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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 42 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
CPM 2010-07-29
15:20
Hokkaido Michino-Eki Shari Meeting Room Proposal and Experimental Evaluation of A Novel Method for Eye-Pattern Improvement on Transmission Lines
Masami Ishiguro, Yuki Shimauchi, Noriyuki Aibe (Tsukuba Univ.), Ikuo Yoshihara (Miyazaki Univ.), Moritoshi Yasunaga (Tsukuba Univ.) CPM2010-34
Recently GHz frequency signal is required to be propagated in the PCB (printed circuit board) with low distortions. To o... [more] CPM2010-34
pp.17-22
ICD 2010-04-23
11:25
Kanagawa Shonan Institute of Tech. [Invited Talk] High-Speed Memory Interfaces -- DDR/GDDR-DRAM --
Yasuhiro Takai (Elpida) ICD2010-15
(To be available after the conference date) [more] ICD2010-15
pp.81-82
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-02
16:00
Kochi Kochi City Culture-Plaza [Panel Discussion] EMC Circuit Design and Jisso Design for System LSI -- Proposal for Circuit Design Managing EMC and Jisso Issue from Jisso-side --
Hideki Osaka (HITACHI Ltd.), Hideki Asai (Shizuoka Univ.), Hidefumi Ibe (HITACHI Ltd.), Yoshiyuki Saito (Panasonic), Takashi Harada (NEC), Narimasa Takahashi (IBM Japan) CPM2009-142 ICD2009-71
Nowadays, a JISSO design is very important to get the target performance out of a system LSI. More specifically, co-desi... [more] CPM2009-142 ICD2009-71
pp.47-49
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-03
10:40
Kochi Kochi City Culture-Plaza Evaluation of Waveform-Improvement performance on the Segmental Transmission Line
Yuki Shimauchi, Hiroshi Nakayama, Yoshiki Yamaguchi, Noriyuki Aibe (Tsukuba Univ.), Ikuo Yoshihara (Miyazaki Univ.), Moritoshi Yasunaga (Tsukuba Univ.) CPM2009-145 ICD2009-74
As processor-speed increases, high-speed signal-propagation in the PCB traces following the processor-speed is also requ... [more] CPM2009-145 ICD2009-74
pp.63-68
EMCJ 2008-12-19
09:30
Gifu Gifu Univ. Analysis of nonuniform transmission line in the frequency domain using wavelet expansion
Kazunori Watanabe, Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.), Kunikatsu Kobayashi (Yamagata Univ.) EMCJ2008-87
A method of nonuniform transmission line analysis in the frequency domain by using wavelet expansion is presented. In th... [more] EMCJ2008-87
pp.7-12
VLD, IPSJ-SLDM 2008-05-09
10:00
Hyogo Kobe Univ. [Invited Talk] NoizeProblems in LSI Design:Challenges and Approaches
Makoto Nagata (Kobe Univ.)
Digital designs intending high-speed and low-power consumption necessarily deal with dynamic power supply noise, for suc... [more] VLD2008-7
pp.1-6
VLD, ICD 2008-03-06
15:45
Okinawa TiRuRu Superposition Effect Validation of Inductive Coupling Noise Based on Measurement of Interconnect Delay Variation
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2007-153 ICD2007-176
Inductive coupling is becoming a design concern for global interconnects in nano-meter technologies. This paper measures... [more] VLD2007-153 ICD2007-176
pp.55-60
CPM, ICD 2008-01-18
13:50
Tokyo Kikai-Shinko-Kaikan Bldg A Package-on-Package using Coreless Substrate with Excellent Power Integrity
Kentaro Mori, Jun Sakai, Katsumi Kikuchi, Shinji Watanabe, Tomoo Murakami, Shintaro Yamamichi (NEC) CPM2007-143 ICD2007-154
(To be available after the conference date) [more] CPM2007-143 ICD2007-154
pp.87-92
IE, SIP 2007-04-26
15:10
Tokyo Kikai-Shinko-Kaikan Bldg. Image Tamper Detection Based on Multiple Mathematical Morphology Operations
Qing Tao Wan (NEC Engineering), Masaaki Fujiyoshi, Hitoshi Kiya (Tokyo Metro. Univ.) SIP2007-9 IE2007-9
This paper proposes a tamper detection for images. The proposed method utilizes the idempotence of mathematical morpholo... [more] SIP2007-9 IE2007-9
pp.49-54
ICD, VLD 2007-03-07
17:00
Okinawa Mielparque Okinawa On-chip monitoring for sub-100-nm digital signal integrity
Yoji Bando, Koichiro Noguchi, Makoto Nagata (Kobe Univ.)
A compact on-chip signal monitor circuit uses voltage mode sensing by a source follower circuit with small input device ... [more] VLD2006-116 ICD2006-207
pp.61-66
ICD, CPM 2007-01-18
09:50
Tokyo Kika-Shinko-Kaikan Bldg. Measurement of Delay Variation Due to Inductive Coupling Noise in 90nm Global Interconnects
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.)
Inductive coupling is becoming a design concern for global interconnects in nano-meter technologies. This paper shows me... [more] CPM2006-131 ICD2006-173
pp.13-18
ICD, CPM 2007-01-18
10:55
Tokyo Kika-Shinko-Kaikan Bldg. Delay Variation Analysis in Consideration of Dynamic Power Supply Noise Waveform
Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.)
Delay variability due to dynamic power supply noise is elucidated by on-chip signal waveform measurements at 100-ps/100-... [more] CPM2006-133 ICD2006-175
pp.25-29
EMCJ 2006-11-24
14:00
Hyogo   Analysis of Noise Suppression Sheets Using the FDTD Method
Masayuki Marubashi, Akira Sugiura (Tohoku Univ.), Katsumi Fujii, Yasushi Matsumoto (NICT) EMCJ2006-76
In recent years, thin sheets of lossy magnetic material are widely used for suppressing disturbance currents in electron... [more] EMCJ2006-76
pp.7-12
ICD, SDM 2006-08-17
10:55
Hokkaido Hokkaido University A 1-ps resolution on-chip sampling oscilloscope with 64:1 tunable sampling range based on ramp waveform division scheme
Kenichi Inagaki (Univ. of Tokyo), Danardono Dwi Antono (SONY), Makoto Takamiya (Univ. of Tokyo), Shigetaka Kumashiro (NEC Electronics), Takayasu Sakurai (Univ. of Tokyo)
An on-chip sampling oscilloscope with 1ps timing resolution is realized in 90nm CMOS process based on a proposed ramp wa... [more] SDM2006-129 ICD2006-83
pp.25-30
EMCJ, EMD 2006-07-28
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. A Novel Circuit Technology for On-Chip Power Distribution Network
Hirokazu Tohya (ICAST) EMCJ2006-41 EMD2006-21
I present a novel circuit technology about on-chip power distribution network suitable for microprocessor or ASIC. I int... [more] EMCJ2006-41 EMD2006-21
pp.29-34
MW 2006-06-27
15:45
Aichi   A synthsis method of nonuniform transmission line by S parameter measurement
Daiki Ichikawa, Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.), Kunikatsu Kobayashi (Yamagata Univ.)
A synthesis method of the equivalent lossy nonuniform transmission line by the measurements of S parameters for intercon... [more] MW2006-34
pp.53-58
EMCJ 2005-12-09
13:45
Gifu Gifu University A extended method of characteristics in transmission line analysis and its numerical stability
Yuji Horibe, Yasuhiro Takahashi, Toshikazu Sekine (Gifu Univ.), Kunikatsu Kobayashi (Yamagata Univ.)
When the transmission line is analyzed, the method of characteristics is known as a method by which the time-domain char... [more] EMCJ2005-120
pp.35-40
ICD, CPM 2005-09-08
09:00
Tokyo Kikai-Shinko-Kaikan Bldg. The comparison of electrical characteristics of FCBGA packaging substrate based on MLTS and conventional build-up PWB
Jun Sakai, Koichiro Nakase (NEC), Hirokazu Honda (NECエレクトロニクス), Hirobumi Inoue (NEC)
We heve developed an ultra-thin high-density packaging substrate, called an MLTS (multi-layer thin substrate), that cons... [more] CPM2005-85 ICD2005-95
pp.1-6
ICD, CPM 2005-09-08
13:25
Tokyo Kikai-Shinko-Kaikan Bldg. Basic Study of Proper Circuit Line Structure for Advanced System in Package
Shouhei Yasuda (Melco Display Tech.), Yoshiharu Iwata, Ryohei Satoh (Osaka Univ.)
Although the semiconductor has raised performance by speeding up of the clock frequency and shrinking the process rule, ... [more] CPM2005-91 ICD2005-101
pp.35-40
MW 2005-06-28
14:15
Aichi   Numerical Stability of Nonuniform Transmission Line Analysis Using Crank-Nicolson schme
Yuji Horibe, Yasuhiro Takahashi, Toshikazu Sekine (Gifu Univ.), Kunikatsu Kobayashi (Yamagata Univ.)
The idea of the Crank-Nicolson scheme is applied to a conventional FDTD method that analyzes the lossy nonuniform transm... [more] MW2005-38
pp.33-38
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