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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 118 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
PRMU 2019-12-20
10:30
Oita   Basic Study and Application of Discrimination Problem of Classifiers
Michiya Abe (UTokyo/NII), Shin'ichi Satoh (NII) PRMU2019-56
We proposed discrimination problem of classifiers, which aims to discriminate
two classifiers are same in the sense of... [more]
PRMU2019-56
pp.61-67
SWIM, KBSE 2019-05-25
09:00
Tokyo Kikai-Shinko-Kaikan Bldg. Novel Testing Approach Based on Exploratory Testing and Operation Recording
Hiroyuki Kirinuki, Toshiyuki Kurabayashi, Haruto Tanno (NTT), Ippei Kumagawa, Keigo Nagata (NTT DATA) KBSE2019-7 SWIM2019-7
It is known that exploratory testing can detect bugs efficiently than scripted testing and is a popular activity in soft... [more] KBSE2019-7 SWIM2019-7
pp.43-48
SeMI, IPSJ-ITS, IPSJ-MBL, IPSJ-DPS 2019-05-23
14:30
Kagoshima Amami-shi Syakai Fukushi Center Demonstration Test of an Adaptive Video Streaming Method Using Throughput Prediction and Scalable Video Coding
Koichi Nihei, Natsuki Kai, Keiichi Chono, Hiroshi Yoshida, Kozo Satoda (NEC) SeMI2019-4
To operate drones in non-line-of-sight (NLOS) areas, live video streaming is required for operators to monitor around th... [more] SeMI2019-4
pp.91-96
IN, NS
(Joint)
2019-03-05
15:40
Okinawa Okinawa Convention Center Main Part-of-speech Selection for Verification Necessity Determination by Support Vector Machine
Satoshi Sunaga, Koji Hoshino, Kazuhiro Kikuma (NTT), Koki Jimbo, Koki Satoh, Kiyoshi Ueda (NIHON Univ.) NS2018-288
Communication software used for Next Generation Network (NGN) etc.
requires high reliability and therefore adopts many... [more]
NS2018-288
pp.545-550
DC 2019-02-27
09:50
Tokyo Kikai-Shinko-Kaikan Bldg. A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] DC2018-73
pp.13-18
DC 2019-02-27
14:05
Tokyo Kikai-Shinko-Kaikan Bldg. FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] DC2018-79
pp.49-54
MSS, SS 2019-01-15
14:55
Okinawa   A Case Study of Process Improvement on an Application Development with Test Design
Takumi Tsujihara, Naoki Fukuyasu, Naruki Mitsuda, Takuo Matsunobe, Tsuneo Ajisaka (Wakayama Univ.) MSS2018-62 SS2018-33
It is said that performing the test design in early phase of software development process improves software quality and ... [more] MSS2018-62 SS2018-33
pp.43-48
CQ, ICM, NS, NV
(Joint)
2018-11-16
12:20
Ishikawa   A Method of Verification Necessity Determination using Support Vector Machine
Satoshi Sunaga, Koji Hoshino, Kazuhiro Kikuma (NTT), Koki Jimbo, Koki Satoh, Kiyoshi Ueda (NIHON Univ.) NS2018-147
Since communication software typified by Next Generation Network (NGN)
is required to have high reliability, it incorp... [more]
NS2018-147
pp.99-104
MW
(2nd)
2018-06-27
- 2018-06-29
Overseas KMITL, Bangkok, Thailand NDT of Coconut Oil using Microwave Dielectric Constant Sensing
Rattapong Suwalak, Chuwong Phongcharoenpanich (KMITL)
This paper presents the wireless sensing using the high frequency technique to determine the percentage of the coconut o... [more]
ET 2018-05-19
10:20
Kanagawa National Institute of Special Needs Education A Support System for Applied Java Programming Exercises toward Stepwise Development and Test Driven Approach -- A Virtual Experiment and User Evaluation with Revision and Extension of a Sorting Program Code --
Reo Ishii, Kento Tsuji, Hiroyuki Tominaga (Kagawa Univ.) ET2018-3
In introductory Java exercises, we learn basic object-oriented concepts and implement the functions of each object.In th... [more] ET2018-3
pp.11-16
SS, MSS 2018-01-19
13:10
Hiroshima   MSS2017-67 SS2017-54 Abstract As defined by ISO/IEC 25010, there are multiple techniques to quantitatively measure the code coverage and othe... [more] MSS2017-67 SS2017-54
pp.113-119
OME 2017-12-01
13:10
Saga Sun Messe Tosu Smart polishing by applying the limelight Dilatancy-Pad -- Evaluation for Dilatancy-Pad materials and SiC substrates's polishing characteristics --
Kiyoshi Seshimo, Tshiro Doi, Masanori Ohtsubo, Keiichi Tukamoto (Kyushu Univ.), Masataka Takagi (FUJIBO Ehime), Daizo Ichikawa (Fjikoshi Machinery) OME2017-42
Dilatancy material has hold the key to construct Smart-polishing technology for hard-to-process material substrates such... [more] OME2017-42
pp.31-36
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2017-11-06
14:55
Kumamoto Kumamoto-Kenminkouryukan Parea An Approach to Selection of Classifiers and their Thresholds for Machine Learning Based Fail Chip Prediction
Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas Electronics) VLD2017-36 DC2017-42
Today, semiconductor technologies have developed and advance the integration density of LSI circuits.
A technique which... [more]
VLD2017-36 DC2017-42
pp.55-60
SS, DC 2017-10-19
15:55
Kochi Kochi City Culture-plaza CUL-PORT An Informative Test Code Approach for Code Writing Problem in Java Programming Learning Assistant System
Khin Khin Zaw, Nobuo Funabiki (Okayama Univ.) SS2017-26 DC2017-25
To assist Java programming educations, we have developed a Web-based Java Programming Learning Assistant System (JPLAS),... [more] SS2017-26 DC2017-25
pp.31-36
ET 2017-03-10
10:05
Ehime National Institute of Technology, Niihama College An Applied C Programming Exercise with Card Game Strategy and a Contest Style -- Display Function of Code Metrics by ABC Size and Correlation with Execution Score --
Fumiya Gemba, Naoki Hanakawa, Hiroyuki Tominaga (Kagawa Univ.) ET2016-109
We have proposed an applied C programming exercise with a card game strategy for knowledge information processing. We ad... [more] ET2016-109
pp.89-94
NS, IN
(Joint)
2017-03-03
11:20
Okinawa OKINAWA ZANPAMISAKI ROYAL HOTEL A Proposal on Optimizing End-to-End Network Test based on Topological Similarity
Megumi Shibuya, Teruyuki Hasegawa (KDDI Research), Hirozumi Yamaguchi (Osaka Univ.) NS2016-194
In general, we assume each end-to-end test is carried out based on actual measurement of end-to-end path quality under i... [more] NS2016-194
pp.211-215
DC 2017-02-21
12:00
Tokyo Kikai-Shinko-Kaikan Bldg. An Approach to Performance Improvement of Machine Learning Based Fail Chip Discrimination
Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas System Design) DC2016-77
Today, advancements of semiconductor technology have progress to high integration of LSI circuits.
A technique which ke... [more]
DC2016-77
pp.17-22
RCS, RCC, ASN, NS, SR
(Joint)
2016-07-21
10:50
Aichi   [Poster Presentation] Evaluation of a Link Quality Sharing Method Using Compressed Sensing in an Indoor Wireless Mesh Network
Hiraku Okada, Tatsuya Kato, Kentaro Kobayashi, Masaaki Katayama (Nagoya Univ.) RCC2016-20 NS2016-54 RCS2016-107 SR2016-37 ASN2016-28
In wireless mesh networks, it is important to know link qualities to
management the wireless mesh networks and construc... [more]
RCC2016-20 NS2016-54 RCS2016-107 SR2016-37 ASN2016-28
pp.43-44(RCC), pp.25-26(NS), pp.73-74(RCS), pp.43-44(SR), pp.25-26(ASN)
KBSE 2016-05-27
10:00
Tokyo Doshisha Univ. Tokyo Branch Office Reducing the number of mutants with equivalent bug detection ability
Tomohiro Ueno, Hirohide Haga (Doshisha Univ.) KBSE2016-5
Mutation analysis is a method to evaluate the software test cases set quality. In mutation analysis, mutant programs are... [more] KBSE2016-5
pp.25-30
DC 2016-02-17
10:25
Tokyo Kikai-Shinko-Kaikan Bldg. Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation
Fuqiang Li, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara (Kyutech) DC2015-87
Both logic paths and clock paths are subject to the impact of IR-Drop which occurs in capture mode during scan test. Thi... [more] DC2015-87
pp.7-12
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