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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| CPSY, IPSJ-EMB, IPSJ-SLDM, DC [detail] | 2015-03-06 16:40 |
Kagoshima | An Algorithm to Reduce Components of a Gaussian Mixture Model Considering Distribution Shape of Each Component Naoya Yokoyama, Shuji Tsukiyama (Chuo Univ.), Masahiro Fukui (Ritsumeikan Univ.)  CPSY2014-170 DC2014-96 |
In statistical methods, such as statistical static timing analysis (S-STA) algorithm, summation and minimum or maximum o... [more] | CPSY2014-170 DC2014-96 pp.49-54 |
|
| ICSS | 2015-03-04 15:55 |
Okinawa | Meio Univiersity | Evaluation on Malware Classification by Combining Traffic Analysis and Fuzzy Hashing of Malware Binary Shohei Hiruta, Yukiko Yamaguchi, Hajime Shimada, Hiroki Takakura (Nagoya Univ.) ICSS2014-96 |
Recent cyber attacks frequently use variants of malware programs where existing functions are drastically improved and n... [more] | ICSS2014-96 pp.199-204 |
| VLD | 2015-03-03 15:50 |
Okinawa | Okinawa Seinen Kaikan | [Memorial Lecture]
Microarchitectural-Level Statistical Timing Models for Near-Threshold Circuit Design Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera (Kyoto Univ.) VLD2014-172 |
Near-threshold computing has emerged as a promising solution for drastically improving the energy efficiency of micropro... [more] | VLD2014-172 pp.109-114 |
| EE, CPM | 2015-02-27 10:50 |
Tokyo | NTT Musashino R&D Center | A Static Characteristic Analysis of Serial Connected Dual Active Bridge DC-DC Converter Masaki Sato, Yoichi Ishizuka (Nagasaki Univ.) EE2014-43 CPM2014-157 |
The dual active bridge(DAB) DC-DC converter is one of the bi-directional isolated DC-DC converter. By using Input-Series... [more] | EE2014-43 CPM2014-157 pp.13-18 |
| KBSE | 2015-01-26 14:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Investigation of a Reverse Engineering Method for Verifying Source Code with a Use Case Model
-- A Case of an ASP.NET Application -- Shinpei Ogata (Shinshu Univ.), Yoshitaka Aoki (SIT), Satoshi Yazawa (VR), Saeko Matsuura (SIT) KBSE2014-42 |
Traceability between a requirements specification and source code should be kept but it’s difficult. Verifying that the ... [more] | KBSE2014-42 pp.19-24 |
| COMP | 2014-10-08 13:30 |
Tokyo | Chuo University | [Invited Talk]
Statistical Maximum and Minimum Operations for Gaussian Mixture Model and Their Applications Shuji Tsukiyama (Chuo Univ.) COMP2014-28 |
Due to the progress of micro-technology, process variability is increasing in not only inter-die but also intra-die, and... [more] | COMP2014-28 pp.17-18 |
| CPSY, DC (Joint) |
2014-07-28 17:25 |
Niigata | Toki Messe, Niigata | Fast Evaluation Method based on Static Code Analysis for Programs Derived by the Iterative Optimization on the Polyhedral Model Tomoyuki Hosaka, Nobuhiko Sugino (Tokyo Inst. of Tech.) CPSY2014-14 |
For evaluation scheme in source code transformation, a fast evaluation method based on static code analysis is proposed.... [more] | CPSY2014-14 pp.25-30 |
| SS | 2014-05-09 09:30 |
Mie | ISE SHIMIN - KATSUDOU Center | Identifying Cross-Function Side Effects using Static Analysis Jiachen Yang, Keisuke Hotta, Yoshiki Higo, Shinji Kusumoto (Osaka Univ.) SS2014-5 |
Side effects are modifications done to the state of the objects in Object-Oriented Programming languages such as Java. S... [more] | SS2014-5 pp.25-30 |
| KBSE | 2014-03-07 12:35 |
Okinawa | Okinawaken-Seinenkaikan | An Android Application Analysis Method for Highlighting Disclosure of Fine-Grained User Information Takuya Sakashita, Shinpei Ogata, Haruhiko Kaiya, Kenji Kaijiri (Shinshu Univ.) KBSE2013-93 |
We have proposed a static analysis method of android application to highlight the user information disclosed by the appl... [more] | KBSE2013-93 pp.85-90 |
| DC | 2013-12-13 13:50 |
Ishikawa | Construction of High Quality Delay Test Set Using Fast On-Chip Delay Measurement Kentaroh Katoh (TNCT), Haruo Kobayashi (Gunma University) DC2013-70 |
Today, low power and high speed LSIs such as microprocessors and SoCs are indispensable in various consumer devices and ... [more] | DC2013-70 pp.13-16 |
|
| SS, IPSJ-SE | 2013-10-24 13:50 |
Ishikawa | A representation of relationships between functions and variables in source code Yamato Takahashi, Kazuya Fukuhara, Toshimitsu Inomata, Yoshikazu Arai, Shintaro Imai (Iwate Prefectural Univ.) SS2013-40 |
In development of embedded software, the quality of software is very important. A code review is performed in order ... [more] |
SS2013-40 pp.49-54 |
|
| ED | 2013-10-22 16:05 |
Hokkaido | Enreisou, Hokkaido Univ. | Electron ray tracing from Field Emitter Array incorporated with electrostatic lens Hidekazu Murata, Hiroshi Shimoyama (Meijo Univ.), Yoichiro Neo, Hidenori Mimura (Shizuoka Univ.), Tomoya Yoshida, Masayoshi Nagao (AIST) |
Field emitter arrays (FEAs) incorporated with electrostatic lens are regarded as strong candidates for multi field emiss... [more] | |
| SDM, ICD | 2013-08-02 09:00 |
Ishikawa | Kanazawa University | SRAM Cell Stability Parameter: Noise Margin or Vmin? Anil Kumar, Takuya Saraya (Univ. of Tokyo), Shinji Miyano (STARC), Toshiro Hiramoto (Univ. of Tokyo) SDM2013-74 ICD2013-56 |
This paper reports the comprehensive analysis of the stability parameter of SRAM cells. Results show that even if noise ... [more] | SDM2013-74 ICD2013-56 pp.43-46 |
| EST, MWP, OPE, MW, EMT, IEE-EMT [detail] | 2013-07-18 10:20 |
Hokkaido | Wakkanai Synthesis Cultural Center | Electrostatic Analysis of Effective Permittivity for Microstructure Takuichi Hirano, Jiro Hirokawa, Makoto Ando (Tokyo Inst. of Tech.) MW2013-50 OPE2013-19 EST2013-14 MWP2013-9 |
The authors have proposed evaluation technique of effective material property for dummy metal fills, which is inevitable... [more] | MW2013-50 OPE2013-19 EST2013-14 MWP2013-9 pp.13-18 |
| EST, MWP, OPE, MW, EMT, IEE-EMT [detail] | 2013-07-19 12:10 |
Hokkaido | Wakkanai Synthesis Cultural Center | Analysis of Near Field Light with Metallic Nanoparticles by Using an Integral Equation Method
-- Influence of Plasmon Modes on Shape Variations -- Shinichiro Ohnuki, Taro Okuda, Takashi Takeuchi, Seiya Kishimoto (Nihon Univ.) MW2013-79 OPE2013-48 EST2013-43 MWP2013-38 |
Recently, a boundary integral equation method(BIEM) has been proposed and successfully applied to analyzing plasmon mode... [more] | MW2013-79 OPE2013-48 EST2013-43 MWP2013-38 pp.205-208 |
| EMCJ, EMD | 2013-07-12 15:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Analysis of high-frequency components in electrostatic discharge events
-- Assessing the effect of discharge electrode material and relative humidity -- Masao Masugi (Ritsumeikan Univ.), Yuichiro Okugawa, Yoshiharu Akiyama (NTT), Kazuo Murakawa (NTT East) EMCJ2013-47 EMD2013-32 |
This report describes evaluations of electrostatic discharge (ESD) events from electromagnetic interference (EMI) aspect... [more] | EMCJ2013-47 EMD2013-32 pp.43-46 |
| MSS, SS | 2013-03-06 16:40 |
Fukuoka | Shikanoshima | Towards detection of automatically undetectable violations focused on the locality of coding standards violations Yasunari Takai (Nagoya Univ.), Takashi Kobayashi (Tokyo Inst. of Tech./Nagoya Univ.), Noritoshi Atsumi (Nagoya Univ.), Shinichiro Yamamoto (Aichi Pref. Univ.), Kiyoshi Agusa (Kyoto Univ.) MSS2012-68 SS2012-68 |
In the field of software development, developers use coding standards. They are rules which should be obeyed in coding. ... [more] | MSS2012-68 SS2012-68 pp.51-56 |
| EMCJ, IEE-EMC | 2012-12-14 14:00 |
Gifu | Gifu Univ. | Study of Induced Voltage between Foil Conductors on Printed Wiring Board on ESD Test with a ESD-Gun by FDTD and EMTP Analysis Sho Iwai, Kotaro Tsuboi, Shinya Ohtsuka (KIT) EMCJ2012-96 |
We have investigated that flashover voltage between foil conductors on printed wiring board against ESD surge. Voltage w... [more] | EMCJ2012-96 pp.67-70 |
| EMCJ, EMD | 2012-07-20 15:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Energy-based analysis of electrostatic discharge current
-- Assessment of high oscillations in ESD waveform -- Masao Masugi (Ritsumeikan Univ.), Norihito Hirasawa, Yoshiharu Akiyama (NTT), Kazuo Murakawa (NTT east) EMCJ2012-48 EMD2012-23 |
This report describes evaluations of electrostatic discharge (ESD) events from electromagnetic interference (EMI) aspect... [more] | EMCJ2012-48 EMD2012-23 pp.43-46 |
| ICSS, IA | 2012-06-22 09:50 |
Tokyo | Room 1206, 1st bldg, Takanawa Campus, Tokai University | A High-Speed Classification Method based on Opcode of Malware Yang Zong, Hirofumi Yamaki, Yukiko Yamaguchi, Hiroki Takakura (Nagoya Univ.) IA2012-8 ICSS2012-8 |
Malicious software in form of Internet worms, computer viruses, and trojan horses poses a major threat to the security o... [more] | IA2012-8 ICSS2012-8 pp.43-48 |
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