.) |
Optical mixing in microwave transistors has been studied and their applications to high-speed optical signal detectors a... [more] |
PN2004-76 OFT2004-82-1 OPE2004-183 LQE2004-130 pp.1-6 |