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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM, ITE-IST [detail] |
2022-08-08 11:00 |
Online |
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[Invited Talk]
0.37 W, 143 dB Dynamic Range 1 Megapixel Backside-Illuminated Charge Focusing SPAD Image Sensor with Pixel-Wise Exposure Control and Adaptive Clocked Recharging Yu Maehashi, Yasuharu Ota, Kazuhiro Morimoto, Tomoya Sasago, Mahito Shinohara, Yukihiro Kuroda, Wataru Endo, Shintaro Maekawa, Masanao Motoyama, Kenzo Tojima, Hiroyuki Tsuchiya, Ayman Abdelghafar, Kosei Uehira, Junji Iwata, Fumihiro Inui, Yasushi Matsuno, Katsuhito Sakurai, Takeshi Ichikawa (Canon) SDM2022-35 ICD2022-3 |
The development of photo counting image sensors has attracted attention. In particular, the development of image sensors... [more] |
SDM2022-35 ICD2022-3 pp.8-11 |
ICD, CPSY |
2014-12-02 11:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
The Evolution of CMOS Image Sensors Yusuke Oike (Sony) ICD2014-103 CPSY2014-115 |
This presentation introduces the evolution of CISs and their applications utilizing image quality, 3D integration, and w... [more] |
ICD2014-103 CPSY2014-115 p.113 |
SDM |
2014-01-29 15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Three-dimensional Structures for High Saturation Signals and Crosstalk Suppression in 1.20 μm Pixel Back-Illuminated CMOS Image Sensor Takekazu Shinohara, Kazufumi Watanabe (Sony Semiconductor), Kazunobu Ohta (Sony), Hajime Nakayama (Sony Semiconductor), Takafumi Morikawa (Sony), Keiichi Ohno, Dai Sugimoto (Sony Semiconductor), Shingo Kadomura, Teruo Hirayama (Sony) SDM2013-146 |
We propose two technologies, vertical transfer gate (VTG) and buried shielding metal (BSM), that can be applied to 1.20 ... [more] |
SDM2013-146 pp.47-50 |
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