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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 23  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
RCC, ISEC, IT, WBS 2023-03-14
09:25
Yamaguchi
(Primary: On-site, Secondary: Online)
A Study on Application of Multi-Receiver System in Meteor Burst Communication
Takumi Kayama, Kaiji Mukumoto, Tadahiro Wada (Shizuoka Univ.) IT2022-69 ISEC2022-48 WBS2022-66 RCC2022-66
Meteor burst communication(MBC) is an over-the-horizon communication using the reflection phenomenon of low VHF radio wa... [more] IT2022-69 ISEC2022-48 WBS2022-66 RCC2022-66
pp.7-12
NLC 2022-03-07
10:40
Online Online Analysis of Seasonal Interests of Foreign Tourists to Hiroshima Prefecture Using Flickr
Ai Yokoyama, Aya Ishino (HUE) NLC2021-29
In recent years, it has become common for people to take photos using smartphones at their travel destinations and share... [more] NLC2021-29
pp.7-12
HWS, VLD [detail] 2020-03-04
16:25
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Machine Learning Based Lithography Hotspot Detection Method and Evaluation
Hidekazu Takahashi, Shimpei Sato, Atsushi Takahashi (Tokyo Tech) VLD2019-106 HWS2019-79
As VLSI device feature sizes are getting smaller and smaller, layout design
has become more important to keep the yield... [more]
VLD2019-106 HWS2019-79
pp.71-76
HWS, VLD [detail] 2020-03-04
16:50
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Additional Training Data Generation for Lithography Hotspot Detection by Modifying Existing Training Data
Gaku Kataoka, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hiroshima City Univ.) VLD2019-107 HWS2019-80
In lithography, a circuit pattern that is highly likely to cause an undesired open- and short-circuit after transfer is ... [more] VLD2019-107 HWS2019-80
pp.77-82
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-15
16:10
Ehime Ehime Prefecture Gender Equality Center Analysis of databases used for hot spot test cases
Hiroki Ogura, Hidekazu Takahashi, Sinpei Sato, Atsushi Takahashi (Tokyo Tech) VLD2019-52 DC2019-76
With the miniaturization of semiconductor circuit patterns, the importance of photolithography has increased. In the sta... [more] VLD2019-52 DC2019-76
pp.191-196
KBSE 2019-01-26
11:45
Tokyo NII A hot-spot consolidation method for simplifying frameworks
Naoto Kono (Waseda Univ), Kouichi Ono (IBM TRL), Yoshiaki Fukazawa (Waseda Univ) KBSE2018-47
Frameworks will be revised as necessary according to feedback and change requests from users as application software dev... [more] KBSE2018-47
pp.25-30
ED, LQE, CPM 2018-11-29
14:40
Aichi Nagoya Inst. tech. Scanning internal photoemission microscopy measurements of n-GaN Schottky contacts under applying voltage
Kenji Shiojima, Masataka Maeda (Univ. of Fukui), Tomoyoshi Mishima (Hosei Univ.) ED2018-36 CPM2018-70 LQE2018-90
We applied scanning internal photoemission microscopy (SIPM) method to characterize the initial stage of the degradation... [more] ED2018-36 CPM2018-70 LQE2018-90
pp.17-20
SIS 2017-12-15
11:10
Tottori Tottori Prefectural Center for Lifelong Learning Improvement of passing-by object removal using time-series images
Hiroaki Ishino, Mami Nagoya, Tomoaki Kimura, Hiroyuki Tsuji (KAIT) SIS2017-51
Moving objects such as passersby, automobiles, etc. sometimes happen to be in the photo, when taking pictures of landsca... [more] SIS2017-51
pp.101-106
LOIS 2017-03-03
09:00
Okinawa N.Ohama Memorial Hall The influence Analysis of Social Media on Tourism -- Case Study of Instagram Posted Contents --
Ayami Tao, Akihisa Kodate (Tsuda College) LOIS2016-83
Sightseeing has become more diverse. The places where movies and TVdramas are filmed or the locations for animation stor... [more] LOIS2016-83
pp.117-122
VLD 2017-03-02
10:55
Okinawa Okinawa Seinen Kaikan Acceleration of a Hotspot Detection Method Based on Approximate String Matching for LSI Mask Pattern Using Table Reference
Shuma Tamagawa, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hirohima City Univ.) VLD2016-112
In nanoscale LSI fabrication, there exists a pattern on the mask pattern, called a hotspot, which leads to a failure.
H... [more]
VLD2016-112
pp.61-66
VLD 2017-03-02
11:20
Okinawa Okinawa Seinen Kaikan Efficient Local Pattern Modification Method using FM Algorithm in LELE Double Patterning
Atsushi Ogashira, Shimpei Sato, Atsushi Takahashi (Tokyo TECH) VLD2016-113
In current semiconductor design, high quality and short time design is required.
In an advanced lithography technology... [more]
VLD2016-113
pp.67-72
PRMU, IPSJ-CVIM, MVE [detail] 2017-01-20
15:35
Kyoto   Detection of Hotspots for Machine Operations from First Person Vision Records
Chen Long-fei, Kazuaki Kondo, Yuichi Nakamura (Kyoto Univ.), Dima Damen, Walterio W. Mayol-Cuevas (Bristol Univ.) PRMU2016-149 MVE2016-40
This paper introduces a novel idea of unsupervised hotspots detection of machine operation in first person vision (FPV) ... [more] PRMU2016-149 MVE2016-40
pp.339-344
ASN, MoNA, MICT
(Joint)
2017-01-19
14:50
Oita   Method of simple screening Measurement for Radiation Wireless Monitoring by Applying Non-linear Estimation
Yoshitsugu Nakagawa, Chisato Murakami (TIRI), Kazuyuki Mori, Haruhiko Sato (ING) ASN2016-74
Five years have passed since the Fukushima nuclear power plant accident, and the decontamination project in disaster are... [more] ASN2016-74
pp.31-36
CPM, LQE, ED 2016-12-12
13:25
Kyoto Kyoto University Observation of Initial Stage of Degradation in Au/Ni/n-GaN Schottky Diodes Using Scanning Internal Photoemission Microscopy
Kenji Shiojima, Shingo Murase, Masataka Maeda (Univ. of Fukui), Tomoyoshi Mishima (Hosei Univ.) ED2016-58 CPM2016-91 LQE2016-74
We characterized an early stage of interface degradation by high-reverse-voltage application in Au/Ni/n-GaN Schottky con... [more] ED2016-58 CPM2016-91 LQE2016-74
pp.5-8
CS, CQ, NV
(Joint)
2016-04-22
13:25
Tokyo Kikai-Shinko-Kaikan Bldg. On a Hybrid Packets-and-Circuits Switching Logic
Marat Zhanikeev (Tokyo Univ. of Science) CS2016-8
The packets versus circuits argument is several decades old. Back in the day, what we today refer to as all-IP networki... [more] CS2016-8
pp.43-46
VLD 2016-03-02
10:55
Okinawa Okinawa Seinen Kaikan Lithography Hotspot Detection Using Histogram of Oriented Light Propagation
Yoichi Tomioka (UoA), Tetsuaki Matsunawa (Toshiba) VLD2015-136
In recent semiconductor manufacturing process, it is essential to detect and to remove lithography hotspots, which induc... [more] VLD2015-136
pp.143-148
HCGSYMPO
(2nd)
2015-12-16
- 2015-12-18
Toyama Toyama International Conference Center DyPRoS : Dynamic Photo Rogaining System for Sharing Local Information.
Yuki Matsuda, Yutaka Arakawa, Keiichi Yasumoto (NAIST)
In recently, many tourist spots start utilizing an information technology for activating the spot. However, the most of ... [more]
CQ, CS
(Joint)
2015-04-21
09:40
Fukuoka Fukuoka Institute of Technology The Next Generation of Networks is all about Hotspot Distributions and Cut-Through Circuits
Marat Zhanikeev (Kyutech) CQ2015-1
With BigData and otherwise bulky transfers between data centers, traffic in current networks has turned into a hotspot d... [more] CQ2015-1
pp.1-4
VLD 2014-03-04
13:20
Okinawa Okinawa Seinen Kaikan [Invited Talk] Advanced Model-Based Hotspot Fix Flow for Layout Optimization with Genetic Algorithm
Shuhei Sota (Toshiba Microelectronics), Taiga Uno, Masanari Kajiwara, Chikaaki Kodama (Toshiba), Hirotaka Ichikawa (Toshiba Microelectronics), Ryota Aburada, Toshiya Kotani (Toshiba), Kei Nakagawa, Tamaki Saito (Toshiba Microelectronics) VLD2013-148
Under the low-k1 lithography process, many hotspots are generated and their reduction is an urgent issue for mass produc... [more] VLD2013-148
p.85
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-26
11:20
Fukuoka Centennial Hall Kyushu University School of Medicine A Temperature-Aware High-Level Synthesis Algorithm for Regular-Distributed-Register Architectures based on Accurate Energy Consumption Estimation
Kazushi Kawamura, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2012-61 DC2012-27
With process technology scaling, heat problems in IC chips as well as increasing the average interconnection delays are ... [more] VLD2012-61 DC2012-27
pp.13-18
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