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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD 2013-08-01
13:00
Ishikawa Kanazawa University [Invited Talk] Tera-Scale Three-Dimensional Integration (3DI) using Bumpless TSV Interconnects
Takayuki Ohba (Tokyo Inst. of Tech.) SDM2013-70 ICD2013-52
In combination with 3D logic, memory, and cooling devices, it is possible to construct a roadmap towards high-density in... [more] SDM2013-70 ICD2013-52
pp.29-30
LQE, OPE 2013-06-21
11:25
Tokyo   MOVPE growth realized on heterogeneous substrate employing directly-bonded InP template
Keiichi Matsumoto, Xinxin Zhang, Yoshinori Kanaya, Kazuhiko Shimomura (Sophia Univ.) OPE2013-9 LQE2013-19
Integrating III-V materials which enables high-speed computer with large-capacity on Si has been required. Therefore, we... [more] OPE2013-9 LQE2013-19
pp.13-18
OPE 2012-12-21
16:45
Tokyo Kikai-Shinko-Kaikan Bldg. Characteristics of InP-based passive devices of Si substrate with BCB adhesive wafer bonding for on-chip interconnects
Jieun Lee, Yoshiaki Yamahara, Yuki Atsumi, Nobuhiko Nishiyama (TiTech), Shigehisa Arai (TiTech/QNERC) OPE2012-141
For InP-based membrane photonic circuits on Si-LSI, a GaInAsP wire waveguide and basic functional passive devices based ... [more] OPE2012-141
pp.39-44
LQE 2012-12-13
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. [Encouragement Talk] Advances in Quantum Dot Lasers on Silicon Substrates by Wafer Bonding
Katsuaki Tanabe, Yasuhiko Arakawa (Univ. Tokyo) LQE2012-128
III-V semiconductor compound light sources monolithically integrated on Si substrates or waveguides would be promising f... [more] LQE2012-128
pp.31-33
SDM, ED
(Workshop)
2012-06-27
14:00
Okinawa Okinawa Seinen-kaikan A chip scale wafer level packaging for LED using surface aligning technique.
Jin Kwan Kim, Hee Chul Lee (KAIST)
A silicon based wafer level packaging (WLP) for LED, which can be adopted for chip scale package and batch process witho... [more]
SDM 2012-03-05
15:55
Tokyo Kikai-Shinko-Kaikan Bldg. Characterization of Local Strain around Through Silicon Via Interconnect in Wafer-on-wafer Structures
Osamu Nakatsuka (Nagoya Univ.), Hideki Kitada, Young Suk Kim (Univ. of Tokyo), Yoriko Mizushima, Tomoji Nakamura (Fujitsu Lab.), Takayuki Ohba (Univ. of Tokyo), Shigeaki Zaima (Nagoya Univ.) SDM2011-184
We have investigated the local strain structure in a thinned Si layer stacked on Si substrate for wafer-on-a-wafer appli... [more] SDM2011-184
pp.47-52
ICD, IPSJ-ARC 2011-01-20
14:20
Kanagawa Keio University (Hiyoshi Campus) [Invited Talk] CMOS Hyper-Miniaturization and Cooperation with 3D System Design Integration
Kazuya Okamoto, Ryohei Satoh (Osaka Univ.)
Miniaturization technology based on Dennard’s rule for CMOS devices has been progressing technically over time and has c... [more] ICD2010-131
p.29
EMD, OPE, LQE, CPM 2010-08-27
16:55
Hokkaido Chitose Arcadia Plaza 1.3um InAs/GaAs Quantum Dot Lasers on Si Substrates by Wafer Bonding
Katsuaki Tanabe, Denis Guimard, Damien Bordel, Satoshi Iwamoto, Yasuhiko Arakawa (Univ. of Tokyo.) EMD2010-59 CPM2010-75 OPE2010-84 LQE2010-57
III-V semiconductor compounds light sources monolithically formed on Si substrates or waveguides would be promising for ... [more] EMD2010-59 CPM2010-75 OPE2010-84 LQE2010-57
pp.153-156
ED, SDM 2010-06-30
12:50
Tokyo Tokyo Inst. of Tech. Ookayama Campus [Invited Talk] Applications of Smart Cut(TM) Technologies to III-V Based Engineered Substrates
Makoto Yoshimi (Soitec) ED2010-54 SDM2010-55
Smart Cut technology is now widely used to fabricate SOI (silicon-on-insulator) technologies targeting MPUs, RF devices,... [more] ED2010-54 SDM2010-55
pp.21-22
ED, CPM, SDM 2006-05-19
09:25
Aichi VBL, Toyohashi University of Technology Heteroepitaxy of GaN for Si-GaN OEIC
Tatsuya Kawano, Susumu Hatakenaka, Mikinori Itoh, Akihiro Wakahara, Hiroshi Okada, Makoto Ishida (Toyohashi Univ. Tech.)
A novel Si/GaN/g-Al2O3/Si structure by which both Si-LSI(Large scale integrated circuit) and GaN-based optical devices c... [more] ED2006-30 CPM2006-17 SDM2006-30
pp.55-60
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