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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| PRMU | 2009-03-13 15:50 |
Miyagi | Tohoku Institute of Technology | Semi-supervised learning scheme using Dirichlet process EM-algorithm Tomoaki Kimura, Yohei Nakada (Waseda Univ.), Arnaud Doucet (ISM), Takashi Matsumoto (Waseda Univ.)  PRMU2008-251 |
Learning with dataset which contains both labeled data and unlabeled data is often called semi-supervised learning pro... [more] |
PRMU2008-251 pp.77-82 |
| MW, ED | 2009-01-16 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg | High-Power GaN-HEMT with High Three-Terminal Breakdown Voltage for W-band Applications Kozo Makiyama, Toshihiro Ohki, Masahito Kanamura, Kazukiyo Joshin, Kenji Imanishi (Fujitsu Ltd/Fujitsu Lab. Ltd.), Naoki Hara (Fujitsu Lab. Ltd.), Toshihide Kikkawa (Fujitsu Ltd/Fujitsu Lab. Ltd.) ED2008-221 MW2008-186 |
We reported on a technology to improve the three-terminal breakdown voltage of a GaN high electron mobility transistor (... [more] | ED2008-221 MW2008-186 pp.129-133 |
| EMD | 2008-11-16 14:00 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | The Effect of Power Supply Voltage on Arcing Duration of Relays Li Zhenbiao, Zhang Huan, Liang Panwang (Huazhong Univ. Sci. Tech.), Makoto Hasegawa (Chitose Inst. Sci. Tech.) EMD2008-98 |
In order to study the effect of power supply voltage on make & break duration of relays, the electrical contact experime... [more] | EMD2008-98 pp.133-136 |
| EMD | 2008-11-16 16:00 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | Break Arc Duration at Carbon Contacts in an Inductive Circuit
-- Discussion on Carbon Arc V-I Characteristics -- Keiichi Suhara (Tokyo National College of Tech.) EMD2008-102 |
Two different arc V-I characteristic equations are discussed about their applicability to calculation of break arc volta... [more] | EMD2008-102 pp.149-152 |
| EMCJ, EMD | 2008-07-18 16:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Magnetic drive by a small magnet of break arc occurring between electrical contacts in a DC42V/7-21A circuit Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.) EMCJ2008-49 EMD2008-31 |
Break arcs are generated between pure silver electrical contacts in a DC42V resistive circuit. The contacts are separate... [more] | EMCJ2008-49 EMD2008-31 pp.49-54 |
| RECONF | 2008-05-23 09:00 |
Fukushima | The University of Aizu | Designing And Evaluating Dynamically Reconfigurable Processor with Power Gating Technique Yoshiki Saito (Keio Univ.), Toshiaki Shirai (Shibaura Inst.), Takuro Nakamura, Takashi Nishimura, Yohei Hasegawa, Satoshi Tsutsumi (Keio Univ.), Toshihiro Kashima, Mitsutaka Nakata, Seidai Takeda, Kimiyoshi Usami (Shibaura Inst.), Hideharu Amano (Keio Univ.) RECONF2008-10 |
A dynamically reconfigurable processor achieves high performance making the best use of high degree of parallelism with ... [more] | RECONF2008-10 pp.55-60 |
| ICD | 2008-04-18 10:00 |
Tokyo | A 65nm Pure CMOS One-time Programmable Memory Using a Two-Port Antifuse Cell Implemented in a Matrix Structure Kensuke Matsufuji, Toshimasa Namekawa, Hiroaki Nakano, Hiroshi Ito, Osamu Wada, Nobuaki Otsuka (Toshiba) ICD2008-8 |
A Pure CMOS One-time Programmable（PCOP）memory using an antifuse is presented. PCOP memory adopts two-port cell architect... [more] | ICD2008-8 pp.39-44 |
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| EMD | 2008-03-07 15:05 |
Tokyo | A Measurement of Current Noise of Short-Time Arc with External DC Mgnetic Field Hikaru Miura, Yoshiki Kayano, Kazuaki Miyanaga, Hiroshi Inoue (Akita Univ.) EMD2007-131 |
Since an arc discharge generated by breaking electrical contact is considered as a main source of an undesired electroma... [more] | EMD2007-131 pp.29-32 |
|
| EMD | 2008-01-25 13:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | V-I Characteristics Equation for Break Arc at Carbon Electrodes
-- Comparison between Newly Proposed Equation and Ayrton's Equation -- Keiichi Suhara (TNCT) EMD2007-109 |
On {\it V-I }characteristics of arc at cabon electrodes, Mrs Ayrton's reserach is famous and the Ayrton equation is well... [more] | EMD2007-109 pp.1-5 |
| EMD | 2007-12-21 13:05 |
Tokyo | Japan Aviation Electronics Industry,Limited | A Study on Heat Analysis for Breaking Contact with Low Velocity (Part 3)
-- Influence of Holder Structure on Temperature Rise of Electrode (Part 3) -- Kazuaki Miyanaga, Yoshiki Kayano (Akita Univ.), Tasuku Takagi (Em. Prof. Tohoku University), Hiroshi Inoue (Akita Univ.) EMD2007-100 |
Heat problem, which is generated in the bridge and arcing at breaking contact, is the important origin of the malfunctio... [more] | EMD2007-100 pp.1-5 |
| EMD | 2007-11-14 13:20 |
Shizuoka | Actcity Hamamatsu | Motion of Break Arcs Driven by External Magnetic Field in a DC42V Resistive Circuit Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.) EMD2007-76 |
Motion of break arcs driven by external magnetic field of a permanent magnet are observed using the high-speed camera. E... [more] | EMD2007-76 pp.43-48 |
| EMD | 2007-11-14 15:00 |
Shizuoka | Actcity Hamamatsu | The Effect of Power Supply Voltage on Make & break Duration of Relays Li Zhenbiao, Zhang Huan (Huazhong Univ. of Science & Tech.), Makoto Hasegawa (Chitose Inst. of Science and Tech.) EMD2007-80 |
In order to study the effect of power supply voltage on make & break duration of relays, the electrical contact experime... [more] | EMD2007-80 pp.67-72 |
| EMD | 2007-10-19 10:55 |
Kanagawa | Keio Univ. Hiyoshi Campus | Break Arc Duration at Carbon Contacts in an Inductive Circuit Keiichi Suhara (TNCT) EMD2007-59 |
In order to investigate the effectiveness of the calculation method for break arc as well as the original arc $V$-$I$ ch... [more] | EMD2007-59 pp.19-24 |
| EMCJ, EMD | 2007-07-27 15:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg | A Study on Heat Analysis for Breaking Contact with Low Velocity (Part 1)
-- Influence of Holder Structure on Temperature Rise of Electrode -- Kazuaki Miyanaga, Yoshiki Kayano, Hiroshi Inoue (Akita Univ.) EMCJ2007-39 EMD2007-25 |
The bridge and arc discharge, which are generated at the breaking of electrical contact, cause temperature rise of elect... [more] | EMCJ2007-39 EMD2007-25 pp.41-46 |
| EMD, CPM, OME | 2007-06-29 14:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Relationship between arc duration and motion of arc spots for break arcs of Ag and Ag/ZnO electrical contacts Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.) EMD2007-13 CPM2007-31 OME2007-17 |
Break arcs are generated in a DC 42V-10A resistive circuit. The contact material is Ag or Ag/ZnO. Dependence of arc dura... [more] | EMD2007-13 CPM2007-31 OME2007-17 pp.7-12 |
| EMD | 2007-04-20 14:25 |
Tokyo | Nippon Institute of Technology( Kanda Campus,Tokyo) | A Measurement of Electromagnetic Noise up to Gigahertz Frequency Generated by Slowly Breaking Silver Contacts (Part 4)
-- Feature Extraction of Bridge and Short-Time Arc Waveforms -- Yoshiki Kayano, Kazuaki Miyanaga, Hiroshi Inoue (Akita Univ.) EMD2007-3 |
Arc discharge generated by breaking electrical contact is considered as a main source of an undesired electromagnetic (E... [more] | EMD2007-3 pp.11-16 |
| EMD | 2006-10-20 15:50 |
Kanagawa | An experimental study on minimum arc current of electrical contact materials Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) |
Ag, Pd, and Cu contacts were operated to break a resistive or inductive load current at DC 14V and 0.1 to 1.5 A, and arc... [more] | EMD2006-53 pp.21-26 |
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| EMCJ | 2006-06-12 | Hokkaido | Hokkaido Univ. | Estimation of Gap Breakdown Field Due to Air Discharge through Hand-Held Metal Piece from Charged Human Yoshinori Taka, Osamu Fujiwara (NIT) |
With the high speed and low voltage operation of ICs, serious malfunction of high-tech information devices is known to b... [more] | |
| EMD | 2006-04-21 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Hiroshi Inoue, Tatsuya Nakamura, Kazuaki Miyanaga, Yoshiki Kayano (Akita Univ.) |
An arc discharge generated by breaking electrical contact is considered as a main source of an undesired electromagnetic... [more] | EMD2006-4 pp.19-24 |
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