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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2019-02-27
09:50		 Tokyo Kikai-Shinko-Kaikan Bldg. A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73		 Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] DC2018-73
pp.13-18
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]		 2018-12-06
10:55		 Hiroshima Satellite Campus Hiroshima On the Generation of Random Capture Safe Test Vectors Using Neural Networks
Sayuri Ochi, Kenichirou Misawa, Toshinori Hosokawa, Yukari Yamauchi, Masayuki Arai (Nihon Univ.) VLD2018-51 DC2018-37		 Excessive capture power consumption at scan testing causes the excessive IR drop and it might cause test-induced yield l... [more] VLD2018-51 DC2018-37
pp.89-94
DC 2011-02-14
10:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors
Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60		 Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This h... [more] DC2010-60
pp.7-12
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