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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| VLD, HWS, ICD | 2024-03-01 11:15 |
Okinawa | (Primary: On-site, Secondary: Online) |
Investigation of electromagnetic irradiation noise reduction by on-chip LDOs Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.)  VLD2023-124 HWS2023-84 ICD2023-113 |
IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions (faults) by injecting il... [more] | VLD2023-124 HWS2023-84 ICD2023-113 pp.131-134 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2022-11-29 15:05 |
Kumamoto | (Primary: On-site, Secondary: Online) |
Evaluation of power delivery networks in secure semiconductor systems Masaru Mashiba, Kazuki Monta (Kobe Univ.), Takaaki Okidono (SCU), Takuzi Miki, Makoto Nagata (Kobe Univ.) VLD2022-33 ICD2022-50 DC2022-49 RECONF2022-56 |
With the development of the IoT, hardware security is becoming increasingly important. Physical attacks on cryptoprocess... [more] | VLD2022-33 ICD2022-50 DC2022-49 RECONF2022-56 pp.82-86 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2021-12-01 14:45 |
Online | Online | Diagnosis of Switching-Induced IR Drop by On-Chip Voltage Monitors Kazuki (Kobe Univ.), Leonidas Kataselas (Aristotle Univ.), Ferenc Fodor (IMEC), Alkis Hatzopoulos (Aristotle Univ.), Makoto Nagata (Kobe Univ.), Erik Jan Marinissen (IMEC) VLD2021-31 ICD2021-41 DC2021-37 RECONF2021-39 |
On-chip monitor (OCM) circuits enable us to observe dynamic power-supply (PS) waveforms within power domains individuall... [more] | VLD2021-31 ICD2021-41 DC2021-37 RECONF2021-39 pp.83-86 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-18 14:25 |
Online | Online | On-chip power supply noise monitoring for evaluation of multi-chip board power delivery networks Daichi Nakagawa, Kazuki Yasuda, Masaru Mashiba, Kazuki Monta, Takaaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univ) VLD2020-31 ICD2020-51 DC2020-51 RECONF2020-50 |
In these days, information and communication technology has been evolving more and more, and hardware security has been ... [more] | VLD2020-31 ICD2020-51 DC2020-51 RECONF2020-50 pp.115-117 |
| SDM, ICD, ITE-IST [detail] | 2019-08-09 12:00 |
Hokkaido | Hokkaido Univ., Graduate School /Faculty of Information Science and | Evaluation of IC-Chip Noise Reduction using Magnetic Materials Kosuke Jike, Koh Watanabe, Satoshi Tanaka, Noriyuki Miura, Makoto Nagata (Kobe Univ), Akihiro Takahashi, Yasunori Miyazawa, Masahiro Yamaguchi (Tohoku Univ) SDM2019-49 ICD2019-14 |
Suppression of noise emitted from digital integrated circuit (IC) chip is expected by using magnetic materials. The freq... [more] | SDM2019-49 ICD2019-14 pp.79-83 |
| ICD, SDM | 2012-08-02 14:40 |
Hokkaido | Sapporo Center for Gender Equality, Sapporo, Hokkaido | Intra/Inter Tier Substrate Noise Measurements in 3D ICs Yasumasa Takagi, Yuuki Araga, Makoto Nagata (Kobe Univ.), Geert Van der Plas, Jaemin Kim, Nikolaos Minas, Pol Marchal, Michael Libois, Antonio La Manna, Wenqi Zhang, Julien Ryckaert, Eric Beyne (IMEC) SDM2012-72 ICD2012-40 |
Substrate noise propagation among stacked dice is evaluated in a 3D test vehicle of 2 tier stacking. Each tier incorpora... [more] | SDM2012-72 ICD2012-40 pp.49-54 |
| ICD | 2011-12-16 15:25 |
Osaka | [Invited Talk]
Power Noise in VLSI Chip
-- from Silicon Substrate to Electromagnetic Environment -- Makoto Nagata (Kobe Univ.) ICD2011-131 |
Power noise of VLSI chips will be discussed, in terms of chip-package-board concurrent and integrated analysis as well a... [more] | ICD2011-131 pp.143-148 |
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| ICD, ITE-IST | 2010-07-22 09:30 |
Osaka | Josho Gakuen Osaka Center | On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration Takushi Hashida, Hiroshi Matsumoto, Makoto Nagata (Kobe Univ.) ICD2010-21 |
On-chip waveform capture exhibits the resolution of 10 ps and 200 uV with 1024 steps, and SFDR of 63.2dB in 700-MHz sign... [more] | ICD2010-21 pp.1-4 |
| VLD, IPSJ-SLDM | 2008-05-09 10:00 |
Hyogo | Kobe Univ. | [Invited Talk]
NoizeProblems in LSI Design:Challenges and Approaches Makoto Nagata (Kobe Univ.) |
Digital designs intending high-speed and low-power consumption necessarily deal with dynamic power supply noise, for suc... [more] | VLD2008-7 pp.1-6 |
| ICD, VLD | 2007-03-07 17:00 |
Okinawa | Mielparque Okinawa | On-chip monitoring for sub-100-nm digital signal integrity Yoji Bando, Koichiro Noguchi, Makoto Nagata (Kobe Univ.) |
A compact on-chip signal monitor circuit uses voltage mode sensing by a source follower circuit with small input device ... [more] | VLD2006-116 ICD2006-207 pp.61-66 |
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