Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
RCC, ISEC, IT, WBS |
2023-03-14 09:25 |
Yamaguchi |
(Primary: On-site, Secondary: Online) |
A Study on Application of Multi-Receiver System in Meteor Burst Communication Takumi Kayama, Kaiji Mukumoto, Tadahiro Wada (Shizuoka Univ.) IT2022-69 ISEC2022-48 WBS2022-66 RCC2022-66 |
Meteor burst communication(MBC) is an over-the-horizon communication using the reflection phenomenon of low VHF radio wa... [more] |
IT2022-69 ISEC2022-48 WBS2022-66 RCC2022-66 pp.7-12 |
NLC |
2022-03-07 10:40 |
Online |
Online |
Analysis of Seasonal Interests of Foreign Tourists to Hiroshima Prefecture Using Flickr Ai Yokoyama, Aya Ishino (HUE) NLC2021-29 |
In recent years, it has become common for people to take photos using smartphones at their travel destinations and share... [more] |
NLC2021-29 pp.7-12 |
HWS, VLD [detail] |
2020-03-04 16:25 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Machine Learning Based Lithography Hotspot Detection Method and Evaluation Hidekazu Takahashi, Shimpei Sato, Atsushi Takahashi (Tokyo Tech) VLD2019-106 HWS2019-79 |
As VLSI device feature sizes are getting smaller and smaller, layout design
has become more important to keep the yield... [more] |
VLD2019-106 HWS2019-79 pp.71-76 |
HWS, VLD [detail] |
2020-03-04 16:50 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Additional Training Data Generation for Lithography Hotspot Detection by Modifying Existing Training Data Gaku Kataoka, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hiroshima City Univ.) VLD2019-107 HWS2019-80 |
In lithography, a circuit pattern that is highly likely to cause an undesired open- and short-circuit after transfer is ... [more] |
VLD2019-107 HWS2019-80 pp.77-82 |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-15 16:10 |
Ehime |
Ehime Prefecture Gender Equality Center |
Analysis of databases used for hot spot test cases Hiroki Ogura, Hidekazu Takahashi, Sinpei Sato, Atsushi Takahashi (Tokyo Tech) VLD2019-52 DC2019-76 |
With the miniaturization of semiconductor circuit patterns, the importance of photolithography has increased. In the sta... [more] |
VLD2019-52 DC2019-76 pp.191-196 |
KBSE |
2019-01-26 11:45 |
Tokyo |
NII |
A hot-spot consolidation method for simplifying frameworks Naoto Kono (Waseda Univ), Kouichi Ono (IBM TRL), Yoshiaki Fukazawa (Waseda Univ) KBSE2018-47 |
Frameworks will be revised as necessary according to feedback and change requests from users as application software dev... [more] |
KBSE2018-47 pp.25-30 |
ED, LQE, CPM |
2018-11-29 14:40 |
Aichi |
Nagoya Inst. tech. |
Scanning internal photoemission microscopy measurements of n-GaN Schottky contacts under applying voltage Kenji Shiojima, Masataka Maeda (Univ. of Fukui), Tomoyoshi Mishima (Hosei Univ.) ED2018-36 CPM2018-70 LQE2018-90 |
We applied scanning internal photoemission microscopy (SIPM) method to characterize the initial stage of the degradation... [more] |
ED2018-36 CPM2018-70 LQE2018-90 pp.17-20 |
SIS |
2017-12-15 11:10 |
Tottori |
Tottori Prefectural Center for Lifelong Learning |
Improvement of passing-by object removal using time-series images Hiroaki Ishino, Mami Nagoya, Tomoaki Kimura, Hiroyuki Tsuji (KAIT) SIS2017-51 |
Moving objects such as passersby, automobiles, etc. sometimes happen to be in the photo, when taking pictures of landsca... [more] |
SIS2017-51 pp.101-106 |
LOIS |
2017-03-03 09:00 |
Okinawa |
N.Ohama Memorial Hall |
The influence Analysis of Social Media on Tourism
-- Case Study of Instagram Posted Contents -- Ayami Tao, Akihisa Kodate (Tsuda College) LOIS2016-83 |
Sightseeing has become more diverse. The places where movies and TVdramas are filmed or the locations for animation stor... [more] |
LOIS2016-83 pp.117-122 |
VLD |
2017-03-02 10:55 |
Okinawa |
Okinawa Seinen Kaikan |
Acceleration of a Hotspot Detection Method Based on Approximate String Matching for LSI Mask Pattern Using Table Reference Shuma Tamagawa, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hirohima City Univ.) VLD2016-112 |
In nanoscale LSI fabrication, there exists a pattern on the mask pattern, called a hotspot, which leads to a failure.
H... [more] |
VLD2016-112 pp.61-66 |
VLD |
2017-03-02 11:20 |
Okinawa |
Okinawa Seinen Kaikan |
Efficient Local Pattern Modification Method using FM Algorithm in LELE Double Patterning Atsushi Ogashira, Shimpei Sato, Atsushi Takahashi (Tokyo TECH) VLD2016-113 |
In current semiconductor design, high quality and short time design is required.
In an advanced lithography technology... [more] |
VLD2016-113 pp.67-72 |
PRMU, IPSJ-CVIM, MVE [detail] |
2017-01-20 15:35 |
Kyoto |
|
Detection of Hotspots for Machine Operations from First Person Vision Records Chen Long-fei, Kazuaki Kondo, Yuichi Nakamura (Kyoto Univ.), Dima Damen, Walterio W. Mayol-Cuevas (Bristol Univ.) PRMU2016-149 MVE2016-40 |
This paper introduces a novel idea of unsupervised hotspots detection of machine operation in first person vision (FPV) ... [more] |
PRMU2016-149 MVE2016-40 pp.339-344 |
ASN, MoNA, MICT (Joint) |
2017-01-19 14:50 |
Oita |
|
Method of simple screening Measurement for Radiation Wireless Monitoring by Applying Non-linear Estimation Yoshitsugu Nakagawa, Chisato Murakami (TIRI), Kazuyuki Mori, Haruhiko Sato (ING) ASN2016-74 |
Five years have passed since the Fukushima nuclear power plant accident, and the decontamination project in disaster are... [more] |
ASN2016-74 pp.31-36 |
CPM, LQE, ED |
2016-12-12 13:25 |
Kyoto |
Kyoto University |
Observation of Initial Stage of Degradation in Au/Ni/n-GaN Schottky Diodes Using Scanning Internal Photoemission Microscopy Kenji Shiojima, Shingo Murase, Masataka Maeda (Univ. of Fukui), Tomoyoshi Mishima (Hosei Univ.) ED2016-58 CPM2016-91 LQE2016-74 |
We characterized an early stage of interface degradation by high-reverse-voltage application in Au/Ni/n-GaN Schottky con... [more] |
ED2016-58 CPM2016-91 LQE2016-74 pp.5-8 |
CS, CQ, NV (Joint) |
2016-04-22 13:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
On a Hybrid Packets-and-Circuits Switching Logic Marat Zhanikeev (Tokyo Univ. of Science) CS2016-8 |
The packets versus circuits argument is several decades old. Back in the day, what we today refer to as all-IP networki... [more] |
CS2016-8 pp.43-46 |
VLD |
2016-03-02 10:55 |
Okinawa |
Okinawa Seinen Kaikan |
Lithography Hotspot Detection Using Histogram of Oriented Light Propagation Yoichi Tomioka (UoA), Tetsuaki Matsunawa (Toshiba) VLD2015-136 |
In recent semiconductor manufacturing process, it is essential to detect and to remove lithography hotspots, which induc... [more] |
VLD2015-136 pp.143-148 |
HCGSYMPO (2nd) |
2015-12-16 - 2015-12-18 |
Toyama |
Toyama International Conference Center |
DyPRoS : Dynamic Photo Rogaining System for Sharing Local Information. Yuki Matsuda, Yutaka Arakawa, Keiichi Yasumoto (NAIST) |
In recently, many tourist spots start utilizing an information technology for activating the spot. However, the most of ... [more] |
|
CQ, CS (Joint) |
2015-04-21 09:40 |
Fukuoka |
Fukuoka Institute of Technology |
The Next Generation of Networks is all about Hotspot Distributions and Cut-Through Circuits Marat Zhanikeev (Kyutech) CQ2015-1 |
With BigData and otherwise bulky transfers between data centers, traffic in current networks has turned into a hotspot d... [more] |
CQ2015-1 pp.1-4 |
VLD |
2014-03-04 13:20 |
Okinawa |
Okinawa Seinen Kaikan |
[Invited Talk]
Advanced Model-Based Hotspot Fix Flow for Layout Optimization with Genetic Algorithm Shuhei Sota (Toshiba Microelectronics), Taiga Uno, Masanari Kajiwara, Chikaaki Kodama (Toshiba), Hirotaka Ichikawa (Toshiba Microelectronics), Ryota Aburada, Toshiya Kotani (Toshiba), Kei Nakagawa, Tamaki Saito (Toshiba Microelectronics) VLD2013-148 |
Under the low-k1 lithography process, many hotspots are generated and their reduction is an urgent issue for mass produc... [more] |
VLD2013-148 p.85 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-26 11:20 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
A Temperature-Aware High-Level Synthesis Algorithm for Regular-Distributed-Register Architectures based on Accurate Energy Consumption Estimation Kazushi Kawamura, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2012-61 DC2012-27 |
With process technology scaling, heat problems in IC chips as well as increasing the average interconnection delays are ... [more] |
VLD2012-61 DC2012-27 pp.13-18 |