| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ | 2018-07-27 15:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A study on measuring method of influence of contact force of contact points on signal transmission characteristics Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.)  EMCJ2018-32 |
When a contact point of a connector connecting electric devices has poor maintenance or degradation over time, it causes... [more] | EMCJ2018-32 pp.61-66 |
| EE | 2018-01-30 13:35 |
Oita | Satellite Campus Oita | Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation Hiroshi Nakao, Yu Yonezawa, Yoshiyasu Nakashima (Fujitsu LAB), Fujio Kurokawa (NiAS) EE2017-71 |
Electrolytic capacitors are known as one of the highest failure rate components in switching mode power supply SMPS). We... [more] | EE2017-71 pp.165-170 |
| EMD | 2016-10-21 15:15 |
Kanagawa | Phenomena on Contact Film Formation and the Surface Analysis Methods for Relay Contacts Takeshi Aoki (former TANAKA HD) EMD2016-48 |
Electrical contacts have been applied for speech path switches and control system relays in telephone exchange systems f... [more] | EMD2016-48 pp.13-17 |
|
| SDM, ICD | 2015-08-24 10:20 |
Kumamoto | Kumamoto City | Development of a compacted doubly nesting array in Narrow Scribe Line aimed at detecting soft failures of interconnect via Hiroki Shinkawata, Nobuo Tsuboi (REL), Atsushi Tsuda (RSD), Shingo Sato (Kansai), Yasuo Yamaguchi (REL) SDM2015-58 ICD2015-27 |
We introduce a new addressable test structure array using for mass production stage which is compacted doubly nesting ar... [more] | SDM2015-58 ICD2015-27 pp.7-10 |
| EMD | 2013-11-16 10:30 |
Overseas | Huazhong University of Science and Technology, Wuhan, P.R.China | Investigation of Noise Interference due to Connector Contact Failure in a Coaxial Cable Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2013-82 |
Increased inductance values and contact resistance in connector contact surfaces due to degradation of connector contact... [more] | EMD2013-82 pp.31-33 |
| EMCJ (2nd) |
2012-11-29 13:45 |
Tokyo | NICT | Evaluation of Resistance and Inductance at Loose Connector Contact Kazuya Uehara, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) |
Contact surface of a loose connector has both contact resistance and small inductance, and inductance depends on distrib... [more] | |
| EMD, R | 2012-02-17 11:00 |
Kyoto | An experimental study on contact resistance characteristics of relay contacts operated in the vicinity of a new acryl-based polymer Makoto Hasegawa, Nanae Kobayashi (Chitose Inst. of Science and Technology), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) R2011-43 EMD2011-117 |
The authors have already reported that when relays were operated to break load currents in vapors evaporated from a newl... [more] | R2011-43 EMD2011-117 pp.7-12 |
|
| R | 2011-11-18 14:10 |
Osaka | Temperature Humidity Test of Silver-Epoxy Isotropic Conductive Adhesive Takuya Hirata, Yuichi Aoki (ESPEC CORP.) R2011-35 |
To evaluate the reliability test condition for Isotropic Conductive Adhesive (ICA), we curried out various temperature h... [more] | R2011-35 pp.13-17 |
|
| EMD | 2011-11-17 17:10 |
Akita | Akita Univ. Tegata Campus | Contact Resistance Characteristics of Relays Operated in Vapors Evaporated from Cured Polymeric Products Nanae Kobayashi, Makoto Hasegawa (Chitose Inst. of Science & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka) EMD2011-85 |
The authors have already reported that when relays were operated to break load currents in vapors evaporated from an acr... [more] | EMD2011-85 pp.97-102 |
| ITE-ME, EMM, IE, LOIS, IEE-CMN [detail] | 2011-09-20 13:25 |
Ehime | Research of digital watermark to QR code Koichiro Karita, Akihiro Shimizu (Kochi Univ. of Tech.) LOIS2011-16 IE2011-49 EMM2011-27 |
Recently, the QR(Quick Response) code is published in the poster, the magazine, and the Web screen. It has been widely u... [more] | LOIS2011-16 IE2011-49 EMM2011-27 pp.7-10 |
|
| EMD, R | 2011-02-18 13:55 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka) R2010-44 EMD2010-145 |
Influences of vapors evaporated from an acryl-based non-silicone-type polymeric cured product and conventional silicone-... [more] | R2010-44 EMD2010-145 pp.13-18 |
| EMD | 2010-11-11 11:00 |
Overseas | Xi'an Jiaotong University | Failure process and dynamic reliability estimation of sealed relay Xuerong Ye, Jie Deng, Qiong Yu, Guofu Zhai (Harbin Inst. of Tech.) EMD2010-76 |
Usually the failure rate of a sealed relay is regarded as a constant value, no matter where and how it is used. However,... [more] | EMD2010-76 pp.41-44 |
| EMD | 2010-11-11 14:30 |
Overseas | Xi'an Jiaotong University | An experimental study on contact resistance characteristics of relay contacts operated in the vicinity of polymer materials Nanae Kobayashi, Makoto Hasegawa (Chitose Inst. of Science and Tech.), Yoshiyuki Kohno (Kaneka) EMD2010-85 |
A commercially-available mechanical relay (AgSnIn contacts) was sealed into a can with a silicone-containing polymer mat... [more] | EMD2010-85 pp.77-80 |
| EMD | 2010-11-12 14:15 |
Overseas | Xi'an Jiaotong University | On a Contact Failure Prediction and Reliability of Electrical Contacts Zhiling Yu, Takahiro Ueno, Kenya Jin'no (Nippon Inst. of Tech.) EMD2010-115 |
The contact devices are widely used in electrical circuits, and very important. For this reason, they are required high ... [more] | EMD2010-115 pp.201-204 |
| EMD, R | 2010-02-19 13:25 |
Osaka | An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III) Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.) R2009-52 EMD2009-119 |
Influences of vapors evaporated from a newly-developed acryl-based polymeric material (containing no silicone components... [more] | R2009-52 EMD2009-119 pp.13-18 |
|
| EMD | 2009-11-19 11:10 |
Tokyo | Nippon Institute of Technology, Kanda Campus, Tokyo, Japan | The Discrimination of Failure Mechanisms by Analyzing the Variations of Time Parameters for Relays Shujuan Wang, Qiong Yu, Guofu Zhai, Xiaochen Li (Harbin Inst. of Tech) EMD2009-74 |
Usually the contact voltage drop or contact resistance of electromagnetic relays is observed only to identify if the con... [more] | EMD2009-74 pp.21-24 |
| EMD | 2009-10-30 17:30 |
Tokyo | An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (II) Makoto Hasegawa, Takuma Matsuto, Megumi Fujiwara (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno (KANEKA Corp.) EMD2009-68 |
Silicone contamination is one of well-known reasons of contact failures. It has been reported that siloxane component e... [more] | EMD2009-68 pp.57-62 |
|
| EMD | 2009-07-17 15:20 |
Hokkaido | Chitose Arcadia Plaza | An experimental study on analysis of contact resistance data with Weibull distribution function Makoto Hasegawa (Chitose Inst. of Sci. and Tech.) EMD2009-25 |
In order to realize detailed analysis of measured contact resistance data, fitting of Weibull distribution function to c... [more] | EMD2009-25 pp.25-30 |
| EMD, R | 2009-02-20 15:15 |
Mie | Sumitomo Wiring Systems LTD., Head Office | An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts Makoto Hasegawa, Takuma Matsuto (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) R2008-54 EMD2008-130 |
Silicone contamination is one of well-known reasons of contact failures. It has been reported that siloxane component e... [more] | R2008-54 EMD2008-130 pp.59-64 |
| EMD | 2008-11-16 11:40 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | Pulse Response Characteristic of Connector Contact Failure on a Coaxial Cable Kouhei Ohmura, Yu-ichi Hayashi, Hideaki Sone (Tohoku Univ.), Jun Fan (Missouri Univ. Sci. Tech.) EMD2008-94 |
To evaluate electromagnetic noise interference on transmission line we proposed contact failure model in our previous st... [more] | EMD2008-94 pp.117-120 |
[Return to Top Page]