Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
PRMU |
2019-12-20 10:30 |
Oita |
|
Basic Study and Application of Discrimination Problem of Classifiers Michiya Abe (UTokyo/NII), Shin'ichi Satoh (NII) PRMU2019-56 |
We proposed discrimination problem of classifiers, which aims to discriminate
two classifiers are same in the sense of... [more] |
PRMU2019-56 pp.61-67 |
SWIM, KBSE |
2019-05-25 09:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Novel Testing Approach Based on Exploratory Testing and Operation Recording Hiroyuki Kirinuki, Toshiyuki Kurabayashi, Haruto Tanno (NTT), Ippei Kumagawa, Keigo Nagata (NTT DATA) KBSE2019-7 SWIM2019-7 |
It is known that exploratory testing can detect bugs efficiently than scripted testing and is a popular activity in soft... [more] |
KBSE2019-7 SWIM2019-7 pp.43-48 |
SeMI, IPSJ-ITS, IPSJ-MBL, IPSJ-DPS |
2019-05-23 14:30 |
Kagoshima |
Amami-shi Syakai Fukushi Center |
Demonstration Test of an Adaptive Video Streaming Method Using Throughput Prediction and Scalable Video Coding Koichi Nihei, Natsuki Kai, Keiichi Chono, Hiroshi Yoshida, Kozo Satoda (NEC) SeMI2019-4 |
To operate drones in non-line-of-sight (NLOS) areas, live video streaming is required for operators to monitor around th... [more] |
SeMI2019-4 pp.91-96 |
IN, NS (Joint) |
2019-03-05 15:40 |
Okinawa |
Okinawa Convention Center |
Main Part-of-speech Selection for Verification Necessity Determination by Support Vector Machine Satoshi Sunaga, Koji Hoshino, Kazuhiro Kikuma (NTT), Koki Jimbo, Koki Satoh, Kiyoshi Ueda (NIHON Univ.) NS2018-288 |
Communication software used for Next Generation Network (NGN) etc.
requires high reliability and therefore adopts many... [more] |
NS2018-288 pp.545-550 |
DC |
2019-02-27 09:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73 |
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] |
DC2018-73 pp.13-18 |
DC |
2019-02-27 14:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79 |
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] |
DC2018-79 pp.49-54 |
MSS, SS |
2019-01-15 14:55 |
Okinawa |
|
A Case Study of Process Improvement on an Application Development with Test Design Takumi Tsujihara, Naoki Fukuyasu, Naruki Mitsuda, Takuo Matsunobe, Tsuneo Ajisaka (Wakayama Univ.) MSS2018-62 SS2018-33 |
It is said that performing the test design in early phase of software development process improves software quality and ... [more] |
MSS2018-62 SS2018-33 pp.43-48 |
CQ, ICM, NS, NV (Joint) |
2018-11-16 12:20 |
Ishikawa |
|
A Method of Verification Necessity Determination using Support Vector Machine Satoshi Sunaga, Koji Hoshino, Kazuhiro Kikuma (NTT), Koki Jimbo, Koki Satoh, Kiyoshi Ueda (NIHON Univ.) NS2018-147 |
Since communication software typified by Next Generation Network (NGN)
is required to have high reliability, it incorp... [more] |
NS2018-147 pp.99-104 |
MW (2nd) |
2018-06-27 - 2018-06-29 |
Overseas |
KMITL, Bangkok, Thailand |
NDT of Coconut Oil using Microwave Dielectric Constant Sensing Rattapong Suwalak, Chuwong Phongcharoenpanich (KMITL) |
This paper presents the wireless sensing using the high frequency technique to determine the percentage of the coconut o... [more] |
|
ET |
2018-05-19 10:20 |
Kanagawa |
National Institute of Special Needs Education |
A Support System for Applied Java Programming Exercises toward Stepwise Development and Test Driven Approach
-- A Virtual Experiment and User Evaluation with Revision and Extension of a Sorting Program Code -- Reo Ishii, Kento Tsuji, Hiroyuki Tominaga (Kagawa Univ.) ET2018-3 |
In introductory Java exercises, we learn basic object-oriented concepts and implement the functions of each object.In th... [more] |
ET2018-3 pp.11-16 |
SS, MSS |
2018-01-19 13:10 |
Hiroshima |
|
MSS2017-67 SS2017-54 |
Abstract As defined by ISO/IEC 25010, there are multiple techniques to quantitatively measure the code coverage and othe... [more] |
MSS2017-67 SS2017-54 pp.113-119 |
OME |
2017-12-01 13:10 |
Saga |
Sun Messe Tosu |
Smart polishing by applying the limelight Dilatancy-Pad
-- Evaluation for Dilatancy-Pad materials and SiC substrates's polishing characteristics -- Kiyoshi Seshimo, Tshiro Doi, Masanori Ohtsubo, Keiichi Tukamoto (Kyushu Univ.), Masataka Takagi (FUJIBO Ehime), Daizo Ichikawa (Fjikoshi Machinery) OME2017-42 |
Dilatancy material has hold the key to construct Smart-polishing technology for hard-to-process material substrates such... [more] |
OME2017-42 pp.31-36 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-06 14:55 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
An Approach to Selection of Classifiers and their Thresholds for Machine Learning Based Fail Chip Prediction Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas Electronics) VLD2017-36 DC2017-42 |
Today, semiconductor technologies have developed and advance the integration density of LSI circuits.
A technique which... [more] |
VLD2017-36 DC2017-42 pp.55-60 |
SS, DC |
2017-10-19 15:55 |
Kochi |
Kochi City Culture-plaza CUL-PORT |
An Informative Test Code Approach for Code Writing Problem in Java Programming Learning Assistant System Khin Khin Zaw, Nobuo Funabiki (Okayama Univ.) SS2017-26 DC2017-25 |
To assist Java programming educations, we have developed a Web-based Java Programming Learning Assistant System (JPLAS),... [more] |
SS2017-26 DC2017-25 pp.31-36 |
ET |
2017-03-10 10:05 |
Ehime |
National Institute of Technology, Niihama College |
An Applied C Programming Exercise with Card Game Strategy and a Contest Style
-- Display Function of Code Metrics by ABC Size and Correlation with Execution Score -- Fumiya Gemba, Naoki Hanakawa, Hiroyuki Tominaga (Kagawa Univ.) ET2016-109 |
We have proposed an applied C programming exercise with a card game strategy for knowledge information processing. We ad... [more] |
ET2016-109 pp.89-94 |
NS, IN (Joint) |
2017-03-03 11:20 |
Okinawa |
OKINAWA ZANPAMISAKI ROYAL HOTEL |
A Proposal on Optimizing End-to-End Network Test based on Topological Similarity Megumi Shibuya, Teruyuki Hasegawa (KDDI Research), Hirozumi Yamaguchi (Osaka Univ.) NS2016-194 |
In general, we assume each end-to-end test is carried out based on actual measurement of end-to-end path quality under i... [more] |
NS2016-194 pp.211-215 |
DC |
2017-02-21 12:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An Approach to Performance Improvement of Machine Learning Based Fail Chip Discrimination Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas System Design) DC2016-77 |
Today, advancements of semiconductor technology have progress to high integration of LSI circuits.
A technique which ke... [more] |
DC2016-77 pp.17-22 |
RCS, RCC, ASN, NS, SR (Joint) |
2016-07-21 10:50 |
Aichi |
|
[Poster Presentation]
Evaluation of a Link Quality Sharing Method Using Compressed Sensing in an Indoor Wireless Mesh Network Hiraku Okada, Tatsuya Kato, Kentaro Kobayashi, Masaaki Katayama (Nagoya Univ.) RCC2016-20 NS2016-54 RCS2016-107 SR2016-37 ASN2016-28 |
In wireless mesh networks, it is important to know link qualities to
management the wireless mesh networks and construc... [more] |
RCC2016-20 NS2016-54 RCS2016-107 SR2016-37 ASN2016-28 pp.43-44(RCC), pp.25-26(NS), pp.73-74(RCS), pp.43-44(SR), pp.25-26(ASN) |
KBSE |
2016-05-27 10:00 |
Tokyo |
Doshisha Univ. Tokyo Branch Office |
Reducing the number of mutants with equivalent bug detection ability Tomohiro Ueno, Hirohide Haga (Doshisha Univ.) KBSE2016-5 |
Mutation analysis is a method to evaluate the software test cases set quality. In mutation analysis, mutant programs are... [more] |
KBSE2016-5 pp.25-30 |
DC |
2016-02-17 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation Fuqiang Li, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara (Kyutech) DC2015-87 |
Both logic paths and clock paths are subject to the impact of IR-Drop which occurs in capture mode during scan test. Thi... [more] |
DC2015-87 pp.7-12 |