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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2024-03-01 16:15 |
Chiba | Automatic contact resistance measurement of electrical contacts operating in various atmospheres Tomoito Ito, Yuto Mukai, Kiyoshi Yoshida (NIT)  EMD2023-47 |
The purpose of this report was to experiment to see how various atmospheres affect the contact resistance of electrical ... [more] | EMD2023-47 pp.46-51 |
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| EMD | 2023-03-03 16:55 |
Saitama | NIT and Online (Primary: On-site, Secondary: Online) |
Automatic measurement system for contact resistance of electric contact
-- Improvement of the auto range -- Masato Fujisaki, Ayumu Hashizume, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2022-33 |
In this report, we improve a system that automatically sets the optimum input voltage range for each measurement (hereaf... [more] | EMD2022-33 pp.70-75 |
| EMD | 2022-03-04 14:40 |
Online | Online | Improvement and measurement of automatic contact resistance measurement system for electrical contacts Ryo Oyamada, Syun Kanaya, Kiyoshi Yoshida (NIT) EMD2021-19 |
In our laboratory, we made an automatic contact resistance measurement system for electrical contacts using LabVIEW. Ho... [more] | EMD2021-19 pp.25-30 |
| EMD | 2021-03-08 14:20 |
Online | Online | Continuous open and close test of contact resistance of electromagnetic contactor Yoshihiro Sudo, Kohei Chiba, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2020-32 |
In this study, the contact resistance when a small current was applied at DC5V, was automatically measured. In the expe... [more] | EMD2020-32 pp.18-22 |
| EMD | 2020-07-17 15:00 |
Hokkaido | Chitose-Arcadia-Plaza | Production of automatic measurement system for contact resistance and its measurement results
-- Contact resistance when switching 1 million times under small load condition -- Kiyoshi Yoshida, Koichiro Sawa (NIT), Kenji Suzuki (Fuji FA Comp. & Sys.) EMD2020-6 |
In this study, we constructed an automatic measurement system for the contact resistance of electrical contacts. This sy... [more] | EMD2020-6 pp.17-22 |
| EMD | 2020-03-06 16:05 |
Chiba | CHIBA Institute of Technology Tsudanuma Campus (Cancelled but technical report was issued) |
Production of Automatic Contact Resistance Measurement System for Electrical Contacts Tatsuya Onodera, Sho Kashiwabara, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2019-69 |
In this study, we constructed an automatic measurement system for the contact resistance of electrical contacts. This sy... [more] | EMD2019-69 pp.51-56 |
| OME | 2019-12-20 13:00 |
Saga | avancée (Saga city) | Carbon-bridged Oligo(phenylenevinylene)s (COPV6) Single-Electron Transistor based on Electroless Au-plated (ELGP) Nanogap Electrodes Rikiya Irie, Chun Ouyang, Yuma Ito, Phan Trong Tue (Tokyo Tech), Hayato Tsuji (Kanagawa Unib), Eiichi Nakamura (Univ. Tokyo), Yutaka Majima (Tokyo Tech) OME2019-37 |
Molecular transistors have been studied for 50 years, however electrical contacts to a single-molecule have been the iss... [more] | OME2019-37 pp.9-12 |
| EMD | 2019-03-01 14:00 |
Tokyo | Contact reliability of electrical contacts by continuous make/break test of electromagnetic contactor Ikarashi Masanari, Ogaki Asuka, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2018-67 |
In this research, we conducted 5 million times of opening and closing experiments with contacts under minute load condit... [more] | EMD2018-67 pp.41-46 |
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| MRIS, ITE-MMS | 2017-06-09 09:15 |
Miyagi | Tohoku Univ. | FEM analysis of PMR write head for high data rate Yoshihisa Nakamura (Tohoku Univ.), Ryo Itagaki, Yasushi Kanai (Niigata Inst. Tech.) MR2017-6 |
A write head with a fast response and high efficiency is necessary to realize higher data rates and larger storage capac... [more] | MR2017-6 pp.41-46 |
| CPM | 2014-09-04 16:20 |
Yamagata | The 100th Anniversary Hall, Yamagata University | Control of CexY(3-x)Fe5O12 Thin Film Orientation by Crystal Contact Epitaxy Satoru Noge (NumazuNIT) CPM2014-81 |
his paper was described the contact epitaxial method that is the crystal thin-film formation technology in which the inf... [more] | CPM2014-81 pp.33-36 |
| ED, SDM | 2014-02-28 12:05 |
Hokkaido | Hokkaido Univ. Centennial Hall | Formation Scheme of Nano-Scale Devices Based on Ni Nanogaps Using Field-Emission-Induced Electromigration Ryutaro Suda, Mitsuki Ito, Kohei Morihara, Takahiro Toyonaka, Kazuki Takikawa, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2013-149 SDM2013-164 |
We propose a simple and easy fabrication scheme of ferromagnetic single-electron transistors (FMSETs), nanogap based res... [more] | ED2013-149 SDM2013-164 pp.95-100 |
| OFT | 2012-01-20 09:25 |
Kagawa | Single-mode Optical Fiber Cleaving Condition for Physical Contact Connection with Cleaved and Unpolished Endface Ryo Koyama, Kazuhide Nakajima, Hisashi Izumita, Toshio Kurashima (NTT) OFT2011-66 |
Physical contact (PC) connection is a butt jointing technique for optical fibers, in which fiber cores are brought into ... [more] | OFT2011-66 pp.51-54 |
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| CPM | 2007-11-16 12:55 |
Niigata | Nagaoka University of Technology | Fabrication and characterization of Bi-based high-Tc superconductor devices Takashi Yoshida, Hiroaki Nawa, Hayataka Tominaga, Atsushi Miwa, Takahiro Kato, Katsuyoshi Hamasaki (NUT), Hisashi Shimakage (NICT) CPM2007-106 |
FIB (Focused Ion Beam) and double-side fabrication techniques were widely used to fabricate intrinsic Josephson junction... [more] | CPM2007-106 pp.7-11 |
| WIT | 2007-03-24 09:00 |
Aichi | Chukyo Univ | A versatile single switch using a photo-reflective sensor array for computer operation by patients with motor disabilities Dongli Wu, Takuro Nakamura, Toyohiko Hayashi, Yasuo Nakamura (Niigata Univ.), Yuko Wakabayashi (JAPAN ALS), Satoshi Watanabe (Ftech) |
For communications of persons with motor disabilities, single switches for computer operation have been developed by usi... [more] | WIT2006-124 pp.109-114 |
| EMCJ | 2006-04-18 15:30 |
Tokyo | Aoyama Gakuin Univ. (Aoyama Campus) | FDTD Simulation of Contact Discharge to Single Sided PCB by an ESD-gun Hiroya Ueyama, Takafumi Kondo, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.), Tsuyoshi Maeno (DENSO) EMCJ2006-6 |
The electromagnetic (EM) noise caused by electrostatic discharge (ESD) events due to charged metals is a major source of... [more] | EMCJ2006-6 pp.31-35 |
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