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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2023-02-28 11:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.)  DC2022-83 |
(To be available after the conference date) [more] | DC2022-83 pp.6-11 |
| DC | 2022-12-16 13:10 |
Yamaguchi | (Primary: On-site, Secondary: Online) |
On Improving the Accuracy of LSI Small Delay Fault Diagnosis Shinnosuke Fujita, Stefan Holst, Xiaoqing Wen (Kyutech) DC2022-72 |
With today's tight timing margins, increasing manufacturing variation, and the development of nanometer technology, timi... [more] | DC2022-72 pp.1-6 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:50 |
Online | Online | A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage Yuya Chida, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) CPSY2021-57 DC2021-91 |
As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been propose... [more] | CPSY2021-57 DC2021-91 pp.73-78 |
| RCS, SR, NS, SeMI, RCC (Joint) |
2021-07-16 14:55 |
Online | Online | [Invited Lecture]
Machine Learning based Automatic Command Control System for Fault Diagnosis of Communication Services Hiroshi Yamauchi (SoftBank), Tatsuaki Kimura (Osaka Univ.) RCC2021-40 NS2021-56 RCS2021-98 SR2021-40 SeMI2021-29 |
Due to the recent growth of various network services of telecommunication carriers, their communication networks have be... [more] | RCC2021-40 NS2021-56 RCS2021-98 SR2021-40 SeMI2021-29 pp.83-87(RCC), pp.124-128(NS), pp.104-108(RCS), pp.106-110(SR), pp.82-86(SeMI) |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2021-03-26 11:00 |
Online | Online | An Estimation Method of a Defect Types for Suspected Fault Lines in Logical Faulty VLSI Using Neural Networks Natsuki Ota, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.), Yukari Yamauchi, Masayuki Arai (Nihon Univ.) CPSY2020-61 DC2020-91 |
Since fault diagnosis methods for specified fault models might cause misprediction and non-prediction, a fault diagnosis... [more] | CPSY2020-61 DC2020-91 pp.67-72 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2021-03-26 11:20 |
Online | Online | A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level Kohei Tsuchibuchi, Toshinori Hosokawa (Nihon Univ), Koji Yamazaki (Meiji Univ.) CPSY2020-62 DC2020-92 |
With the progress of semiconductor technology in recent years, fault analysis is important to improve the yield of VLSIs... [more] | CPSY2020-62 DC2020-92 pp.73-78 |
| KBSE, SS, IPSJ-SE [detail] | 2018-07-18 11:05 |
Hokkaido | A Fault Diagnosis of A Distributed Cooperative System by Learning State Transitions Yosuke Watanabe (Nagoya Univ.), Shuichi Sato (TCRDL), Hiroyuki Seki, Shoji Yuen (Nagoya Univ.) SS2018-3 KBSE2018-13 |
Due to the spread of IoT and the development of connected cars, it is common for a system to be composed of many coopera... [more] | SS2018-3 KBSE2018-13 pp.13-18 |
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| DC | 2017-02-21 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | IR-Drop Analysis on Different Power Supply Network Designs Kohei Miyase, Kiichi Hamasaki (Kyutech), Matthias Sauer (University of Freiburg), Ilia Polian (University of Passau), Bernd Becker (University of Freiburg), Xiaoqing Wen, Seiji kajihara (Kyutech) DC2016-75 |
The shrinking feature size and low power design of LSI make LSI testing very difficult. Further development of LSI techn... [more] | DC2016-75 pp.7-10 |
| DC | 2017-02-21 11:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Built-In Self Diagnosis Architecture for Logic Design Keisuke Kagawa, Fumiya Yano, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Satoshi Ohtake (Oita Univ.) DC2016-76 |
Recently, roles of automotive LSI to realize a functional safety of vehicle are increasing. In order to guarantee the fu... [more] | DC2016-76 pp.11-16 |
| ASN, MoNA, MICT (Joint) |
2017-01-20 14:40 |
Oita | Defect Causal Analysis in Solar Panel using Thermal Image : A Deep Learning Approach Seungho Lee, Makoto Suzuki, Hiroyuki Morikawa (UTokyo) ASN2016-87 |
Deteriorated solar panels cause not only decreasing of power generation but also significantly safety concerns such as c... [more] | ASN2016-87 pp.95-100 |
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| DC | 2015-02-13 16:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg | An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) DC2014-86 |
Multi-cycle capture testing has been proposed to improve test quality of scan testing. However, fault diagnosis for mult... [more] | DC2014-86 pp.49-54 |
| DC | 2012-06-22 14:20 |
Tokyo | Room B3-1 Kikai-Shinko-Kaikan Bldg | [Invited Talk]
Empirical study for signal integrity-defects Hiroshi Takahashi, Yoshinobu Higami (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. Tokushima) DC2012-12 |
We try to empirically study signal integrity-defects. In this study, we analyze the resistive open fault that causes th... [more] |
DC2012-12 pp.21-26 |
| R | 2011-05-13 17:15 |
Kochi | Kochi City Culture-Plaza Cul-Port | Candidate Fault Portions Detection using CMOS Transistor Operation Point Analysis Kazuaki Kishi, Masaru Sanada (KUT) R2011-14 |
We have developed fault diagnosis software with easy operation, high diagnosis accuracy and fast processing speed. The t... [more] | R2011-14 pp.35-40 |
| EMD | 2010-11-12 09:15 |
Overseas | Xi'an Jiaotong University | Calculation of Characteristic Parameters and Research of Fault Diagnosis for Aircraft Wires Existed Insulation Defects Zhang Junmin, Zhou Xiaomeng (Beihang Univ.) EMD2010-100 |
Characteristic impedance and reflection coefficients of different insulation faults have been calculated in single core ... [more] | EMD2010-100 pp.137-142 |
| EMD | 2010-11-12 16:00 |
Overseas | Xi'an Jiaotong University | Study on test technology of electrical life for low-voltage circuit breaker Li Kui, Huang Shaopo, Li Wenhua, Yuan Jinli (Hebei Univ. of Tech.), Zhang Gang (Changcheng Electrical Equipment Group), Shi Cunming (Yueqing Jingtai Test Equipment) EMD2010-121 |
Test technology of life for low-voltage circuit breaker is studied, including mechanical life and electrical life. A com... [more] | EMD2010-121 pp.227-230 |
| EMD | 2010-11-12 17:45 |
Overseas | Xi'an Jiaotong University | Development of Fault Modeling Platform and Inference System for Electrical Control System Yuan Haibin, Yuan Haiwen, Liu Yingyi (Beihang Univ.) EMD2010-127 |
Aim to dealing with prognosis health management for electrical equipment or electrical control system, a fault modeling ... [more] | EMD2010-127 pp.251-254 |
| SCE | 2010-07-22 11:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fault Modeling and Test Generation for Single Flux Quantum Logic Circuits Nobutaka Kito (Kyoto Univ.), Masamitsu Tanaka, Kazuyoshi Takagi (Nagoya Univ.), Naofumi Takagi (Kyoto Univ.) SCE2010-19 |
This report discusses fault modeling and test generation for Single Flux Quqntum(SFQ) logic circuits. SFQ circuits ar... [more] |
SCE2010-19 pp.31-35 |
| NC, NLP, IPSJ-BIO [detail] | 2010-06-19 15:10 |
Okinawa | Ryukyu-daigaku-gozyu-syunen-kinenn-kaikan | Probabilistic Fault Diagnosis in Large Scale Multicomputer Systems Manabu Kobayashi, Toshinori Takabatake, Shinya Amano (Shonan Inst. of Tech.), Shigeichi Hirasawa (Cyver Univ.) NLP2010-23 NC2010-23 |
F.P.Preparata et al.\ have proposed a fault diagnosis model to find all fault nodes in the multiprocessor system by usin... [more] | NLP2010-23 NC2010-23 pp.205-210 |
| DC | 2010-02-15 15:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | High Speed X-Fault Diagnosis with Partial X-Resolution Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.) DC2009-76 |
Defects behavior of ultra small size and high speed LSI is getting complicated. It makes localization of fault site and ... [more] | DC2009-76 pp.69-74 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-03 13:25 |
Kochi | Kochi City Culture-Plaza | Detection of Fault Candidate portions by DEF data Visualization Kazuaki Kishi, Masaru Sanada (Kochi Univ. of Tech.) VLD2009-53 DC2009-40 |
Line information visualized using DEF data, and layout data of unique fault formations makes it possible to indicate fa... [more] | VLD2009-53 DC2009-40 pp.85-88 |
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