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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| CS, SIP, CAS | 2008-03-06 15:10 |
Yamaguchi | Yamaguchi University | Reduction of IDCT Mismatch Accumulation on MPEG Video Decoder Atsushi Hatabu (NEC)  CAS2007-122 SIP2007-197 CS2007-87 |
This paper describes a noise reduction method for an MPEG video decoder in order to diminish a rapid accumulation of inv... [more] | CAS2007-122 SIP2007-197 CS2007-87 pp.81-84 |
| ISEC, IT, WBS | 2008-02-29 11:10 |
Tokyo | Construction of Randomness Testing Based on T-Codes Kenji Hamano, Hirosuke Yamamoto (Tokyo Univ.) IT2007-55 ISEC2007-152 WBS2007-86 |
We propose a new randomness test based on T-Codes. T-Codes are variable-length self-synchronization codes introduced b... [more] |
IT2007-55 ISEC2007-152 WBS2007-86 pp.43-50 |
|
| DC | 2008-02-08 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Test Generation Methods for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint Ryoichi Inoue, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (NAIST) DC2007-78 |
We proposed a fault-independent test generation method for logical fault testing of state-observable FSMs and a fault-de... [more] | DC2007-78 pp.69-76 |
| SS | 2007-12-18 09:30 |
Shimane | Shimane Univ. | Proposal of a Test Case Generation Method for Enbedded Systems from Sequence Diagram Yo Inoue, Tetsuro Katayama (Univ of Miyazaki) SS2007-52 |
An efficient testing to keep the quality of products is required in embedded system development. But, test-cases are ma... [more] |
SS2007-52 pp.85-90 |
| DE, DC | 2007-10-16 11:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Evaluation Model of Pseudo Random Pattern Quality for Logic BIST Satoshi Fukumoto, Harunobu Kurokawa, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) DE2007-124 DC2007-21 |
In this paper, we discuss the stochastic and statistical analyses on the distribution of fault coverage in random-patter... [more] | DE2007-124 DC2007-21 pp.51-56 |
| ISEC | 2007-05-18 10:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Correction of "Test for the Longest Run of Ones in a Block" Included in NIST Randomness Test Suite Kenji Hamano (The Univ. of Tokyo) ISEC2007-3 |
When random sequences taken from the block cipher DES, which is known to be a good random generator, were tested using “... [more] | ISEC2007-3 pp.17-21 |
| NLP | 2007-01-18 15:10 |
Kagawa | A Cellular Array Model of Reaction-Diffusion Systems and its Binary-Quantized Pseudo-Random Sequences Syunsuke Soga, Hisato Fujisaka, Takeshi Kamio, Kazuhisa Haeiwa (Hiroshima City Univ.) |
Virtual molecules on a binary-quantized cellular array model of reaction-diffusion systems behave like pseudo-random wal... [more] | NLP2006-136 pp.57-62 |
|
| IT | 2006-07-28 13:55 |
Chiba | Univ. of Tokyo | An Improvement to an Iterative Erasure and Error Decoding Algorithm for Non-binary Block Codes Toshiaki Abe, Hitoshi Tokushige (Univ. of Tokushima), Marc Fossorier (Univ. of Hawaii), Tadao Kasami (NAIST) |
This paper considers an iterative decoding algorithm for non-binary block codes in which erasure and error decoding is p... [more] | IT2006-38 pp.19-23 |
| VLD, IPSJ-SLDM | 2006-05-12 11:15 |
Ehime | Ehime University | Power-Conscious Microprocessor-Based Testing of System-on-Chip Fawnizu Azmadi Hussin, Tomokazu Yoneda (NAIST), Alex Orailoglu (Univ. of California), Hideo Fujiwara (NAIST) |
In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and resp... [more] | VLD2006-10 pp.25-30 |
| WBS, IT, ISEC | 2006-03-17 15:25 |
Aichi | Nagoya Univ. | On the Randomness Evaluation Method Using NIST Randomness Test Hidetoshi Okutomi, Manabu Kaneda (TOSHIBA INFORMATION SYSTEMS), Kenji Yamaguchi, Katsuhiro Nakamura (Chiba Univ.) |
NIST randomness test is widely used today as statistical evaluation method of the randomness. In this paper, at first, w... [more] | IT2005-108 ISEC2005-165 WBS2005-122 pp.79-84 |
| ISEC, LOIS | 2005-11-15 11:10 |
Fukuoka | Kitakyushu Science and Research Park | On Construction of Periodic Sequence on Algebraic Curve over Finite Field Takayasu Kaida (Kinki Univ.) |
In this paper, a construction method for a periodic sequence over a finite field $F'$ from rational points on a algebrai... [more] | ISEC2005-102 OIS2005-65 pp.25-28 |
| ICD, CPM | 2005-09-08 11:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Diagnostic Test Compaction for Combinational and Sequential Circuits Yoshinobu Higami (Ehime Univ.), Kewal K Saluja (Univ. of Wisconsin), Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu (Ehime Univ.) |
Recently, it is getting important to reduce the cost of test and fault diagnosis. Since the cost of test and fault diag... [more] |
CPM2005-89 ICD2005-99 pp.25-30 |
| ICD, CPM | 2005-01-28 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | On Finding Don't Cares in Test Sequences for Sequential Circuits and Applications to Test Compaction and Power Reduction Yoshinobu Higami (Ehime Univ.), Seiji Kajihara (Kyushu Inst. Tech.), Shin-ya Kobayashi, Yuzo Takamatsu (Ehime Univ.) |
This paper presents a method for finding don't cares in test sequences hile keeping the original stuck-at fault coverage... [more] | CPM2004-169 ICD2004-214 pp.41-46 |
| SS | 2004-11-25 13:30 |
Yamanashi | Univ. of Yamanashi, Kofu(Takeda) Campus | Study on a Testing Method for Java Programs with UML Diagrams Yusuke Yabuya, Kiyohito Shimomura, Tetsuro Katayama (U. of Miyazaki) |
In software development, UML(Unified Modeling Language) is used more as the development by using object-oriented technol... [more] | SS2004-27 pp.7-12 |
| ISEC, IPSJ-CSEC | 2004-07-21 14:30 |
Tokushima | Tokushima Univ. | A Study on the DFT Test in NIST SP800-22 Hisashi Yamamoto, Toshinobu Kaneko (T.U.S) |
The Discrete Fourier Transform Test is one of sixteen randomness tests in NIST SP800-22.The purpose of this test is to e... [more] | ISEC2004-50 pp.61-64 |
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