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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2012-12-07
15:45		 Kyoto Kyoto Univ. (Katsura) Electric Characteristic of Crystalline Silicon Solar Cells using Electroluminescence Imaging under Reverse-based
Emi Sugimura, Shigekazu Shimazaki, Ayumi Tani, Takashi Fuyuki (NAIST) SDM2012-133		 The electroluminescence (EL) imaging has received spatially resolved information about the electronic material propertie... [more] SDM2012-133
pp.107-111
NC, MBE
(Joint)		 2011-03-09
09:25		 Tokyo Tamagawa University Estimating psychophysical decision processes with arbitrarily distributed stimuli
Osamu Watanabe (Muroran Inst. of Tech.) NC2010-181		 Reverse correlation (RC), or spike-triggered average (STA), is known as a powerful method for estimating the properties ... [more] NC2010-181
pp.319-324
LQE, ED, CPM 2008-11-27
13:35		 Aichi Nagoya Institute of Technology Reduction of reverse-bias current in GaN-based metal-oxide-semiconductor diodes operating in UV spectral region
Tohru Honda, Shigetoshi Komiyama, Yoshihiro Mashiyama, Kenji Watanabe (Kogakuin Univ.) ED2008-159 CPM2008-108 LQE2008-103		 The reduction of reverse-bias leakage current in GaN-based Schottky diodes was investigated using an aluminum facepack t... [more] ED2008-159 CPM2008-108 LQE2008-103
pp.33-36
NLP, CAS 2006-10-04
13:05		 Osaka   A Study of the Power-Diode Model in Consideration of Reverse Recovery and Depletion Layer Charge
Tsuyoshi Funaki, Takashi Sawada, Takashi Hikihara (Kyoto Univ.) 		In the switching circuits using power semiconductor devices, the reverse recovery of diodes produces an increase in the ... [more] CAS2006-23 NLP2006-46
pp.13-18
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