Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HWS |
2024-04-19 15:25 |
Tokyo |
(Primary: On-site, Secondary: Online) |
Applying Ring Oscillator-based Laser Detection Sensor to AES Circuitry on FPGA Shungo Hayashi, Junichi Sakamoto, Tsutomu Matsumoto (AIST/YNU) HWS2024-3 |
(To be available after the conference date) [more] |
HWS2024-3 pp.8-13 |
VLD, HWS, ICD |
2024-03-01 10:10 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Fault Detectable Convolutional Neural Network Circuits With Dual Modular Redundancy Based on Mixed-precision Quantization Yamato Saikawa, Yuta Owada, Yoichi Tomioka, Hiroshi Saito, Yukihide Kohira (UoA) VLD2023-122 HWS2023-82 ICD2023-111 |
In safety-critical edge AI systems, circuit failures caused by aging or cosmic ray can lead to serious accidents. Dual M... [more] |
VLD2023-122 HWS2023-82 ICD2023-111 pp.119-124 |
VLD, HWS, ICD |
2024-03-01 11:40 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Improved Ring Oscillator Sensor for Laser Fault Injection Detection on FPGA Masaki Chikano (YNU), Shungo Hayashi, Junichi Sakamoto (YNU/AIST), Tsutomu Matsumoto (YNU) VLD2023-125 HWS2023-85 ICD2023-114 |
A fault attack is an attack that intentionally injects a fault into an operating device in order to leak internal confid... [more] |
VLD2023-125 HWS2023-85 ICD2023-114 pp.135-140 |
ICD, HWS |
2023-10-31 14:20 |
Mie |
(Primary: On-site, Secondary: Online) |
Evaluation of Time-to-Digital Converter in Laser Fault Injection Detection on FPGA Shungo Hayashi, Junichi Sakamoto (YNU/AIST), Masaki Chikano, Tsutomu Matsumoto (YNU) HWS2023-56 ICD2023-35 |
Fault injection attacks are attacks that intentionally introduce faults into a running device in order to expose interna... [more] |
HWS2023-56 ICD2023-35 pp.10-15 |
RCS, IN, NV (Joint) |
2023-05-25 11:55 |
Kanagawa |
Keio University (Hiyoshi Campus), and online (Primary: On-site, Secondary: Online) |
Failure Intermediate Node Detection and Notification Methods in Wireless Multihop Network Riki Okase, Hiroaki Higaki (Tokyo Denki Univ.) IN2023-5 |
This paper proposes novel methods for failure node detection and its notification in a wireless multihop network.
By ex... [more] |
IN2023-5 pp.23-28 |
EMCJ, IEE-EMC, IEE-SPC |
2023-05-12 17:20 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Fault Location using Deep Learning for TDR Waveforms in Overhead Distribution Systems with Few Branches Tohlu Matsushima, Daiki Nagata, Yuki Fukumoto (Kyutech), Takashi Hisakado (Kyoto Univ), Uki Kanenari, Tsuyoshi Iinuma, Yusuke Nishihiro (Kansai Transmission and Distribution, Inc.), Shin Toguchi (DAIHEN Corporation) EMCJ2023-11 |
Equipment using the TDR method is being developed to accelerate detection of faults in overhead distribution systems.
H... [more] |
EMCJ2023-11 pp.25-30 |
HWS |
2023-04-14 15:35 |
Oita |
(Primary: On-site, Secondary: Online) |
Object Generation - Backdoor Attack against Object-Detection DNN Triggered by Fault Injection into MIPI Takumi Takubo, Tatsuya Oyama, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) HWS2023-6 |
Backdoor attacks that induce misclassification by poisoning training data and adding specific patterns (trigger marks) t... [more] |
HWS2023-6 pp.20-25 |
RCS, SR, SRW (Joint) |
2023-03-02 10:50 |
Tokyo |
Tokyo Institute of Technology, and Online (Primary: On-site, Secondary: Online) |
A Numerical Study of Quantum Speedup for Maximum Likelihood Detection of Power-Domain NOMA Masaya Norimoto, Naoki Ishikawa (Yokohama National Univ.) SR2022-86 |
We investigate whether a quantum exhaustive search algorithm, Grover adaptive search (GAS), provides quadratic speedup i... [more] |
SR2022-86 pp.11-15 |
HWS, VLD |
2023-03-04 10:00 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Importance of Inverters Placement in Ring-Oscilator for Laser Irradiation Detection Shungo Hayashi (YNU), Junichi Sakamoto (AIST/YNU), Masaki Chikano, Tsutomu Matsumoto (YNU) VLD2022-115 HWS2022-86 |
Laser fault injection is known as the most efficient fault injection technique due to its high spatial controllability a... [more] |
VLD2022-115 HWS2022-86 pp.233-238 |
CPSY, IPSJ-ARC |
2023-01-10 14:40 |
Online |
Online |
Survay of the Relationship between the Number of Page Faults and UX on PC Usage Shodai Masaki, Hayato Nomura (NITAC) CPSY2022-29 |
With the goal of developing software that can detect PC operating speed degradation, performance shortages, and the need... [more] |
CPSY2022-29 pp.13-14 |
EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] |
2022-07-19 17:05 |
Online |
Online |
Security Evaluation of Cryptographic Circuits with Laser Sensors by Double-Spot Laser Irradiation Masaki Chikano, Naoki Yoshida, Junichi Sakamoto, Syungo Hayashi, Tsutomu Matsumoto (YNU) ISEC2022-16 SITE2022-20 BioX2022-41 HWS2022-16 ICSS2022-24 EMM2022-24 |
A fault injection attack is an attack method that intentionally injects faults into a device to cause it to malfunction,... [more] |
ISEC2022-16 SITE2022-20 BioX2022-41 HWS2022-16 ICSS2022-24 EMM2022-24 pp.52-57 |
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] |
2022-03-10 10:50 |
Online |
Online |
A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage Yuya Chida, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) CPSY2021-57 DC2021-91 |
As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been propose... [more] |
CPSY2021-57 DC2021-91 pp.73-78 |
R |
2021-11-30 14:50 |
Online |
Online |
Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab.), Shigeru Yamada (Tottori Univ.) R2021-38 |
IEC 61508 is widely known as the international standard for the functional safety of electrical/electronic/programmable ... [more] |
R2021-38 pp.24-29 |
RCS, SR, NS, SeMI, RCC (Joint) |
2021-07-16 14:55 |
Online |
Online |
[Invited Lecture]
Machine Learning based Automatic Command Control System for Fault Diagnosis of Communication Services Hiroshi Yamauchi (SoftBank), Tatsuaki Kimura (Osaka Univ.) RCC2021-40 NS2021-56 RCS2021-98 SR2021-40 SeMI2021-29 |
Due to the recent growth of various network services of telecommunication carriers, their communication networks have be... [more] |
RCC2021-40 NS2021-56 RCS2021-98 SR2021-40 SeMI2021-29 pp.83-87(RCC), pp.124-128(NS), pp.104-108(RCS), pp.106-110(SR), pp.82-86(SeMI) |
R |
2021-05-28 15:25 |
Online |
Online |
Software Reliability Analysis Based on Generalized Nonlinear Yule Processes Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2021-7 |
In this note, we consider two specific software reliability models (SRMs) with nonlinear modification, which are categor... [more] |
R2021-7 pp.35-40 |
ICD, HWS [detail] |
2020-10-26 13:00 |
Online |
Online |
Design of Efficient AES Hardware with Immediately Fault Detection Capability Yusuke Yagyu, Rei Ueno, Naofumi Homma (Tohoku Univ.) HWS2020-31 ICD2020-20 |
This paper presents an efficient AES encryption/decryption hardware architecture
with a fault detection scheme.
The pr... [more] |
HWS2020-31 ICD2020-20 pp.36-41 |
CPSY, DC, IPSJ-ARC [detail] |
2020-07-31 15:45 |
Online |
Online |
A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12 |
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] |
CPSY2020-12 DC2020-12 pp.75-80 |
HWS, VLD [detail] |
2020-03-05 10:30 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Motor Current Signature Analysis Based On-Line Fault Detection of DC Motor Naoki Osako (Kwansei Gakuin Univ.), Hiroyuki Kanbara (ASTEM), Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2019-111 HWS2019-84 |
This article presents a method for online detection of DC motors' fault based on current signature analysis.
While cu... [more] |
VLD2019-111 HWS2019-84 pp.101-106 |
HWS, VLD [detail] |
2020-03-06 14:30 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
A Test Generation Method for Resistive Open Faults Using Partial MAX-SAT solver Hiroshi Yamazaki, Yuta Ishiyama, Tatsuma Matsuta, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2019-131 HWS2019-104 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] |
VLD2019-131 HWS2019-104 pp.215-220 |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 16:10 |
Ehime |
Ehime Prefecture Gender Equality Center |
Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69 |
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test
(POST) is require... [more] |
VLD2019-45 DC2019-69 pp.145-150 |